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  4. JSM-IT810 Schottky Field Emission Scanning Electron Microscope (JEOL Ltd.)
JSM-IT810 Schottky Field Emission Scanning Electron Microscope-JSM-IT810
JSM-IT810 Schottky Field Emission Scanning Electron Microscope-JEOL Ltd.

JSM-IT810 Schottky Field Emission Scanning Electron Microscope
JEOL Ltd.

About This Product

■Automatic Observation and Analysis Function "Neo Action"

Intuitive operation allows anyone to easily automate SEM observation and EDS analysis.

■SEM Automatic Adjustment Package

This function performs magnification adjustment, axis adjustment, and EDS energy calibration using a dedicated sample. Regular checks ensure the instrument is always in optimal condition.

■Live-3D Function

The 5-segment semiconductor detector element allows for signal selection. A 3D image can be reconstructed using 2D images acquired from 4 directions. The newly implemented Live-3D function allows measurement while confirming surface topography in the live image.

■EDS Integration

Achieves next-generation operability that eliminates the barrier between SEM observation and EDS elemental analysis. Various analysis methods such as point, area, MAP, and line can be directly scheduled on the observation screen, allowing analysis to begin immediately.

  • Product

    JSM-IT810 Schottky Field Emission Scanning Electron Microscope

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1 Models of JSM-IT810 Schottky Field Emission Scanning Electron Microscope

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JSM-IT810 Schottky Field Emission Scanning Electron Microscope-Part Number-JSM-IT810

JSM-IT810

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JEOL Ltd.

  • Japan

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