Scanning electron microscope JSM-IT510HR InTouchScope™
Cosmo Trading Co., Ltd.
About This Product
Simple SEM
■Simply select the field of view you want to photograph
Simple SEM supports daily routine work.
■Put the sample in and observe without hesitation
Safe and easy. Sample exchange navigation
1. Insert the sample according to the sample exchange navigation
2. Prepare for observation using vacuum evacuation time
3. Observation starts automatically
After vacuum evacuation is complete, the focus and brightness are adjusted in the target field of view.
Zeromag
■If you enlarge the optical image, you can see the SEM image.
Zeromag is a function that links holder graphics and optical images* with SEM images. This makes it easier to find the field of view when multiple samples are set in a holder or when observing a specific location.
Live Analysis / Live Map
■Continuous elemental analysis even during observation
Live Analysis is a function that constantly displays characteristic X-ray spectra and elemental maps. You can search for the desired element while observing.
■Easy analysis function
Start your analysis in 3 clicks.
Full of features
■Low vacuum hybrid secondary electron detector (LHSED)
JSM-IT510 can be equipped with a newly developed LHSED. By detecting the electrons and excitation light generated when secondary electrons collide with residual gas molecules, unevenness information can be obtained even in low vacuum.
■Live 3D
3D images are displayed live with the newly developed 4-segment backscattered electron detector. This allows you to visually recognize sample shapes where it is difficult to judge unevenness.
■Montage function
Automatically stitch multiple fields of view into a single image.
■Signal depth display
The signal depth display function is built into the SEM GUI and allows you to instantly know the analytical depth (approximate) of the sample being measured. Effective for elemental analysis.
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Product
Scanning electron microscope JSM-IT510HR InTouchScope™
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Handling Company
Cosmo Trading Co., Ltd.
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Categories
4 Models of Scanning electron microscope JSM-IT510HR InTouchScope™
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | Automatic function | Data management | Display magnification | EDS specification control PC | EDS specification detector | EDS specification element map | EDS specification montage | EDS specification report creation | EDS specifications Continuous analysis | EDS specifications SEM integration | EDS specifications Spectral analysis | EDS specifications Supported languages | EDS specifications line analysis | EDS specifications particle analysis software | Electron gun | Exhaust system | Image mode | Image size | Incident voltage | Low vacuum pressure setting range | Maximum sample size | OS | Objective lens aperture | Observation monitor | Operation support function | Report creation one-click report | Resolution | Sample stage | Shooting assistance function | Shooting magnification |
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JSM-IT510HR InTouchScope™ BU |
Available upon quote |
Filament adjustment, gun alignment adjustment beam alignment Focus / Astigmatism / Brightness / Contrast adjustment |
SMILE VIEW™ Lab | ×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) | - | - | - | - | - | - | - | - | - | - | - | W filament fully automatic gun alignment | Fully automatic TMP: 1 unit RP: 1 or 2 units |
Secondary electron image, REF image, composition image Concave-convex image, 3D image, PD image |
640 × 480 1,280 × 960 2,560 × 1,920 5,120 × 3,840 |
0.3 kV ~ 30 kV | 10 ~ 650Pa |
200mm diameter x 75mm height 200mm diameter x 80mm height 32mm diameter x 90mm height |
Microsoft® Windows®10 64bit | 4 stages with XY fine adjustment function | 23.8 inch touch panel |
Recipe (Standard recipe/Custom recipe) Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.) Sample exchange navigation Signal depth display 3D measurement |
Output to Microsoft® Word Output to Microsoft® PowerPoint |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) Low vacuum mode 4.0 nm (30 kV BED) |
Large eucentric type X: 125 mm Y: 100 mm Z: 80 mm Tilt: -10 ~ 90° Rotation: 360° |
Montage photography, Simple SEM Zeromag, Live 3D |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
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JSM-IT510HR InTouchScope™ A |
Available upon quote |
Filament adjustment, gun alignment adjustment beam alignment Focus / Astigmatism / Brightness / Contrast adjustment |
SMILE VIEW™ Lab | ×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) | OS: Microsoft® Windows® 10 64bit | SDD type |
Element map (multicolor display, single color display, multicolor composite) Maximum resolution 4,096×3,072 Real-time pop-up spectrum Waveform separation map (net count map, quantitative value map), etc. |
Automatic montage creation (SEM images, elemental maps) Continuous elemental map spanning multiple fields of view |
SMILE VIEW™ Lab Output to Microsoft®Word, Microsoft®PowerPoint |
Spectrum analysis/line analysis/element map Bulk analysis of measured data (qualitative/quantitative) |
Centralized management of observation and analysis data Specify the analysis position on the SEM operation screen (direct analysis from the SEM UI) Graphical display of analysis position |
