All Categories

History

  1. Metoree
  2. Observation Equipment
  3. Electron Microscopes
  4. JIB-PS500i FIB-SEM System SEM (JEOL Ltd.)
JIB-PS500i FIB-SEM System SEM-JIB-PS500i SEM
JIB-PS500i FIB-SEM System SEM-JEOL Ltd.

JIB-PS500i FIB-SEM System SEM
JEOL Ltd.

About This Product

◾️ New sample preparation solution JIB-PS500i provides three solutions to assist in TEM sample preparation. From sample preparation to TEM observation, you can work with a reliable and high-throughput workflow. ◾️Features ・TEM-LINKAGE The biaxially tilted cartridge and TEM holder facilitate the TEM ⇔ FIB link. The cartridge can be attached to the dedicated TEM sample holder with one touch. ・CHECK-AND-GO In order to prepare TEM samples reliably, it is important to be able to check the prepared samples on the spot. With JIB-PS500i, you can seamlessly transition from TEM sample preparation to STEM observation. By repeating thin section processing and STEM observation, satisfactory specimens can be prepared. ・AUTOMATIC PREPARATION Automatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. Since sample preparation is performed automatically, there is no variation in quality due to operator skill. ◾️ HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging No more hesitation Never miss the end point of machining High-quality SEM images ・Signal detection system Multiple detectors are available, including the standard SED, UED, and iBED. By selecting the optimal detector according to the application, it is possible to effectively observe a variety of samples. ・High resolution SEM imaging Equipped with a newly developed superconical lens system in the SEM column, the observation performance at low accelerating voltages has been greatly improved. As a SEM for checking the end point of thin section processing, it can obtain clear images with good contrast so that the end point of processing is not overlooked. ・SEM imaging of FIB-prepared cross section The ultra-compact and thin retractable backscattered electron detector RBED can be used even when the stage is tilted. Optimal SEM observation can be performed not only for observing the sample surface, but also for observing FIB cross sections that require oblique observation, using a variety of detectors, including the secondary electron detector SED and upper detector UED.

  • Product

    JIB-PS500i FIB-SEM System SEM

Share this product


200+ people viewing

Last viewed: 11 hours ago

Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of JIB-PS500i FIB-SEM System SEM

Image Part Number Price (excluding tax) Beam current Magnification Image resolution Incident voltage Objective lens Standard detector Sample bias voltage Long focal length (LDF) mode Aperture Optimized Lens (ACL) Electron gun
JIB-PS500i FIB-SEM System SEM-Part Number-JIB-PS500i SEM

JIB-PS500i SEM

Available upon quote

Approximately 1 pA~500 nA or more

×50~×1,000,000 (STD mode)
×1,000~×1,000,000 (UHR mode)
×10~×19,000 (LDF mode)
(When displaying 128 mm × 96 mm photo size)

0.7nm (15kV)
1.4nm (1kV)
1.0 nm (1 kV, BD mode)

0.01~30kV

Super conical lens

Secondary electron detector (SED),
Upper electron detector (UED),
In-lens backscattered electron detector (iBED)

0.0~-5.0kV

Built-in

Built-in

In-lens shot key Plus
field emission electron gun

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

JEM-120i electron microscope-JEOL Ltd.

JEM-120i electron microscope

JEOL Ltd.

190+ people viewing

Response time: 41.86 hours

Electron Microscopes

2 models listed

JCM-7000 NeoScope™ Tabletop Scanning Electron Microscope-JEOL Ltd.

JCM-7000 NeoScope™ Tabletop Scanning Electron Microscope

JEOL Ltd.

190+ people viewing

Last viewed: 2 hours ago

Response time: 41.86 hours

Electron Microscopes

3 models listed

Photoelectron microscope (MyPEEM)-Hokkai Photoelectronics Co., Ltd.

Photoelectron microscope (MyPEEM)

Hokkai Photoelectronics Co., Ltd.

150+ people viewing

Last viewed: 5 hours ago

Electron Microscopes
JEM-ACE200F high-throughput analytical electron microscope-JEOL Ltd.

JEM-ACE200F high-throughput analytical electron microscope

JEOL Ltd.

160+ people viewing

Last viewed: 54 minutes ago

Response time: 41.86 hours

Electron Microscopes

3 models listed

JSM-IT810 Schottky field emission scanning electron microscope-JEOL Ltd.

JSM-IT810 Schottky field emission scanning electron microscope

JEOL Ltd.

180+ people viewing

Last viewed: 7 hours ago

Response time: 41.86 hours

Electron Microscopes

4 models listed

Scanning electron microscope JSM-IT710HR-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT710HR

Cosmo Trading Co., Ltd.

4.0

240+ people viewing

Last viewed: 10 hours ago

Response time: 24.30 hours

Electron Microscopes

3 models listed

Scanning electron microscope JSM-IT210-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT210

Cosmo Trading Co., Ltd.

