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Scanning electron microscope JSM-IT510HR InTouchScope™-JSM-IT510HR InTouchScope™ BU
Scanning electron microscope JSM-IT510HR InTouchScope™-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT510HR InTouchScope™
Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.3hours

Relatively Fast Response


About This Product

Simple SEM

■Simply select the field of view you want to photograph

Simple SEM supports daily routine work.

■Put the sample in and observe without hesitation

Safe and easy. Sample exchange navigation 1. Insert the sample according to the sample exchange navigation 2. Prepare for observation using vacuum evacuation time 3. Observation starts automatically After vacuum evacuation is complete, the focus and brightness are adjusted in the target field of view. Zeromag

■If you enlarge the optical image, you can see the SEM image.

Zeromag is a function that links holder graphics and optical images* with SEM images. This makes it easier to find the field of view when multiple samples are set in a holder or when observing a specific location. Live Analysis / Live Map

■Continuous elemental analysis even during observation

Live Analysis is a function that constantly displays characteristic X-ray spectra and elemental maps. You can search for the desired element while observing.

■Easy analysis function

Start your analysis in 3 clicks. Full of features

■Low vacuum hybrid secondary electron detector (LHSED)

JSM-IT510 can be equipped with a newly developed LHSED. By detecting the electrons and excitation light generated when secondary electrons collide with residual gas molecules, unevenness information can be obtained even in low vacuum.

■Live 3D

3D images are displayed live with the newly developed 4-segment backscattered electron detector. This allows you to visually recognize sample shapes where it is difficult to judge unevenness.

■Montage function

Automatically stitch multiple fields of view into a single image.

■Signal depth display

The signal depth display function is built into the SEM GUI and allows you to instantly know the analytical depth (approximate) of the sample being measured. Effective for elemental analysis.

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    Scanning electron microscope JSM-IT510HR InTouchScope™

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4 Models of Scanning electron microscope JSM-IT510HR InTouchScope™

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Electron gun Sample stage Observation monitor Display magnification Automatic function Image mode Image size Maximum sample size Operation support function Shooting assistance function Shooting magnification Exhaust system Objective lens aperture Resolution Incident voltage Low vacuum pressure setting range Report creation one-click report Data management OS EDS specifications Continuous analysis EDS specifications line analysis EDS specifications particle analysis software EDS specification detector EDS specifications Supported languages EDS specification report creation EDS specification control PC EDS specification element map EDS specification montage EDS specifications Spectral analysis EDS specifications SEM integration
Scanning electron microscope JSM-IT510HR InTouchScope™-Part Number-JSM-IT510HR InTouchScope™ BU

JSM-IT510HR InTouchScope™ BU

Available upon quote

W filament fully automatic gun alignment

Large eucentric type
X: 125 mm Y: 100 mm Z: 80 mm
Tilt: -10 ~ 90° Rotation: 360°

23.8 inch touch panel

×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm)

Filament adjustment, gun alignment adjustment
beam alignment
Focus / Astigmatism / Brightness / Contrast adjustment

Secondary electron image, REF image, composition image
Concave-convex image, 3D image, PD image

640 × 480 1,280 × 960
2,560 × 1,920 5,120 × 3,840

200mm diameter x 75mm height
200mm diameter x 80mm height
32mm diameter x 90mm height

Recipe (Standard recipe/Custom recipe)
Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.)
Sample exchange navigation
Signal depth display
3D measurement

Montage photography, Simple SEM
Zeromag, Live 3D

×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm)

Fully automatic TMP: 1 unit RP: 1 or 2 units

4 stages with XY fine adjustment function

High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV)
Low vacuum mode 4.0 nm (30 kV BED)

0.3 kV ~ 30 kV

10 ~ 650Pa

Output to Microsoft® Word
Output to Microsoft® PowerPoint

SMILE VIEW™ Lab

Microsoft® Windows®10 64bit

- - - - - - - - - - -
Scanning electron microscope JSM-IT510HR InTouchScope™-Part Number-JSM-IT510HR InTouchScope™ A

JSM-IT510HR InTouchScope™ A

Available upon quote

W filament fully automatic gun alignment

Large eucentric type
X: 125 mm Y: 100 mm Z: 80 mm
Tilt: -10 ~ 90° Rotation: 360°

23.8 inch touch panel

×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm)

Filament adjustment, gun alignment adjustment
beam alignment
Focus / Astigmatism / Brightness / Contrast adjustment

Secondary electron image, REF image, composition image
Concave-convex image, 3D image, PD image

640 × 480 1,280 × 960
2,560 × 1,920 5,120 × 3,840

200mm diameter x 75mm height
200mm diameter x 80mm height
32mm diameter x 90mm height

Recipe (Standard recipe/Custom recipe)
Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.)
Sample exchange navigation
Signal depth display
3D measurement

Montage photography, Simple SEM
Zeromag, Live 3D

×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm)

Fully automatic TMP: 1 unit RP: 1 or 2 units

4 stages with XY fine adjustment function

High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV)
Low vacuum mode 4.0 nm (30 kV BED)

0.3 kV ~ 30 kV

10 ~ 650Pa

Output to Microsoft® Word
Output to Microsoft® PowerPoint

SMILE VIEW™ Lab

Microsoft® Windows®10 64bit

Spectrum analysis/line analysis/element map
Bulk analysis of measured data (qualitative/quantitative)

Line analysis (horizontal, arbitrary direction)

Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function,
Graphical display of statistical processing of particle analysis data, wide area continuous particle analysis & EDS analysis, etc.

