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This section provides an overview for x-ray fluorescence (xrf) analyzers as well as their applications and principles. Also, please take a look at the list of 18 x-ray fluorescence (xrf) analyzer manufacturers and their company rankings. Here are the top-ranked x-ray fluorescence (xrf) analyzer companies as of December, 2024: 1.SciAps, Inc., 2.Pratt & Whitney Measurement Systems, Inc., 3.SPECTRO Analytical Instruments GmbH..
Table of Contents
X-Ray Fluorescence (XRF) Analyzer is a device that analyzes the content of an element by its X-ray fluorescence spectrum when an object is irradiated with X-rays.
X-Ray Fluorescence (XRF) Analyzers are used for qualitative and quantitative analysis of substances, and are utilized as a method of analyzing the composition of substances because they can be examined in a short time without destroying the sample.
X-Ray Fluorescence (XRF) Analyzer is a highly reliable inspection device because it can measure both solids and liquids and has relatively high sensitivity as a method of qualitative analysis.
X-Ray Fluorescence (XRF) Analyzers can perform qualitative and quantitative analysis of samples, both solid and liquid, in a nondestructive manner. They are especially used to determine the presence and content of toxic metals in alloy materials and soil.
For example, X-ray analysis is effective in examining the composition of materials of unknown composition, such as rocks and meteorites. Recently, printed wiring is being made halogen-free from the standpoint of environmental and safety preservation, and X-Ray Fluorescence (XRF) Analyzer is being used to assure this. Other applications include the qualitative and quantitative determination of hazardous chemical substances, and testing for substances specified by the RoHS Directive. Portable instruments that can be easily transported are also available, and their applications are expanding.
Figure 1. (a) Generation of X-ray fluorescence (b) Structure of the X-ray analyser
X-Ray Fluorescence (XRF) Analyzers measure the wavelength (or energy) and intensity of fluorescent X-rays emitted when an object is irradiated with X-rays.
When a material is irradiated with X-rays, its atoms absorb energy and are excited, emitting X-rays fluorescence. Since the wavelength (or energy) of X-ray fluorescence is unique to each element, it is possible to identify the type of substance from the wavelength of the detected X-ray fluorescence spectrum and to quantify it from its intensity.
X-Ray Fluorescence (XRF) Analyzer consists of an X-ray source that generates X-rays, a sample chamber that holds the sample, and a detection unit that spectra and detects the generated X-rays.
In the X-ray source, electron beams generated by applying high voltage are irradiated to a target such as tungsten to generate X-rays. The generated X-rays are irradiated to the upper or lower surface of the sample. At this time, the atmosphere in the sample chamber may be selected from atmosphere, nitrogen, vacuum, and other atmospheres.
X-Ray Fluorescence (XRF) Analyzers equipped with a sample observation mode allow the user to select the irradiation position while observing the sample. Elemental X-rays emitted from the sample are detected by the detector for qualitative analysis. In quantitative analysis, the intensity of the X-ray fluorescence is measured and the content rate is determined using a calibration curve or the fundamental parameter method (FP method).
There are two types of X-Ray Fluorescence (XRF) Analyzer spectroscopy and detection methods: wavelength dispersive and energy dispersive.
Figure 2. Measurement image of an energy-dispersive X-ray analyser
Energy-dispersive X-Ray Fluorescence (ED-XRF, or EDX, EDS) Analyzer is a method that measures the intensity of X-Ray Fluorescence in relation to its energy.
Specifically, the X-ray fluorescence incident on the detector is converted into a pulse current by a semiconductor in the detector, amplified, and the wave height is measured from the current value of one pulse. Since the energy of the incident X-rays is proportional to the current value, a graph of the intensity of the fluorescent X-rays versus their energy is obtained.
Figure 3. Measurement image of a wavelength-dispersive X-ray analyser
Wavelength Dispersive X-Ray Fluorescence (WD-XRF, WDX, or WDS) Analyzer measures the intensity of fluorescent X-rays in relation to their wavelength.
In the wavelength-dispersive type, X-rays emitted from a sample are spectrally split by a monochromator crystal and measured by a detector. Fluorescent X-rays incident on the spectroscopic crystal are strongly scattered in a certain direction according to the Bragg diffraction condition.
The Bragg diffraction condition is a law that states that when light of wavelength λ incident on a material with a lattice spacing d is scattered strongly in the direction of the diffraction angle 2θ, which satisfies 2dsinθ=nλ (θ: Bragg angle n: integer). In other words, since the face spacing d of the monochromator crystal is fixed, only X-rays of one wavelength are detected when the detector is located in the direction of diffraction angle 2θ, even if X-rays of various wavelengths are incident. By rotating the detector and measuring fluorescent X-rays at a wide angle, a graph of the intensity of fluorescent X-rays versus their wavelength can be obtained.
Energy-dispersive and wavelength-dispersive detection methods each have their own characteristics and should be selected appropriately according to the application.
