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JEOL Ltd.'s Semiconductor inspection equipment

JEOL Ltd.

2 products found

JEM-ACE200F High-Throughput Analytical Electron Microscope-JEOL Ltd.

JEOL Ltd.

JEM-ACE200F High-Throughput Analytical Electron Microscope

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Last viewed: 1 hour ago

The JEM-ACE200F is an electron microscope compatible with systems that allow operators to acquire data without directly operating the electron micr...


JSM-IT810 Schottky Field Emission Scanning Electron Microscope-JEOL Ltd.

JEOL Ltd.

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

930+ people viewing

Last viewed: 48 minutes ago

■Automatic Observation and Analysis Function "Neo Action" Intuitive operation allows anyone to easily automate SEM observation and EDS analysis. ■...



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