JSM-IT810 Schottky field emission scanning electron microscope
JEOL Ltd.
About This Product
■Automatic observation and analysis function "Neo Action"
With intuitive operation, anyone can easily automate SEM observation and EDS analysis.
■SEM automatic adjustment package
This function performs magnification adjustment, axis adjustment, and EDS energy calibration using a dedicated sample. Regular checks can be performed to ensure that the equipment is always in good condition.
■Live-3D function
Signal selection is possible with the 5-divided semiconductor detector element. A three-dimensional image can be reconstructed using two-dimensional images obtained from four directions. The newly installed Live-3D function allows you to measure while checking the unevenness with a live image.
■EDS integration
Achieving next-generation operability that eliminates the barriers between SEM observation and EDS elemental analysis. You can reserve various analysis methods such as point, area, MAP, and line directly on the observation screen and start analysis immediately.
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Product
JSM-IT810 Schottky field emission scanning electron microscope
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Handling Company
JEOL Ltd.
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Categories
1 Models of JSM-IT810 Schottky field emission scanning electron microscope
| Product Image | Part Number | Price (excluding tax) |
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JSM-IT810 |
Available upon quote |
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About Company Handling This Product
- Japan