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Tokyo Instruments, Inc's Infrared Microscopes

Tokyo Instruments, Inc

3 products found

Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Strain inspection of silicon, sapphire, silicon carbide, zinc selenide, and cadmium sulfide Infrared birefringence phase difference measuring device Exicor PV-Si

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■Summary The birefringence phase difference measurement device Exicor® PV-Si measures the birefringence distribution of silicon, sapphire, silicon ...


Spectrometer / Spectrometer A microscope that achieves hyperspectral imaging with excellent resolution from visible to near-infrared light Hyperspectral microscope IMA-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Spectrometer / Spectrometer A microscope that achieves hyperspectral imaging with excellent resolution from visible to near-infrared light Hyperspectral microscope IMA

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■Product overview Photon etc's "Hyperspectral Microscope IMA™" provides high wavenumber and spatial resolution. The system is designed to rapidly s...


Added CL and PL measurement functions to STEM (scanning transmission electron microscope). Near-infrared light detection is also possible. CL/PL measurement system for STEM Monch-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Added CL and PL measurement functions to STEM (scanning transmission electron microscope). Near-infrared light detection is also possible. CL/PL measurement system for STEM Monch

140+ people viewing

Last viewed: 1 day ago

■Summary This product is a system that adds extended light focusing and light irradiation functions to a scanning transmission electron microscope ...



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