3D view & analysis software MEX for scanning electron microscope
Solutions Systems Co., Ltd.
About This Product
■ Characteristics
・ Create a 3D surface stereos (Digital Elevation Map) from SEM with a deep depth or an optical camera stereo or three images.
・ Easy and accurate automatic processing using SmartWindow even on manual Youth tricks
・ Various analysis options (ISO4287 compliant surface roughness, surface area, volume measurement, 2D measurement)
・ Observe DEM images from a free perspective using a free AL3D app
・ Create 3D images without inclination from the reflective electronic sensor in four directions (StillCreator)
・ Create a 3D object with 3D Printer
・ Obtained surface 3D image of Frasta analysis
・ Evaluation report of 3 -way image (Auto Calibration)
■ Version -up function from MEX4.0 to 5.1
・ Create a 3D surface stereos (Digital Elevation Map) from SEM with a deep depth or an optical camera stereo or three images.
・ Menu, comments, and help (English and German can be selected)
・ Added loupe observation, pseudo -color mapping and coordinate data display function to each analysis function
・ Added dimension box outline to DEM image
・ Added details parameter display in profile analysis
・ Added 2D filter and selection mode for regional analysis
・ 3D editing option support (partial cut function of DEM image)
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Product
3D view & analysis software MEX for scanning electron microscope
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Handling Company
Solutions Systems Co., Ltd.
2 Models of 3D view & analysis software MEX for scanning electron microscope
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| Product Image | Part Number | Price (excluding tax) |
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Standard 32/64bit |
Available upon quote |
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Professional 32/64bit |
Available upon quote |
Click on the part number for more information about each product
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About Company Handling This Product
- Japan
- Since 1998