The energy-dispersive type does not require spectroscopy, and the semiconductor detector can directly analyze the wavelength of the X-ray fluorescence, making it possible to reduce the size of the detector. Also, since multiple types of elemental analysis can be performed at once without the need for spectroscopy, measurements can be made in a short time. Because measurement can be made regardless of the shape or unevenness of the sample, it is sometimes used in conjunction with electron microscopes.
On the other hand, there are some disadvantages: the resolution tends to be low because the peaks of the obtained spectrum sometimes overlap, and it is difficult to detect elements that are contained only in trace amounts in the measurement object.
In the wavelength-dispersive type, fluorescent X-rays are spectrally split by a spectroscopic crystal and measured by a detector. Since the X-rays are spectroscopically separated by wavelengths, adjacent peaks can be easily separated, and the sensitivity and resolution tend to be high.
On the other hand, the system itself tends to be large and expensive due to its complex spectrometer system. In addition, the measurement takes longer than the energy-dispersive type because the diffraction angle is varied, and the sample surface must be smooth.
*Including some distributors, etc.
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North Star Imaging Inc., founded in 1986 and based in Rogers, USA, is a manufacturer of industrial X-ray systems non-destructive testing (NDT) equipment. The company designs and manufactures 2D digital radiography & 3D computed tomography systems. These products are frequently used for failure analysis, Quality Control and internal measurements. This technology is used by many different markets including medical devices, electronics and aerospace. The company is ISO certified for its quality and environmental standards, and has ASNT & NAS 410 certified employees.
Pratt & Whitney Measurement Systems, Inc. is a manufacturer of ultra-precision metrology products and solutions. Established in 1860, the company is headquartered in Bloomfield, Connecticut, USA. Its main activities revolve around designing, and manufacturing advanced metrology solutions, including Universal (ID/OD) Measuring Instruments and Long Length Universal (ID/OD) Measuring Instruments. The company offers a range of high-precision products, such as gages, calipers, and micrometers, catering to industries like aerospace, automotive, and manufacturing. Pratt & Whitney Measurement Systems provides comprehensive calibration and certification services, ensuring accurate measurements. The company serves applications like dimensional inspection, quality control, and process optimization, supporting various industries.
Moxtek, Inc. is an ISO 9001-certified manufacturer of advanced X-ray and nano-optical components founded in 1986 and based in Orem, Utah, USA. The company’s products are designed for imaging devices, display electronics, and analytical instrumentation. These include portable and benchtop x-ray instruments, high- and low-energy x-ray windows, and wire-grid polarizers for visible to near-infrared applications. The company’s products have applications in various industries such as transportation, energy storage manufacturing, and the security industry.
Fischer Technology, Inc., established in Windsor, CT in 1979 is a manufacturer of coating thickness and material testing instrumentation. Their product portfolio includes coating thickness gauges, material testing instruments such as hardness testers, adhesion testers, and gloss meters, adhesion testers, used for assessing the bond strength between coatings and substrates. The company serves markets including Electronics and Semiconductors, Marine and Offshore, Construction and Architecture and Quality Control. The company has a national distribution network and a customer support center.
Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific instruments and analytical and diagnostic solutions. The company's product range includes analyzers, microscopes, and imaging solutions, which have applications in fields such as life science research, cell biology, and microbiology. In 1969, the company developed the world's first FT-NMR spectrometer system, enabling broadband proton decoupling. In 1997, it further expanded its capabilities by acquiring the analytical X-ray division of Siemens AG. The company holds ISO 9001 and ISO 13485 certifications, and its products are available for sale worldwide.
SciAps, Inc., founded in 2013 in Woburn, Massachusetts, USA, is a manufacturer of portable analytical instruments for various industries. The company produces handheld spectrometers, X-ray fluorescence (XRF) analyzers, and laser-induced breakdown spectroscopy (LIBS) instruments for real-time analysis, non-destructive testing, and rapid material identification, assisting efficient quality control and field inspections. Industries ranging from metals and alloys to mining, pharmaceuticals, and environmental monitoring use the products for on-site analysis and instant material verification. Its specialization in handheld analytical instruments offers advantages in portability, ease of use, and reduced time-to-result, enabling precise and efficient analysis across various applications.
Hitachi, Ltd was established in 2002 and headquartered in Chiyoda-ku, Tokyo is a manufacturer of industrial electrical equipment and system solutions. The company offers an extensive and diversified product portfolio including industrial drive systems, power electronics, energy-related equipment, power distribution systems, and various other industrial solutions. These products serve as integral components that drive advancements in industrial capabilities across diverse sectors by playing a pivotal role in promoting energy conservation and storage, automating robot systems in large factories, enabling smarter manufacturing through digital solutions, and facilitating efficient transportation within industrial facilities.
Haida International Equipment was founded in 2004 as a manufacturer and supplier of Testing Equipment in China. The company deals in various precision testing instruments, machines, and services such as Batteries, Furniture, Textiles, Leather and Shoes, and Rubber and Plastic test equipment. There is also Adhesive tape, Cookware, Luggage, Optical, and Vibration test equipment along with Accelerated Environment Test Chamber (AES) that executes QC inspection on electronic appliances, paper products, metals, research institutes, and lots more. The other testing machines cater to industrial and mining enterprises, colleges and universities, engineering quality supervision stations, and other departments.
