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  4. JIB-PS500i FIB-SEM System SEM (JEOL Ltd.)
JIB-PS500i FIB-SEM System SEM-JIB-PS500i SEM
JIB-PS500i FIB-SEM System SEM-JEOL Ltd.

JIB-PS500i FIB-SEM System SEM
JEOL Ltd.

JEOL Ltd.'s Response Status

Response Rate

100.0%

Response Time

63.0hours

About This Product

◾️ New sample preparation solution JIB-PS500i provides three solutions to assist in TEM specimen preparation. From sample preparation to TEM observation, you can work with a reliable and high-throughput workflow. ◾️Features ・TEM-LINKAGE The biaxially tilted cartridge and TEM holder facilitate the TEM ⇔ FIB link. The cartridge can be attached to the dedicated TEM sample holder with one touch. ・CHECK-AND-GO In order to prepare TEM samples reliably, it is important to be able to check the prepared samples on the spot. With JIB-PS500i, you can seamlessly transition from TEM sample preparation to STEM observation. By repeating thin section processing and STEM observation, satisfactory specimens can be prepared. ・AUTOMATIC PREPARATION Automatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. Since sample preparation is performed automatically, there is no variation in quality due to operator skill. ◾️ HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging No more hesitation Never miss the end point of machining High-quality SEM images ・Signal detection system Multiple detectors are available, including the standard SED, UED, and iBED. By selecting the optimal detector according to the application, it is possible to effectively observe a variety of samples. ・High resolution SEM imaging Equipped with a newly developed superconical lens system in the SEM column, the observation performance at low accelerating voltages has been greatly improved. As a SEM for confirming the end point of thin section processing, it can obtain clear images with good contrast so that the end point of processing is not overlooked. ・SEM imaging of FIB-prepared cross section The ultra-compact and thin retractable backscattered electron detector RBED can be used even when the stage is tilted. Optimal SEM observation can be performed not only for observing the sample surface, but also for observing FIB cross sections that require oblique observation, using a variety of detectors, including the secondary electron detector SED and upper detector UED.

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    JIB-PS500i FIB-SEM System SEM

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1 Models of JIB-PS500i FIB-SEM System SEM

Image Part Number Price (excluding tax) Electron gun Aperture Optimized Lens (ACL) Long focal length (LDF) mode Sample bias voltage Standard detector Objective lens Incident voltage Image resolution Magnification Beam current
JIB-PS500i FIB-SEM System SEM-Part Number-JIB-PS500i SEM

JIB-PS500i SEM

Available upon quote

In-lens shot key Plus
field emission electron gun

Built-in

Built-in

0.0~-5.0kV

Secondary electron detector (SED),
Upper electron detector (UED),
In-lens backscattered electron detector (iBED)

Super conical lens

0.01~30kV

0.7nm (15kV)
1.4nm (1kV)
1.0 nm (1 kV, BD mode)

×50~×1,000,000 (STD mode)
×1,000~×1,000,000 (UHR mode)
×10~×19,000 (LDF mode)
(When displaying 128 mm × 96 mm photo size)

Approximately 1 pA~500 nA or more

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About Company Handling This Product

JEOL Ltd.

Response Rate

100.0%

Response Time

63.0hrs

  • Japan

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