SDD type

Japanese / English / Chinese

SMILE VIEW™ Lab
Output to Microsoft®Word, Microsoft®PowerPoint

OS: Microsoft® Windows® 10 64bit

Element map (multicolor display, single color display, multicolor composite)
Maximum resolution 4,096×3,072
Real-time pop-up spectrum
Waveform separation map (net count map, quantitative value map), etc.

Automatic montage creation (SEM images, elemental maps)
Continuous elemental map spanning multiple fields of view

Qualitative analysis (peak identification, automatic qualitative)
Visual peak ID
Standard-less quantitative analysis (ZAF method)
Standard quantitative analysis (ZAF method)
PHI-RHO-Z (PRZ) Legal quantitative correction method, etc.

Centralized management of observation and analysis data
Specify the analysis position on the SEM operation screen (direct analysis from the SEM UI)
Graphical display of analysis position

Scanning electron microscope JSM-IT510HR InTouchScope™-Part Number-JSM-IT510HR InTouchScope™ LV

JSM-IT510HR InTouchScope™ LV

Available upon quote

W filament fully automatic gun alignment

Large eucentric type
X: 125 mm Y: 100 mm Z: 80 mm
Tilt: -10 ~ 90° Rotation: 360°

23.8 inch touch panel

×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm)

Filament adjustment, gun alignment adjustment
beam alignment
Focus / Astigmatism / Brightness / Contrast adjustment

Secondary electron image, REF image, composition image
Concave-convex image, 3D image, PD image

640 × 480 1,280 × 960
2,560 × 1,920 5,120 × 3,840

200mm diameter x 75mm height
200mm diameter x 80mm height
32mm diameter x 90mm height

Recipe (Standard recipe/Custom recipe)
Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.)
Sample exchange navigation
Signal depth display
3D measurement

Montage photography, Simple SEM
Zeromag, Live 3D

×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm)

Fully automatic TMP: 1 unit RP: 1 or 2 units

4 stages with XY fine adjustment function

High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV)
Low vacuum mode 4.0 nm (30 kV BED)

0.3 kV ~ 30 kV

10 ~ 650Pa

Output to Microsoft® Word
Output to Microsoft® PowerPoint

SMILE VIEW™ Lab

Microsoft® Windows®10 64bit

- - - - - - - - - - -
Scanning electron microscope JSM-IT510HR InTouchScope™-Part Number-JSM-IT510HR InTouchScope™ LA

JSM-IT510HR InTouchScope™ LA

Available upon quote

W filament fully automatic gun alignment

Large eucentric type
X: 125 mm Y: 100 mm Z: 80 mm
Tilt: -10 ~ 90° Rotation: 360°

23.8 inch touch panel

×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm)

Filament adjustment, gun alignment adjustment
beam alignment
Focus / Astigmatism / Brightness / Contrast adjustment

Secondary electron image, REF image, composition image
Concave-convex image, 3D image, PD image

640 × 480 1,280 × 960
2,560 × 1,920 5,120 × 3,840

200mm diameter x 75mm height
200mm diameter x 80mm height
32mm diameter x 90mm height

Recipe (Standard recipe/Custom recipe)
Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.)
Sample exchange navigation
Signal depth display
3D measurement

Montage photography, Simple SEM
Zeromag, Live 3D

×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm)

Fully automatic TMP: 1 unit RP: 1 or 2 units

4 stages with XY fine adjustment function

High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV)
Low vacuum mode 4.0 nm (30 kV BED)

0.3 kV ~ 30 kV

10 ~ 650Pa

Output to Microsoft® Word
Output to Microsoft® PowerPoint

SMILE VIEW™ Lab

Microsoft® Windows®10 64bit

Spectrum analysis/line analysis/element map
Bulk analysis of measured data (qualitative/quantitative)

Line analysis (horizontal, arbitrary direction)

Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function,
Graphical display of statistical processing of particle analysis data, wide area continuous particle analysis & EDS analysis, etc.

SDD type

Japanese / English / Chinese

SMILE VIEW™ Lab
Output to Microsoft®Word, Microsoft®PowerPoint

OS: Microsoft® Windows® 10 64bit

Element map (multicolor display, single color display, multicolor composite)
Maximum resolution 4,096×3,072
Real-time pop-up spectrum
Waveform separation map (net count map, quantitative value map), etc.

Automatic montage creation (SEM images, elemental maps)
Continuous elemental map spanning multiple fields of view

Qualitative analysis (peak identification, automatic qualitative)
Visual peak ID
Standard-less quantitative analysis (ZAF method)
Standard quantitative analysis (ZAF method)
PHI-RHO-Z (PRZ) Legal quantitative correction method, etc.

Centralized management of observation and analysis data
Specify the analysis position on the SEM operation screen (direct analysis from the SEM UI)
Graphical display of analysis position

Click on the part number for more information about each product

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.3hrs


Company Review

4.0
  • Japan

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