Rigaku Corporation is an ISO 9001-certified manufacturer and distributor of specialized analytical instruments that was founded in 1951 in Tokyo, Japan. The company produces various instruments that rely on x-ray technology for scientific and industrial analysis. Its products include x-ray diffraction (XRD) systems for analyzing powders or stress, x-ray topography systems for evaluating crystal quality, and x-ray reflectometry (XRR) systems for thin film thickness or density measurement operations. The company chiefly serves client manufacturers of semiconductors, biotechnology, and photovoltaics.
Elvatech Ltd. has been a manufacturer of analytical spectrometric instrumentation since 1991 in Ukraine. The company provides X-ray Fluorescence (XRF) analyzers like Benchtop Spectrometers along with Special-task Analyzers that offer elemental analysis with the use of X-ray technology. These devices rapidly and non-invasively assess material compositions like metals, minerals, plastics, and even food for quality control, process oversight, and environmental assessments. They are used for Positive Material Identification (PMI), such as detecting Lead in paint, Sulfur in oil, analyzing precious stones and metals as well as various applications in Art and Archeology, Mining, Construction Materials, Scientific Research, and other industries.
HORIBA RADIO LABORATORY was established in Japan in 1945 and has spent the last three-quarters of a century growing as an R&D company and engaged in international operations. HORIBA Scientific offers 200 years of experience developing high-performance scientific instruments and analytical solutions. The HORIBA Group of worldwide companies provides an extensive array of instruments and systems for applications ranging from automotive R&D, process and environmental monitoring, in-vitro medical diagnostics, semiconductor manufacturing, and metrology to a broad range of scientific R&D and QC measurements. Operating in Asia, Europe, and North and South America, HORIBA scientific develops solutions that go beyond just products.
SPECTRO Analytical Instruments GmbH, established in 1979 and currently a business unit of AMETEK Inc., is a manufacturer and supplier headquartered in Kleve, Germany, specializing in analytical instruments. The company's offerings include inductively coupled plasma atomic emission spectrometers (ICP-AES) for rapid element analysis and X-ray fluorescence (XRF) spectrometers for elemental analysis of liquids, powders, and solids. Handheld XRF analyzers are available for compliance screening, metal analysis and sorting, as well as mining applications. Stationary metal analyzers – optical emission spectroscopy (spark OES) – are provided for elemental metal analysis, while mobile metal analyzers (Arc/Spark-OES) find applications in positive material identification (PMI).
Hitachi High-Tech Analytical Science, established in 1947, is a manufacturer of analytical solutions such as analyzers, handheld thickness gauges, calorimeters, mobile & stationary spectrometers, and elemental analysis products used in environmental screening, general chemicals, metal finishing, metal production, and PMI inspection. The company offers consumables and accessories such as springs for electrodes, mineral oil, x-ray warning lamp bulbs, electrode brush, tungsten electrode, and sample films. The Westford, MA, company offers customized support packages, warranties, preventative maintenance & recertification, consultation services, and rental equipment.
Evident Corporation is a scientific research and development company in Shinjuku, Tokyo that was established in 2008. Formerly known as Olympus Scientific Solutions, the company specializes in developing cutting-edge technology and products for various industries, including aerospace, automotive, electronics, energy, and medical research. Evident Corporation has proliferated and expanded its product offerings and services to meet the needs of its customers. Their product offerings include non-destructive testing (NDT) solutions such as thickness gauges and automated inspection systems, XRF analyzers like handheld XRF analyzers, industrial microscopes, and video scopes and borescopes.
Ranking as of December 2024
Derivation Method| Rank | Company | Click Share |
|---|---|---|
| 1 | SciAps, Inc. |
14.8%
|
| 2 | Pratt & Whitney Measurement Systems, Inc. |
8.7%
|
| 3 | SPECTRO Analytical Instruments GmbH. |
7.7%
|
| 4 | Evident |
7.4%
|
| 5 | Fischer Technology, Inc. |
7.0%
|
| 6 | HORIBA |
6.9%
|
| 7 | Haida International Equipment Co., Ltd. |
6.2%
|
| 8 | Elvatech Ltd. |
5.7%
|
| 9 | Spectory |
5.3%
|
| 10 | Hitachi, Ltd. |
5.0%
|
Derivation Method
The ranking is calculated based on the click share within the x-ray fluorescence (xrf) analyzer page as of December 2024. Click share is defined as the total number of clicks for all companies during the period divided by the number of clicks for each company.Number of Employees
Newly Established Company
Company with a History
*Including some distributors, etc.
*Including some distributors, etc.
| Country | Number of Companies | Share (%) |
|---|---|---|
|
United States of America
|
6 | 40.0% |
|
Japan
|
6 | 40.0% |
|
China
|
1 | 6.7% |
|
Ukraine
|
1 | 6.7% |
|
Germany
|
1 | 6.7% |
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