Park Systems Japan Co., Ltd.'s Atomic Force Microscopes
Park Systems Japan Co., Ltd.13 products found
Park Systems Japan Co., Ltd.
Park FX40 automated atomic force microscope equipped with next-generation new features
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Last viewed: 5 hours ago
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■Next-generation technology to accelerate research and development ・Adopts the first dual camera system in research AFM history ・Automatic optimi...
Park Systems Japan Co., Ltd.
Fully automatic industrial AFM Park NX-3DM for high-resolution 3D metrology
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Last viewed: 15 hours ago
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100.0% Response Rate
0.8hours Response Time
Park Systems introduces the innovative Park 3DM Series, a fully automated AFM system designed for overhang profiles, high-resolution sidewall imagi...
Park Systems Japan Co., Ltd.
AFM Park NX-HDM ideal for media and board manufacturing
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Last viewed: 1 hour ago
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Identifying nanoscale defects is a very time-consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force...
Park Systems Japan Co., Ltd.
Park NX-Hybrid WLI, the world's first hybrid semiconductor measurement device that combines atomic force microscope and white light interference technology
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Last viewed: 1 hour ago
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100.0% Response Rate
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Park NX-Hybrid WLI is the world's first AFM system with a built-in white light interferometer for measurement, quality assurance, front-end process...
Park Systems Japan Co., Ltd.
Nanoscale infrared spectrometer Park NX-IR for chemical analysis and materials imaging
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Last viewed: 3 hours ago
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The Park NX-IR is a combination of a nanoscale infrared (IR) spectrometer and an atomic force microscope (AFM) for chemical and materials character...
Park Systems Japan Co., Ltd.
EUV mask repair by AFM Park NX-Mask
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Last viewed: 1 hour ago
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Park NX-Mask is a new generation photomask repair system that supports the miniaturization of devices and the increasing complexity of photomasks. ...
Park Systems Japan Co., Ltd.
The only AFM for wafer fabs with automatic defect inspection function Park NX-Wafer
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Last viewed: 45 minutes ago
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100.0% Response Rate
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Park NX-Wafer is an industry-leading automated AFM measurement system for semiconductor and related fabrication. Enabling wafer fab inspection and...
Park Systems Japan Co., Ltd.
The most accurate and easy-to-use atomic force microscope (AFM) Park NX10
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Last viewed: 4 hours ago
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100.0% Response Rate
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Park NX10 provides reliable data at the highest nanoscale resolution. It can be easily operated at every stage, from sample setting to imaging, mea...
Park Systems Japan Co., Ltd.
Park NX12 is a versatile microscopy platform for analytical chemists and public facilities.
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Last viewed: 14 hours ago
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Park NX12 is a device that integrates the sample stage of an inverted optical microscope with Park Systems' highly versatile and highly accurate AF...
Park Systems Japan Co., Ltd.
Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.
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Last viewed: 3 hours ago
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As an FA engineer, you are expected to find results, but of course errors and mistakes caused by machines cannot be tolerated. The Park NX20 has ea...
Park Systems Japan Co., Ltd.
Automated nanometer measurement equipment for wafer measurement and analysis Park NX20 300mm
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Last viewed: 9 hours ago
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100.0% Response Rate
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The Park NX20 300mm is the industry's first atomic force microscope (AFM) for large samples that fully automates measurements of 300mm x 300mm. D...
Park Systems Japan Co., Ltd.
Significantly improve productivity with highly versatile AFM Park NX20 Lite
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Last viewed: 3 hours ago
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100.0% Response Rate
0.8hours Response Time
The Park NX20 Lite has many unique features that make it ideal for collaborative laboratories, multivariate analysis, and wafer failure analysis. I...
Park Systems Japan Co., Ltd.
The most economical research grade AFM Park NX7 with flexible sample handling
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Last viewed: 7 hours ago
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100.0% Response Rate
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Park NX7 is the most economical AFM, featuring Park Systems' cutting-edge technology and designed with the same attention to detail as its superior...
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