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  4. JEM-ACE200F high-throughput analytical electron microscope (JEOL Ltd.)
JEM-ACE200F high-throughput analytical electron microscope-JEM-ACE200F
JEM-ACE200F high-throughput analytical electron microscope-JEOL Ltd.

JEM-ACE200F high-throughput analytical electron microscope
JEOL Ltd.

JEOL Ltd.'s Response Status

Response Rate

100.0%

Response Time

41.9hours

About This Product

The JEM-ACE200F is an electron microscope compatible with a system that allows operators to acquire data without directly operating the electron microscope by creating operational workflow recipes. It has integrated the hardware technologies of the high-end electron microscope JEM-ARM200F and the general-purpose FE-TEM JEM-F200 to achieve high stability and high resolution, and has debuted with a new and sophisticated design.

■Main platform

・Can be equipped with Cs correction device, CFEG ・High-speed, high-precision stage: 3 times faster than existing motor drive control and capable of fine movement control equivalent to Piezo drive control

■Easy operation

・Can be operated intuitively even if you have little experience operating TEM ・The final image can be obtained by clicking buttons on the screen in order, minimizing the number of operations using the control panel. ・Focus adjustment etc. can also be done using the mouse. ・Can be integrated with Gatan Camera ・Automatic adjustment function ・Auto focus, auto astigmatism, auto sample height adjustment, auto beam centering, auto orientation, etc.

■Automatic data acquisition function

・Automatic data acquisition possible using recipes ・TEM images, STEM images, elemental maps ・Supports multiple samples on grid

■Link with length measurement software

・Magnification can be calibrated for each set magnification on the TEM side ・It is possible to automatically measure the length of data acquired with multiple JEM-ACE200Fs.

■Remote control

・Adjacent room operation ・Remote location operation and simultaneous observation of multiple locations (depends on network environment) ・Simultaneous observation possible while discussing with multiple business establishments

■Improved environmental resistance performance with lens barrel enclosure

・Contributes to suppressing noise, airflow, and room temperature changes ・Additional soundproofing measures can be taken by installing sound-absorbing materials on the inner walls.

  • Product

    JEM-ACE200F high-throughput analytical electron microscope

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1 Models of JEM-ACE200F high-throughput analytical electron microscope

Image Part Number Price (excluding tax) STEM resolution (at 200kV) TEM resolution (at 200kV) Acceleration voltage Sample tilt angle Electron gun Option
JEM-ACE200F high-throughput analytical electron microscope-Part Number-JEM-ACE200F

JEM-ACE200F

Available upon quote

Dark field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm
Bright field transmission electron scanning image ≤0.136nm with aberration correction (optional) ≤0.1nm

Particle image ≤0.21nm
Lattice image 0.1nm
Information limit ≤0.11nm

60kV~200kV (200kV, 80kV standard compatible, other acceleration voltages are optional)

TX/TY (biaxial tilt holder) ±20°/±25°
TX (dedicated high tilt holder) ±80°

Cold cathode field emission electron gun (CFEG)

JEOL100mm2 SDD (Dual), EELS, Cs corrector, Automation Center, Tomography

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About Company Handling This Product

JEOL Ltd.

Response Rate

100.0%

Response Time

41.9hrs

  • Japan

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