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  4. JSM-IT810 Schottky field emission scanning electron microscope (JEOL Ltd.)
JSM-IT810 Schottky field emission scanning electron microscope-JSM-IT810
JSM-IT810 Schottky field emission scanning electron microscope-JEOL Ltd.

JSM-IT810 Schottky field emission scanning electron microscope
JEOL Ltd.

JEOL Ltd.'s Response Status

Response Rate

100.0%

Response Time

63.0hours

About This Product

■Automatic observation and analysis function "Neo Action"

With intuitive operation, anyone can easily automate SEM observation and EDS analysis.

■SEM automatic adjustment package

This function performs magnification adjustment, axis adjustment, and EDS energy calibration using a dedicated sample. Regular checks can be performed to ensure that the equipment is always in good condition.

■Live-3D function

Signal selection is possible with the 5-divided semiconductor detector element. A three-dimensional image can be reconstructed using two-dimensional images obtained from four directions. The newly installed Live-3D function allows you to measure while checking the unevenness with a live image.

■EDS integration

Achieving next-generation operability that eliminates the barriers between SEM observation and EDS elemental analysis. You can reserve various analysis methods such as point, area, MAP, and line directly on the observation screen and start analysis immediately.

  • Product

    JSM-IT810 Schottky field emission scanning electron microscope

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1 Models of JSM-IT810 Schottky field emission scanning electron microscope

Image Part Number Price (excluding tax)
JSM-IT810 Schottky field emission scanning electron microscope-Part Number-JSM-IT810

JSM-IT810

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About Company Handling This Product

JEOL Ltd.

Response Rate

100.0%

Response Time

63.0hrs

  • Japan

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