JEOL Ltd.'s Transmission Electron Microscopes

5 products found

JEOL Ltd.

JCM-7000 NeoScope™ Desktop Scanning Electron Microscope

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■Features ・Background and Main Features Benchtop scanning electron microscopes are increasingly being used in various fields, primarily in electri...

JEOL Ltd.

JEM-120i Electron Microscope

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Last viewed: 6 hours ago

■ Towards a more accessible tool for everyone Transmission electron microscopes (TEMs) with an acceleration voltage of 120 kV are widely used in th...

JEOL Ltd.

JEM-ACE200F High-Throughput Analytical Electron Microscope

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The JEM-ACE200F is an electron microscope compatible with systems that allow operators to acquire data without directly operating the electron micr...

JEOL Ltd.

JIB-PS500i FIB-SEM System SEM

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Last viewed: 20 hours ago

■ New Sample Preparation Solution The JIB-PS500i offers three solutions to assist in TEM sample preparation. It enables a reliable and high-through...

JEOL Ltd.

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

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Last viewed: 2 hours ago

■Automatic Observation and Analysis Function "Neo Action" Intuitive operation allows anyone to easily automate SEM observation and EDS analysis. ■...

Check the product list of JEOL Ltd.

JEOL Ltd.'s Transmission Electron Microscopes

JCM-7000 NeoScope™ Desktop Scanning Electron Microscope

JEM-120i Electron Microscope

JEM-ACE200F High-Throughput Analytical Electron Microscope

JIB-PS500i FIB-SEM System SEM

JSM-IT810 Schottky Field Emission Scanning Electron Microscope

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