JEM-ACE200F High-Throughput Analytical Electron Microscope-JEM-ACE200F

JEM-ACE200F High-Throughput Analytical Electron Microscope
JEOL Ltd.

About This Product

The JEM-ACE200F is an electron microscope compatible with systems that allow operators to acquire data without directly operating the electron microscope by creating operational workflow recipes. Integrating the hardware technologies of the high-end electron microscope JEM-ARM200F and the general-purpose FE-TEM JEM-F200, it achieves high stability and high resolution, and debuts with a newly refined design.

■Main Platform• Cs correction device mountable, CFEG
• High-speed, high-precision stage: 3 times faster than existing motor-driven control, and capable of fine-tuning control equivalent to Piezo-driven control.

■Easy Operation• Intuitive operation even for those with limited TEM experience.
• Minimizes operation using the control panel; final image acquisition is possible by sequentially clicking buttons on the screen.
• Focus adjustment and other functions can be performed with a mouse.
• Integration with Gatan camera possible.
• Automatic adjustment functions
• Autofocus, auto astigmatism, auto sample height adjustment, auto beam centering, auto orientation, etc.

■Automatic Data Acquisition Function• Automatic data acquisition possible according to recipe.
• TEM image, STEM image, elemental map
• Supports multiple samples on a grid.

■Link with Measurement Software• Magnification calibration possible on the TEM side for each set magnification.
• Automatic measurement of data acquired from multiple JEM-ACE200F units.

■Remote Operation• Adjacent room operation
• Remote operation and simultaneous observation of multiple locations (depending on network environment) • Simultaneous observation is possible while discussing with multiple business locations.

■ Improved environmental resistance through the microscope tube enclosure• Contributes to suppression of noise, airflow, and room temperature changes
• Further soundproofing measures are possible by attaching sound-absorbing material to the inner wall.

Model
There is 1 model available for this product.

Product
JEM-ACE200F High-Throughput Analytical Electron Microscope

Handling Company
JEOL Ltd.

Categories

Testing Equipment

Semiconductor inspection equipment

Observation Equipment

Electron Microscopes

Observation Equipment

Transmission Electron Microscopes

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Last viewed: 11 hours ago

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1 Models of JEM-ACE200F High-Throughput Analytical Electron Microscope

Image	Part Number	Price (excluding tax)	STEM resolution (at 200kV)	TEM resolution (at 200kV)	Acceleration voltage	Sample tilt angle	Electron gun	Option
	JEM-ACE200F	Available upon quote	Dark field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm Bright field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm	Particle image ≤0.21nm Lattice image 0.1nm Information limit ≤0.11nm	60kV~200kV (200kV, 80kV standard compatible, other acceleration voltages are optional)	TX/TY (biaxial tilt holder) ±20°/±25° TX (dedicated high tilt holder) ±80°	Cold cathode field emission electron gun (CFEG)	JEOL100mm2 SDD (Dual), EELS, Cs corrector, Automation Center, Tomography

Image

Part Number

Price (excluding tax)

STEM resolution (at 200kV)

TEM resolution (at 200kV)

Acceleration voltage

Sample tilt angle

Electron gun

Option

JEM-ACE200F

Available upon quote

Dark field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm
Bright field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm

Particle image ≤0.21nm
Lattice image 0.1nm
Information limit ≤0.11nm

60kV~200kV (200kV, 80kV standard compatible, other acceleration voltages are optional)

TX/TY (biaxial tilt holder) ±20°/±25°
TX (dedicated high tilt holder) ±80°

Cold cathode field emission electron gun (CFEG)

JEOL100mm2 SDD (Dual), EELS, Cs corrector, Automation Center, Tomography

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About Company Handling This Product

JEOL Ltd.

Japan

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JEM-ACE200F High-Throughput Analytical Electron Microscope JEOL Ltd.

About This Product

■Main Platform

■Easy Operation

■Automatic Data Acquisition Function

■Link with Measurement Software

■Remote Operation

■ Improved environmental resistance through the microscope tube enclosure

1 Models of JEM-ACE200F High-Throughput Analytical Electron Microscope

JEM-ACE200F

Customers who viewed this product also viewed

Other products of JEOL Ltd.

About Company Handling This Product

Related search keywords

JEM-ACE200F High-Throughput Analytical Electron Microscope
JEOL Ltd.