4.0

230+ people viewing

Last viewed: 4 hours ago

Response time: 24.30 hours

Electron Microscopes

3 models listed

Schottky field emission scanning electron microscope JSM-IT800 series-Cosmo Trading Co., Ltd.

Schottky field emission scanning electron microscope JSM-IT800 series

Cosmo Trading Co., Ltd.

4.0

640+ people viewing

Last viewed: 3 hours ago

Response time: 24.30 hours

Electron Microscopes

15 models listed

Scanning electron microscope JSM-IT700HR InTouchScope™-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT700HR InTouchScope™

Cosmo Trading Co., Ltd.

4.0

190+ people viewing

Last viewed: 14 hours ago

Response time: 24.30 hours

Electron Microscopes

3 models listed

Scanning electron microscope JSM-IT510HR InTouchScope™-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT510HR InTouchScope™

Cosmo Trading Co., Ltd.

4.0

440+ people viewing

Response time: 24.30 hours

Electron Microscopes

12 models listed

Scanning electron microscope JSM-IT200 InTouchScope™-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT200 InTouchScope™

Cosmo Trading Co., Ltd.

4.0

240+ people viewing

Last viewed: 1 hour ago

Response time: 24.30 hours

Electron Microscopes

3 models listed

Neoscope Tabletop Scanning Electron Microscope JCM-7000 NeoScope™-Cosmo Trading Co., Ltd.

Neoscope Tabletop Scanning Electron Microscope JCM-7000 NeoScope™

Cosmo Trading Co., Ltd.

4.0

260+ people viewing

Last viewed: 3 hours ago

Response time: 24.30 hours

Electron Microscopes

3 models listed

See More Electron Microscopes Products

Other products of JEOL Ltd.

Reviews shown here are reviews of companies.

JEM-120i electron microscope-JEOL Ltd.

JEM-120i electron microscope

JEOL Ltd.

190+ people viewing

Response time: 41.86 hours

Electron Microscopes

2 models listed

JCM-7000 NeoScope™ Tabletop Scanning Electron Microscope-JEOL Ltd.

JCM-7000 NeoScope™ Tabletop Scanning Electron Microscope

JEOL Ltd.

190+ people viewing

Last viewed: 2 hours ago

Response time: 41.86 hours

Electron Microscopes

3 models listed

JSX-1000S Energy Dispersive X-ray Fluorescence Spectrometer (XRF)-JEOL Ltd.

JSX-1000S Energy Dispersive X-ray Fluorescence Spectrometer (XRF)

JEOL Ltd.

180+ people viewing

Last viewed: 3 hours ago

Response time: 41.86 hours

X-Ray Fluorescence (XRF) Analyzers

2 models listed

NMR spectrometerECZ Luminous™(JNM-ECZL series)FT NMR instrument-JEOL Ltd.

NMR spectrometerECZ Luminous™(JNM-ECZL series)FT NMR instrument

JEOL Ltd.

110+ people viewing

Last viewed: 22 hours ago

Response time: 41.86 hours

Nuclear Magnetic Resonance (NMR) Analyzers
JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer-JEOL Ltd.

JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer

JEOL Ltd.

130+ people viewing

Last viewed: 32 minutes ago

Response time: 41.86 hours

Chromatographic Gas
JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph Time-of-Flight Mass Spectrometer-JEOL Ltd.

JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph Time-of-Flight Mass Spectrometer

JEOL Ltd.

140+ people viewing

Last viewed: 31 minutes ago

Response time: 41.86 hours

Chromatographic Gas
JMS-TQ4000GC UltraQuad™ TQ Gas Chromatograph Triple Quadrupole Mass Spectrometer-JEOL Ltd.

JMS-TQ4000GC UltraQuad™ TQ Gas Chromatograph Triple Quadrupole Mass Spectrometer

JEOL Ltd.

130+ people viewing

Last viewed: 31 minutes ago

Response time: 41.86 hours

Chromatographic Gas
JEM-ACE200F high-throughput analytical electron microscope-JEOL Ltd.

JEM-ACE200F high-throughput analytical electron microscope

JEOL Ltd.

160+ people viewing

Last viewed: 54 minutes ago

Response time: 41.86 hours

Semiconductor inspection equipment

3 models listed

JSM-IT810 Schottky field emission scanning electron microscope-JEOL Ltd.

JSM-IT810 Schottky field emission scanning electron microscope

JEOL Ltd.

180+ people viewing

Last viewed: 7 hours ago

Response time: 41.86 hours

Semiconductor inspection equipment

4 models listed

Electron beam lithography system (variable/spot) JBX-A9 series-JEOL Ltd.

Electron beam lithography system (variable/spot) JBX-A9 series

JEOL Ltd.

70+ people viewing

Last viewed: 2 hours ago

Response time: 41.86 hours

Electron Beam Lithography Systems

View more products of JEOL Ltd.

About Company Handling This Product

JEOL Ltd.

  • Japan

Related search keywords

Electron Microscopes
Electron Microscopes　JEOL Ltd.
JEOL Ltd.

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree