Schottky field emission scanning electron microscope JSM-IT800 series-JSM-IT800 HL version

Schottky field emission scanning electron microscope JSM-IT800 series
Cosmo Trading Co., Ltd.

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About This Product

The JSM-IT800 is equipped with an "in-lens Schottky Plus field emission electron gun" to achieve high-resolution observation, a next-generation electro-optical control system "Neo Engine", and an easy-to-use system to realize high-speed elemental mapping. Our common platform is a system that incorporates our own EDS into the GUI "SEM Center" that pursues

By replacing the SEM objective lens with a module, we can provide equipment that meets the various needs of our customers.

The JSM-IT800 has two versions: a hybrid lens version (HL), which is a general-purpose FE-SEM, and a super hybrid lens version (SHL/SHLs), which enables higher resolution observation and analysis, depending on the objective lens. ), a semi-in-lens version (I/IS, 2 versions depending on function), which is good at observing semiconductor samples, and 5 versions are available.

Additionally, the JSM-IT800 can be equipped with new backscattered electron detectors, the scintillator backscattered electron detector (SBED) and the multipurpose backscattered electron detector (VBED). SBED allows the acquisition of material contrast images with good response and low accelerating voltage. VBED can obtain 3D, unevenness, and material contrast images, so you can expect to obtain information that was previously unavailable and improve measurement problems.

In-lens Schottky Plus Field Emission Electron Gun (FEG)
High brightness has been achieved by combining an electron gun and a low aberration condenser lens. Sufficient irradiation current can be obtained even at low accelerating voltage (100nA@5kV), allowing you to perform everything from high-resolution observation to high-speed elemental mapping, EBSD analysis, and soft X-ray analysis without changing objective lenses.

■Neo Engine (New Electron Optical Engine)Equipped with a next-generation electro-optical control system that brings together the best of JEOL's electro-optic technology. Stable observation is possible even when conditions change. We have also achieved significant improvements in usability, including automatic functions.

Model
There are 5 models available for this product.

Product
Schottky field emission scanning electron microscope JSM-IT800 series

Handling Company
Cosmo Trading Co., Ltd.

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Observation Equipment

Electron Microscopes

Observation Equipment

Scanning Electron Microscopes (SEM)

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5 Models of Schottky field emission scanning electron microscope JSM-IT800 series

