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Scanning electron microscope JSM-IT510HR InTouchScope™Handling Company
Cosmo Trading Co., Ltd.Categories
Click on the part number for more information about each product
Image | Part Number | Price (excluding tax) | Electron gun | Sample stage | Observation monitor | Display magnification | Automatic function | Image mode | Image size | Maximum sample size | Operation support function | Shooting assistance function | Shooting magnification | Exhaust system | Objective lens aperture | Resolution | Incident voltage | Low vacuum pressure setting range | Report creation one-click report | Data management | OS | EDS specifications Continuous analysis | EDS specifications line analysis | EDS specifications particle analysis software | EDS specification detector | EDS specifications Supported languages | EDS specification report creation | EDS specification control PC | EDS specification element map | EDS specification montage | EDS specifications Spectral analysis | EDS specifications SEM integration |
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JSM-IT510HR InTouchScope™ BU |
Available upon quote |
W filament fully automatic gun alignment |
Large eucentric type |
23.8 inch touch panel |
×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) |
Filament adjustment, gun alignment adjustment |
Secondary electron image, REF image, composition image |
640 × 480 1,280 × 960 |
200mm diameter x 75mm height |
Recipe (Standard recipe/Custom recipe) |
Montage photography, Simple SEM |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
Fully automatic TMP: 1 unit RP: 1 or 2 units |
4 stages with XY fine adjustment function |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) |
0.3 kV ~ 30 kV |
10 ~ 650Pa |
Output to Microsoft® Word |
SMILE VIEW™ Lab |
Microsoft® Windows®10 64bit |
- | - | - | - | - | - | - | - | - | - | - |
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JSM-IT510HR InTouchScope™ A |
Available upon quote |
W filament fully automatic gun alignment |
Large eucentric type |
23.8 inch touch panel |
×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) |
Filament adjustment, gun alignment adjustment |
Secondary electron image, REF image, composition image |
640 × 480 1,280 × 960 |
200mm diameter x 75mm height |
Recipe (Standard recipe/Custom recipe) |
Montage photography, Simple SEM |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
Fully automatic TMP: 1 unit RP: 1 or 2 units |
4 stages with XY fine adjustment function |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) |
0.3 kV ~ 30 kV |
10 ~ 650Pa |
Output to Microsoft® Word |
SMILE VIEW™ Lab |
Microsoft® Windows®10 64bit |
Spectrum analysis/line analysis/element map |
Line analysis (horizontal, arbitrary direction) |
Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function, |
SDD type |
Japanese / English / Chinese |
SMILE VIEW™ Lab |
OS: Microsoft® Windows® 10 64bit |
Element map (multicolor display, single color display, multicolor composite) |
Automatic montage creation (SEM images, elemental maps) |
Qualitative analysis (peak identification, automatic qualitative) |
Centralized management of observation and analysis data |
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JSM-IT510HR InTouchScope™ LV |
Available upon quote |
W filament fully automatic gun alignment |
Large eucentric type |
23.8 inch touch panel |
×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) |
Filament adjustment, gun alignment adjustment |
Secondary electron image, REF image, composition image |
640 × 480 1,280 × 960 |
200mm diameter x 75mm height |
Recipe (Standard recipe/Custom recipe) |
Montage photography, Simple SEM |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
Fully automatic TMP: 1 unit RP: 1 or 2 units |
4 stages with XY fine adjustment function |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) |
0.3 kV ~ 30 kV |
10 ~ 650Pa |
Output to Microsoft® Word |
SMILE VIEW™ Lab |
Microsoft® Windows®10 64bit |
- | - | - | - | - | - | - | - | - | - | - |
![]() |
JSM-IT510HR InTouchScope™ LA |
Available upon quote |
W filament fully automatic gun alignment |
Large eucentric type |
23.8 inch touch panel |
×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) |
Filament adjustment, gun alignment adjustment |
Secondary electron image, REF image, composition image |
640 × 480 1,280 × 960 |
200mm diameter x 75mm height |
Recipe (Standard recipe/Custom recipe) |
Montage photography, Simple SEM |
×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm) |
Fully automatic TMP: 1 unit RP: 1 or 2 units |
4 stages with XY fine adjustment function |
High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) |
0.3 kV ~ 30 kV |
10 ~ 650Pa |
Output to Microsoft® Word |
SMILE VIEW™ Lab |
Microsoft® Windows®10 64bit |
Spectrum analysis/line analysis/element map |
Line analysis (horizontal, arbitrary direction) |
Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function, |
SDD type |
Japanese / English / Chinese |
SMILE VIEW™ Lab |
OS: Microsoft® Windows® 10 64bit |
Element map (multicolor display, single color display, multicolor composite) |
Automatic montage creation (SEM images, elemental maps) |
Qualitative analysis (peak identification, automatic qualitative) |
Centralized management of observation and analysis data |
Click on the part number for more information about each product
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