Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter-PI 89 SEM PicoIndenter

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter-PI 85E SEM PicoIndenter

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter-PI 95 TEM PicoIndenter

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter-PI 80 SEM PicoIndenter

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter
Bruker Corporation

About This Product

■Electron microscope built-in systemBruker's electron microscope built-in nanoindentation system (Picoindenter) can be incorporated into an SEM/TEM to perform quantitative nanomechanical characterization of nanoindenters and other devices, while at the same time actually performing the It is possible to observe the resulting nanomechanical phenomena (fracture, peeling, crystal plane slipping, etc.) in-situ.

By recording SEM/TEM observation results in images and videos and comparing them in real time with the load-displacement curves obtained from nanomechanical property evaluation, we can expect to gain deeper insights and knowledge about nanomechanical phenomena. Masu. Bruker's Pico Denters are designed to be compatible with many manufacturers' SEMs and TEMs. We prepare the necessary throughput for connection to your SEM or TEM and set it up for easy connection.

System features
■Various tests including nanoindentation are possible in SEM/TEMChoose from a variety of measurement methods and modes to evaluate fundamental mechanical properties, stress-strain behavior, stiffness, fracture toughness, and deformation mechanisms on a wide variety of samples. Specifically, these include nanoindentation, nanoscratch, nanoDMA, compression test, and bending test. Equipped with a Push-to-Pull (PTP) device, it is possible to perform tensile tests on nanowires, etc., and also measure changes in electrical properties at the same time.

■Can be evaluated seamlessly with various analysis methods performed in SEM/TEM such as EBSDUsing Bruker's patented sample stage, it is possible to seamlessly evaluate hardness, elastic modulus, etc. with a pico denter, and then observe crystal orientation with EBSD. Deep insights can be obtained by combining multiple analysis methods.

■Japan's only tilt rotation stage that enables seamless evaluationBruker offers tilt-rotation stages that can be tilt-corrected and rotated. This stage is a technology patented by Bruker in Japan that allows methods such as EBSD and FIB to be performed seamlessly within the SEM chamber.

■Heating/cooling mechanism of maximum 1,000℃ and minimum -130℃This feature is ideal for characterizing materials in extreme environments. You can directly observe the behavior of material deformation during heating and cooling.

Model
There are 4 models available for this product.

Product
Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter

Handling Company
Bruker Corporation

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Transmission Electron Microscopes

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4 Models of Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter

Click on the part number for more information about each product

Image	Part Number	Price (excluding tax)
	PI 89 SEM PicoIndenter	Available upon quote
	PI 85E SEM PicoIndenter	Available upon quote
	PI 95 TEM PicoIndenter	Available upon quote
	PI 80 SEM PicoIndenter	Available upon quote

Click on the part number for more information about each product

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About Company Handling This Product

Bruker Corporation

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Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

United States of America

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Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter Bruker Corporation

About This Product

■Electron microscope built-in system

■Various tests including nanoindentation are possible in SEM/TEM

■Can be evaluated seamlessly with various analysis methods performed in SEM/TEM such as EBSD

■Japan's only tilt rotation stage that enables seamless evaluation

■Heating/cooling mechanism of maximum 1,000℃ and minimum -130℃

4 Models of Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter

PI 89 SEM PicoIndenter

PI 85E SEM PicoIndenter

PI 95 TEM PicoIndenter

PI 80 SEM PicoIndenter

Customers who viewed this product also viewed

Other products of Bruker Corporation

About Company Handling This Product

Related search keywords

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter
Bruker Corporation