JIB-PS500i FIB-SEM System SEM-JIB-PS500i SEM

JIB-PS500i FIB-SEM System SEM
JEOL Ltd.

About This Product

■ New Sample Preparation SolutionThe JIB-PS500i offers three solutions to assist in TEM sample preparation. It enables a reliable and high-throughput workflow from sample preparation to TEM observation.

■ Features・TEM-LINKAGE
The dual-axis tilt cartridge and TEM holder facilitate linking between TEM and FIB. The cartridge can be attached to the dedicated TEM sample holder with a single touch.

・CHECK-AND-GO
To ensure reliable TEM sample preparation, it is crucial to be able to check the prepared sample on the spot. The JIB-PS500i allows for a seamless transition from TEM sample preparation to STEM observation. Repeated thin section preparation and STEM observation ensures satisfactory sample preparation.

・AUTOMATIC PREPARATION
The STEMPLING2 automated TEM sample preparation system automates TEM sample preparation. Because sample preparation is automated, there is no variation in quality due to operator skill.

■ HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging: No More Hesitation, Never Miss the Processing Endpoint, High-Quality SEM Images• Signal Detection System
Multiple detectors are available, including the standard SED, UED, and iBED. By selecting the optimal detector according to the application, effective observation of various samples is possible.
• High Resolution SEM Imaging
The newly developed super conical lens system mounted on the SEM tube significantly improves observation performance at low acceleration voltages. As an SEM for confirming the processing endpoint of thin section preparation, it can acquire clear images with good contrast, ensuring that the processing endpoint is never missed.
• SEM Imaging of FIB-Prepared Cross Section
The ultra-compact, thin retractable backscattered electron detector RBED can be used even when the stage is tilted. Not only for observing the sample surface, but also for observing FIB cross sections that require tilted observation, optimal SEM observation can be performed with various detectors in combination with the secondary electron detector SED and the upper detector UED.

Model
There is 1 model available for this product.

Product
JIB-PS500i FIB-SEM System SEM

Handling Company
JEOL Ltd.

Categories

Observation Equipment

Electron Microscopes

Observation Equipment

Transmission Electron Microscopes

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1 Models of JIB-PS500i FIB-SEM System SEM

Image	Part Number	Price (excluding tax)	Beam current	Magnification	Image resolution	Incident voltage	Objective lens	Standard detector	Sample bias voltage	Long focal length (LDF) mode	Aperture Optimized Lens (ACL)	Electron gun
	JIB-PS500i SEM	Available upon quote	Approximately 1 pA~500 nA or more	×50~×1,000,000 (STD mode) ×1,000~×1,000,000 (UHR mode) ×10~×19,000 (LDF mode) (When displaying 128 mm × 96 mm photo size)	0.7nm (15kV) 1.4nm (1kV) 1.0 nm (1 kV, BD mode)	0.01~30kV	Super conical lens	Secondary electron detector (SED), Upper electron detector (UED), In-lens backscattered electron detector (iBED)	0.0~-5.0kV	Built-in	Built-in	In-lens shot key Plus field emission electron gun

Image

Part Number

Price (excluding tax)

Beam current

Magnification

Image resolution

Incident voltage

Objective lens

Standard detector

Sample bias voltage

Long focal length (LDF) mode

Aperture Optimized Lens (ACL)

Electron gun

JIB-PS500i SEM

Available upon quote

Approximately 1 pA~500 nA or more

×50~×1,000,000 (STD mode)
×1,000~×1,000,000 (UHR mode)
×10~×19,000 (LDF mode)
(When displaying 128 mm × 96 mm photo size)

0.7nm (15kV)
1.4nm (1kV)
1.0 nm (1 kV, BD mode)

0.01~30kV

Super conical lens

Secondary electron detector (SED),
Upper electron detector (UED),
In-lens backscattered electron detector (iBED)

0.0~-5.0kV

Built-in

In-lens shot key Plus
field emission electron gun

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About Company Handling This Product

JEOL Ltd.

Japan

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JIB-PS500i FIB-SEM System SEM JEOL Ltd.

About This Product

■ New Sample Preparation Solution

■ Features

■ HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging: No More Hesitation, Never Miss the Processing Endpoint, High-Quality SEM Images

1 Models of JIB-PS500i FIB-SEM System SEM

JIB-PS500i SEM

Customers who viewed this product also viewed

Other products of JEOL Ltd.

About Company Handling This Product

Related search keywords

JIB-PS500i FIB-SEM System SEM
JEOL Ltd.