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Park Systems Japan Co., Ltd.'s Video Microscopes

Park Systems Japan Co., Ltd.

2 products found

Surface Inspection Metrology of Nanofilms (SIMON)-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Surface Inspection Metrology of Nanofilms (SIMON)

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Last viewed: 1 hour ago

SIMON is specially designed for regular measurement tasks in imaging ellipsometry. The simple user interface and robustness of the fixed-angle ell...


Live view overview Brewster angle microscope Accurion UltraBAM-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Live view overview Brewster angle microscope Accurion UltraBAM

540+ people viewing

Last viewed: 1 hour ago

The UltraBAM is a Brewster angle microscope designed for gas-liquid interface measurements. It can also be used on solid substrates such as glass a...



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