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  4. Scanning electron microscope JSM-IT700HR InTouchScope™ (Cosmo Trading Co., Ltd.)
Scanning electron microscope JSM-IT700HR InTouchScope™-JSM-IT700HR InTouchScope™
Scanning electron microscope JSM-IT700HR InTouchScope™-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT700HR InTouchScope™
Cosmo Trading Co., Ltd.

About This Product

■SEM used every day. So it's easy to use.

Observation objects are becoming smaller day by day as technology advances. The JSM-IT700HR was born from the need to routinely measure such increasingly finer samples. The electron gun has a maximum resolution of 1 nm and a maximum irradiation current of 300 nA, giving you ample time for observation and analysis. Furthermore, the user interface focuses on simple operation, and the compact design yet large sample chamber allows anyone to perform measurements freely. “Looks easy” rather than “looks”. So, JSM-IT700HR. Zeromag & Autofunctions

■If you enlarge the optical image, it becomes a SEM image.

Zeromag is a function that links holder graphics and optical images* with SEM images. This makes it easier to find the field of view when multiple samples are set in a holder or when observing a specific location. *Optional stage navigation system (SNS) is required to display the optical image. Integrated EDS & Live Analysis

■Observation and analysis integrated

EDS analysis operations can be performed within the SEM operation screen, so there is no barrier between observation and analysis. Live Analysis is a function that always displays the characteristic X-ray spectrum. SMILE VIEW™ Lab

■Easily create a report after measurement

JEOL's unique data management tool. Optical images, SEM images, EDS analysis results, etc. are linked and saved. You can also create a report after measurement with just one click. By using offline analysis software*1 on a PC separate from the equipment, you can increase the equipment's operating rate. *1 Offline data analysis software (optional) is required.

■Signal depth display

The newly developed signal depth display function is incorporated into the SEM GUI, allowing you to instantly know the analytical depth (approximate) of the sample being measured. Effective for elemental analysis.

■Auto beam alignment (ABA)

This function allows automatic adjustment when the electron beam axis (beam alignment) is misaligned.

  • Product

    Scanning electron microscope JSM-IT700HR InTouchScope™

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1 Models of Scanning electron microscope JSM-IT700HR InTouchScope™

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Scanning electron microscope JSM-IT700HR InTouchScope™-Part Number-JSM-IT700HR InTouchScope™

JSM-IT700HR InTouchScope™

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Cosmo Trading Co., Ltd.

  • Japan

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