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Part Number	Price (excluding tax)	Electron gun	Aperture Optimized Lens (ACL)	Sample stage	Sample size	Standard detector	Objective lens	Resolution	Analysis function (optional)	Incident voltage	Magnification	Low vacuum mode (optional)	Main uses (examples)	Motor control	Probe current	Emitter warranty period
JSM-IT800 HL version	Available upon quote	In-lens Schottky Plus field emission electron gun	Built-in	Full eucentric goniometer stage	Sample stage Type1 (Maximum diameter: 170 mm Maximum height: 45 mm (WD 5 mm)) Stage movement range (X:70mm Y:50mm Z:1~41mm Tilt: -5~70° Rotation: 360°)	Secondary electron detector (SED) Upper electron detector (UED)	Hybrid lens	0.7nm (20kV) 1.3nm (1kV) 3.0nm (15kV, 5nA, WD 10mm)	EDS WDS EBSD C.L.	0.01~30kV	Photo magnification ×10 ~ 2,000,000 (When displayed at 128 × 96 mm) Display magnification × 27 ~ 5,480,000 (When displaying 1,280 × 960 pixels)	Possible	Magnetic material, wide area EBSD	5 axis motor control	Several pA ~300nA (30kV) Several pA ~100nA (5kV)	3 years
JSM-IT800 is version	Available upon quote	In-lens Schottky Plus field emission electron gun	Built-in	Full eucentric goniometer stage	Sample stage Type1 (Maximum diameter: 170 mm Maximum height: 45 mm (WD 5 mm)) Stage movement range (X:70mm Y:50mm Z:1~41mm Tilt: -5~70° Rotation: 360°)	Secondary electron detector (SED) Upper In-Lens Detector (UID)	Semi-in lens	0.6nm (15kV) 1.0nm (1kV) 3.0nm (15kV, 5nA, WD 8mm)	EDS WDS EBSD C.L.	0.01~30kV	Photo magnification ×25 ~ 2,000,000 (When displayed at 128 × 96 mm) Display magnification × 69 ~ 5,480,000 (When displaying 1,280 × 960 pixels)	Possible	Semiconductor device analysis	5 axis motor control	Several pA ~300nA (30kV) Several pA ~100nA (5kV)	3 years
JSM-IT800 i version	Available upon quote	In-lens Schottky Plus field emission electron gun	Built-in	Full eucentric goniometer stage	Sample stage Type1 (Maximum diameter: 170 mm Maximum height: 45 mm (WD 5 mm)) Stage movement range (X:70mm Y:50mm Z:1~41mm Tilt: -5~70° Rotation: 360°)	Secondary electron detector (SED) Upper In-Lens Detector (UID) Upper electron detector (UED)	Semi-in lens	0.5nm (15kV) 0.7nm (1kV) 3.0nm (15kV, 5nA, WD 8mm)	EDS WDS EBSD C.L.	0.01~30kV	Photo magnification ×25 ~ 2,000,000 (When displayed at 128 × 96 mm) Display magnification × 69 ~ 5,480,000 (When displaying 1,280 × 960 pixels)	Possible	Semiconductor device analysis	5 axis motor control	Several pA ~500nA (30kV) Several pA ~100nA (5kV)	3 years
JSM-IT800 SHLs version	Available upon quote	In-lens Schottky Plus field emission electron gun	Built-in	Full eucentric goniometer stage	Sample stage Type1 (Maximum diameter: 170 mm Maximum height: 45 mm (WD 5 mm)) Stage movement range (X:70mm Y:50mm Z:1~41mm Tilt: -5~70° Rotation: 360°)	Secondary electron detector (SED) Upper hybrid detector (UHD)	Super hybrid lens	0.6nm (15kV) 1.1nm (1kV) 3.0nm (15kV, 5nA, WD 10mm)	EDS WDS EBSD C.L.	0.01~30kV	Photo magnification ×10 ~ 2,000,000 (When displayed at 128 × 96 mm) Display magnification × 27 ~ 5,480,000 (When displaying 1,280 × 960 pixels)	Possible	Magnetic materials, EBSD, biology (array tomography, CLEM)	5 axis motor control	Several pA ~500nA (30kV) Several pA ~100nA (5kV)	3 years
JSM-IT800 SHL version	Available upon quote	In-lens Schottky Plus field emission electron gun	Built-in	Full eucentric goniometer stage	Sample stage Type1 (Maximum diameter: 170 mm Maximum height: 45 mm (WD 5 mm)) Stage movement range (X:70mm Y:50mm Z:1~41mm Tilt: -5~70° Rotation: 360°)	Secondary electron detector (SED) Upper hybrid detector (UHD)	Super hybrid lens	0.5nm (15kV) 0.7nm (1kV) 0.9nm (500V) 3.0nm (15kV, 5nA, WD 10mm)	EDS WDS EBSD C.L.	0.01~30kV	Photo magnification ×10 ~ 2,000,000 (When displayed at 128 × 96 mm) Display magnification × 27 ~ 5,480,000 (When displaying 1,280 × 960 pixels)	Possible	Magnetic materials, EBSD, biology (array tomography, CLEM)	5 axis motor control	Several pA ~500nA (30kV) Several pA ~100nA (5kV)	3 years

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About Company Handling This Product

Cosmo Trading Co., Ltd.

Response Rate

100.0%

Response Time

24.3hrs

Company Review

4.0

Japan

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Schottky field emission scanning electron microscope JSM-IT800 series Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

About This Product

■Neo Engine (New Electron Optical Engine)

5 Models of Schottky field emission scanning electron microscope JSM-IT800 series

JSM-IT800 HL version

JSM-IT800 is version

JSM-IT800 i version

JSM-IT800 SHLs version

JSM-IT800 SHL version

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Other products of Cosmo Trading Co., Ltd.

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Schottky field emission scanning electron microscope JSM-IT800 series
Cosmo Trading Co., Ltd.