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  3. Electron Microscopes
  4. JCM-7000 NeoScope™ Desktop Scanning Electron Microscope (JEOL Ltd.)
JCM-7000 NeoScope™ Desktop Scanning Electron Microscope-JCM-7000 NeoScope™
JCM-7000 NeoScope™ Desktop Scanning Electron Microscope-JEOL Ltd.

JCM-7000 NeoScope™ Desktop Scanning Electron Microscope
JEOL Ltd.

About This Product

■Features

・Background and Main Features Benchtop scanning electron microscopes are increasingly being used in various fields, primarily in electrical and electronics, automotive and machinery, and chemical and pharmaceutical industries. They are utilized not only in research and development but also in jobs closely related to manufacturing, such as quality control and product inspection. In recent years, there has been a growing demand for further improvements in work efficiency, ease of operation, and enhanced analytical and measurement capabilities. To meet these needs, the JCM-7000 NeoScope™ was developed as a benchtop scanning electron microscope (benchtop SEM) based on the concept of "anyone can operate an SEM/EDS." It features functions such as "Zeromag," which allows observation of SEM images by magnifying the optical image; "Live Analysis," which allows identification of elements in the field of view during observation without starting up the analytical instrument; and "Live 3D," which enables three-dimensional observation during SEM observation. By placing one next to an optical microscope, foreign object analysis and quality control can be performed more quickly and in greater detail. * JCM-7000 The JCM-7000 allows for easy transitions from optical images to SEM images using Zeromag. EDS elemental analysis can be performed while observing with Live Analysis.

■ Comparison with Optical Microscopy: Is SEM necessary even at low magnification?

* Foreign Matter Analysis Easily detects and analyzes foreign matter with different compositions. * Quality Control Easily observes additives that are difficult to see with an optical microscope and analyzes contaminants.

■ Features & Applications: Functions to enable "anyone to operate SEM/EDS"

* Zeromag & Low Vacuum Mode Zeromag allows for field-of-view searching with optical images. Even after switching to SEM images, observation is possible without pre-processing using the standard low-vacuum mode. * Live! Live! Live! Live Analysis allows for screening analysis during observation, Live Map allows for immediate confirmation of major element distribution, and Live 3D displays SEM and 3D images on two screens in real time. Depth information can be obtained simultaneously with shape determination. • SMILE VIEW™ Lab SMILE VIEW™ Lab allows for centralized management of all data, including Zeromag images, SEM images, and EDS analysis results. It also makes it easy to generate reports.

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    JCM-7000 NeoScope™ Desktop Scanning Electron Microscope

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1 Models of JCM-7000 NeoScope™ Desktop Scanning Electron Microscope

Image Part Number Price (excluding tax)
JCM-7000 NeoScope™ Desktop Scanning Electron Microscope-Part Number-JCM-7000 NeoScope™

JCM-7000 NeoScope™

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JEOL Ltd.

  • Japan

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