JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer-JSX-1000S

JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer
JEOL Ltd.

About This Product

The JSX-1000S is an X-ray fluorescence analyzer with a touch panel for easy elemental analysis. It features general qualitative and quantitative analysis (FP method and calibration curve method) and RoHS element screening capabilities. Various hardware and software options allow for an even wider range of analyses.

■Features• X-ray Fluorescence Analysis Principle
When X-rays are irradiated onto a sample, X-rays with energies specific to the elements contained in the sample are generated. These are called fluorescent X-rays. This analytical method detects these fluorescent X-rays with a semiconductor detector, calculating the type of element from the energy (horizontal axis) and the elemental concentration from the X-ray intensity (vertical axis).

• Solution Provision
The solution app automatically performs the desired measurement and analysis according to pre-registered recipes. Simply select the desired solution icon from the solution app list to easily obtain analysis results. It provides easy analysis in a wide variety of fields.

* **Newly Developed Smart FP (Fundamental Parameter) Method**
The newly developed Smart FP (Fundamental Parameter) method provides highly accurate quantitative results without the need to prepare standard samples, and automatically corrects for residual components and thickness. (Residual component correction and thickness correction functions are only compatible with organic samples.)

* **Smart Assist (YOKOGUSHI Proposal)**
The JSX-1000S is ideal as a pre-check and cross-check instrument for analysis of JEOL products.
* **Zr EDXRF → SEMEDS in Sand (YOKOGUSHI Proposal)**
Zirconium (Zr) is found in sand from beaches and rivers. However, not all sand contains Zr. By using XRF, it is possible to quickly determine whether a group of sand grains contains Zr. Furthermore, by using SEM EDS, it is possible to identify the sand grains containing Zr. By using XRF and SEM EDS together, the location of the target element can be narrowed down.

* **Simple Operation**
Simple operation: just set the sample and touch the screen. Switching between analysis result display and spectrum display is done via touch operation, allowing for operation similar to a tablet PC or smartphone. (Keyboard and mouse operation is also possible). Simple set-and-touch operation with a simple and intuitive GUI.

Model
There is 1 model available for this product.

Product
JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer

Handling Company
JEOL Ltd.

Categories

Analyzers

X-Ray Fluorescence (XRF) Analyzers

Light Sources

X-ray Tubes

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Last viewed: 14 hours ago

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1 Models of JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer

Image	Part Number	Price (excluding tax)	X-ray generator	Collimator 3 types automatic exchange	Target	Primary filter up to 9 types automatic replacement	Analysis software	Operation computer	Software for daily checks	Detection element range	Detector	Sample chamber size	Sample chamber observation mechanism	Sample chamber atmosphere
	JSX-1000S	Available upon quote	5~50kV, 1mA	0.9mm, 2mm, 9mm	Rh	OPEN, ND, Cr, Pb, Cd (standard) Cl, Cu, Mo, Sb (optional)	Qualitative analysis (automatic qualitative, KLM marker sum peak display, spectrum search) Quantitative analysis (bulk FP method, calibration curve method) RoHS analysis solution (Cd,Pb,Hg,Br,Cr)	Windows® touch panel desktop computer	Tube aging, energy check, strength check	Mg~U F~U (optional)	Silicon drift detector	300mmφ×80mmH	Color camera	Air/vacuum (optional)

Image

Part Number

Price (excluding tax)

X-ray generator

Collimator 3 types automatic exchange

Target

Primary filter up to 9 types automatic replacement

Analysis software

Operation computer

Software for daily checks

Detection element range

Detector

Sample chamber size

Sample chamber observation mechanism

Sample chamber atmosphere

JSX-1000S

Available upon quote

5~50kV, 1mA

0.9mm, 2mm, 9mm

OPEN, ND, Cr, Pb, Cd (standard)
Cl, Cu, Mo, Sb (optional)

Qualitative analysis (automatic qualitative, KLM marker
sum peak display, spectrum search)
Quantitative analysis (bulk FP method, calibration curve method) RoHS analysis solution (Cd,Pb,Hg,Br,Cr)

Windows® touch panel desktop computer

Tube aging, energy check, strength check

Mg~U
F~U (optional)

Silicon drift detector

300mmφ×80mmH

Color camera

Air/vacuum (optional)

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About Company Handling This Product

JEOL Ltd.

Japan

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JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer JEOL Ltd.

About This Product

■Features

1 Models of JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer

JSX-1000S

Customers who viewed this product also viewed

Other products of JEOL Ltd.

About Company Handling This Product

Related search keywords

JSX-1000S Energy-Dispersive X-ray Fluorescence (XRF) Spectrometer
JEOL Ltd.