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5 products found
JEOL Ltd.
900+ people viewing
■Features ・Background and Main Features Benchtop scanning electron microscopes are increasingly being used in various fields, primarily in electri...
JEOL Ltd.
870+ people viewing
Last viewed: 7 hours ago
■ Towards a more accessible tool for everyone Transmission electron microscopes (TEMs) with an acceleration voltage of 120 kV are widely used in th...
JEOL Ltd.
970+ people viewing
Last viewed: 15 hours ago
The JEM-ACE200F is an electron microscope compatible with systems that allow operators to acquire data without directly operating the electron micr...
JEOL Ltd.
1390+ people viewing
Last viewed: 1 day ago
■ New Sample Preparation Solution The JIB-PS500i offers three solutions to assist in TEM sample preparation. It enables a reliable and high-through...
JEOL Ltd.
900+ people viewing
Last viewed: 1 hour ago
■Automatic Observation and Analysis Function "Neo Action" Intuitive operation allows anyone to easily automate SEM observation and EDS analysis. ■...