Qualitative analysis (peak identification, automatic qualitative) Visual peak ID Standard-less quantitative analysis (ZAF method) Standard quantitative analysis (ZAF method) PHI-RHO-Z (PRZ) Legal quantitative correction method, etc. |
Japanese / English / Chinese | Line analysis (horizontal, arbitrary direction) |
Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function, Graphical display of statistical processing of particle analysis data, wide area continuous particle analysis & EDS analysis, etc. |
W filament fully automatic gun alignment | Fully automatic TMP: 1 unit RP: 1 or 2 units |
Secondary electron image, REF image, composition image Concave-convex image, 3D image, PD image |
640 × 480 1,280 × 960 2,560 × 1,920 5,120 × 3,840 |
0.3 kV ~ 30 kV | 10 ~ 650Pa |
200mm diameter x 75mm height 200mm diameter x 80mm height 32mm diameter x 90mm height |
Microsoft® Windows®10 64bit | 4 stages with XY fine adjustment function | 23.8 inch touch panel |
Recipe (Standard recipe/Custom recipe) Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.) Sample exchange navigation Signal depth display 3D measurement |
Output to Microsoft® Word Output to Microsoft® PowerPoint |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) Low vacuum mode 4.0 nm (30 kV BED) |
Large eucentric type X: 125 mm Y: 100 mm Z: 80 mm Tilt: -10 ~ 90° Rotation: 360° |
Montage photography, Simple SEM Zeromag, Live 3D |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
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JSM-IT510HR InTouchScope™ LV |
Available upon quote |
Filament adjustment, gun alignment adjustment beam alignment Focus / Astigmatism / Brightness / Contrast adjustment |
SMILE VIEW™ Lab | ×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) | - | - | - | - | - | - | - | - | - | - | - | W filament fully automatic gun alignment | Fully automatic TMP: 1 unit RP: 1 or 2 units |
Secondary electron image, REF image, composition image Concave-convex image, 3D image, PD image |
640 × 480 1,280 × 960 2,560 × 1,920 5,120 × 3,840 |
0.3 kV ~ 30 kV | 10 ~ 650Pa |
200mm diameter x 75mm height 200mm diameter x 80mm height 32mm diameter x 90mm height |
Microsoft® Windows®10 64bit | 4 stages with XY fine adjustment function | 23.8 inch touch panel |
Recipe (Standard recipe/Custom recipe) Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.) Sample exchange navigation Signal depth display 3D measurement |
Output to Microsoft® Word Output to Microsoft® PowerPoint |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) Low vacuum mode 4.0 nm (30 kV BED) |
Large eucentric type X: 125 mm Y: 100 mm Z: 80 mm Tilt: -10 ~ 90° Rotation: 360° |
Montage photography, Simple SEM Zeromag, Live 3D |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
|
|
JSM-IT510HR InTouchScope™ LA |
Available upon quote |
Filament adjustment, gun alignment adjustment beam alignment Focus / Astigmatism / Brightness / Contrast adjustment |
SMILE VIEW™ Lab | ×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) | OS: Microsoft® Windows® 10 64bit | SDD type |
Element map (multicolor display, single color display, multicolor composite) Maximum resolution 4,096×3,072 Real-time pop-up spectrum Waveform separation map (net count map, quantitative value map), etc. |
Automatic montage creation (SEM images, elemental maps) Continuous elemental map spanning multiple fields of view |
SMILE VIEW™ Lab Output to Microsoft®Word, Microsoft®PowerPoint |
Spectrum analysis/line analysis/element map Bulk analysis of measured data (qualitative/quantitative) |
Centralized management of observation and analysis data Specify the analysis position on the SEM operation screen (direct analysis from the SEM UI) Graphical display of analysis position |
Qualitative analysis (peak identification, automatic qualitative) Visual peak ID Standard-less quantitative analysis (ZAF method) Standard quantitative analysis (ZAF method) PHI-RHO-Z (PRZ) Legal quantitative correction method, etc. |
Japanese / English / Chinese | Line analysis (horizontal, arbitrary direction) |
Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function, Graphical display of statistical processing of particle analysis data, wide area continuous particle analysis & EDS analysis, etc. |
W filament fully automatic gun alignment | Fully automatic TMP: 1 unit RP: 1 or 2 units |
Secondary electron image, REF image, composition image Concave-convex image, 3D image, PD image |
640 × 480 1,280 × 960 2,560 × 1,920 5,120 × 3,840 |
0.3 kV ~ 30 kV | 10 ~ 650Pa |
200mm diameter x 75mm height 200mm diameter x 80mm height 32mm diameter x 90mm height |
Microsoft® Windows®10 64bit | 4 stages with XY fine adjustment function | 23.8 inch touch panel |
Recipe (Standard recipe/Custom recipe) Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.) Sample exchange navigation Signal depth display 3D measurement |
Output to Microsoft® Word Output to Microsoft® PowerPoint |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) Low vacuum mode 4.0 nm (30 kV BED) |
Large eucentric type X: 125 mm Y: 100 mm Z: 80 mm Tilt: -10 ~ 90° Rotation: 360° |
Montage photography, Simple SEM Zeromag, Live 3D |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
Click on the part number for more information about each product
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About Company Handling This Product
- Japan