JEM-ACE200F high-throughput analytical electron microscope
JEOL Ltd.
About This Product
The JEM-ACE200F is an electron microscope compatible with a system that allows operators to acquire data without directly operating the electron microscope by creating operational workflow recipes. It has integrated the hardware technologies of the high-end electron microscope JEM-ARM200F and the general-purpose FE-TEM JEM-F200 to achieve high stability and high resolution, and has debuted with a new and sophisticated design.
■Main platform
・Can be equipped with Cs correction device, CFEG
・High-speed, high-precision stage: 3 times faster than existing motor drive control and capable of fine movement control equivalent to Piezo drive control
■Easy operation
・Can be operated intuitively even if you have little experience operating TEM
・The final image can be obtained by clicking buttons on the screen in order, minimizing the number of operations using the control panel.
・Focus adjustment etc. can also be done using the mouse.
・Can be integrated with Gatan Camera
・Automatic adjustment function
・Auto focus, auto astigmatism, auto sample height adjustment, auto beam centering, auto orientation, etc.
■Automatic data acquisition function
・Automatic data acquisition possible using recipes
・TEM images, STEM images, elemental maps
・Supports multiple samples on grid
■Link with length measurement software
・Magnification can be calibrated for each set magnification on the TEM side
・It is possible to automatically measure the length of data acquired with multiple JEM-ACE200Fs.
■Remote control
・Adjacent room operation
・Remote location operation and simultaneous observation of multiple locations (depends on network environment)
・Simultaneous observation possible while discussing with multiple business establishments
■Improved environmental resistance performance with lens barrel enclosure
・Contributes to suppressing noise, airflow, and room temperature changes
・Additional soundproofing measures can be taken by installing sound-absorbing materials on the inner walls.
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Product
JEM-ACE200F high-throughput analytical electron microscope
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Handling Company
JEOL Ltd.
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Categories
1 Models of JEM-ACE200F high-throughput analytical electron microscope
| Product Image | Part Number | Price (excluding tax) | Acceleration voltage | Electron gun | Option | STEM resolution (at 200kV) | Sample tilt angle | TEM resolution (at 200kV) |
|---|---|---|---|---|---|---|---|---|
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JEM-ACE200F |
Available upon quote | 60kV~200kV (200kV, 80kV standard compatible, other acceleration voltages are optional) | Cold Cathode Field Emission Electron Gun (CFEG) | JEOL100mm2 SDD (Dual), EELS, Cs corrector, Automation Center, Tomography |
Dark field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm Bright field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm |
TX/TY (biaxial tilt holder) ±20°/±25° TX (dedicated high tilt holder) ±80° |
Particle image ≤0.21nm Lattice image 0.1nm Information limit ≤0.11nm |
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About Company Handling This Product
- Japan