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Bruker Corporation's Scanning Probe Microscopes

Bruker Corporation

8 products found

Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series

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relatively fast response

100.0% Response Rate

34.0hours Response Time

■Dimension series Bruker's Dimension Icon® atomic force microscopy (AFM) system provides the highest performance, functionality, and productivity f...

8 models listed

Dimension Edge-Atomic force microscope (material AFM) large platform Dimension series
Dimension FastScan-Atomic force microscope (material AFM) large platform Dimension series
Dimension HPI-Atomic force microscope (material AFM) large platform Dimension series
Dimension Icon-Atomic force microscope (material AFM) large platform Dimension series
Dimension Pro-Atomic force microscope (material AFM) large platform Dimension series
Dimension XR Nano Mechanics-Atomic force microscope (material AFM) large platform Dimension series


Check the product list of Bruker Corporation

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