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Oxford Instruments Ltd.
1030+ people viewing
Last viewed: 20 hours ago
RISE is a revolutionary technology that combines confocal Raman microscopy and SEM. RISE can link structural and chemical composition information o...
Oxford Instruments Ltd.
2480+ people viewing
Last viewed: 1 day ago
■Summary The Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra-high resolution FEG-SEM applications, enabling solutions tha...