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  4. Scanning electron microscope JSM-IT210 (Cosmo Trading Co., Ltd.)
Scanning electron microscope JSM-IT210-JSM-IT210
Scanning electron microscope JSM-IT210-Cosmo Trading Co., Ltd.

Scanning electron microscope JSM-IT210
Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.3hours

Company Review

4.0

Relatively Fast Response

About This Product

■Easy access to the data you need

JSM-IT210 is JEOL's most compact stationary scanning electron microscope. The newly developed stage has all 5 axes of movement driven by motors, making it safer and faster to use. Furthermore, the newly installed "Simple SEM" automatically acquires observation and analysis just by selecting the field of view. JSM-IT210 is a new generation SEM that is compact and capable of unmanned operation.

■Put the sample in and observe without hesitation "Sample exchange navigation"

1. Insert the sample according to the sample exchange navigation 2. Prepare for observation using vacuum evacuation time 3. Observation starts automatically

■If you enlarge the optical image, you can create a SEM image "Zeromag"

Zeromag is a function that links holder graphics and optical images* with SEM images. This makes it easier to find the field of view when multiple samples are set in a holder or when observing a specific location.

■Constant elemental analysis even during observation* "Live Analysis"

Live Analysis is a function that constantly displays characteristic X-ray spectra and elemental maps. You can search for the desired element while observing.

■Various automatic measurements "Simple SEM"

Simple SEM is a function that allows you to easily shoot automatically by simply setting the field of view you want to observe.

■Functions that strongly support automatic measurement

Achieves automatic measurement with a stage with high positional accuracy. The JSM-IT210 with improved stage accuracy has become more practical for continuous and automatic measurement at targeted analysis positions across multiple fields of view. Equipped with 60mm2 large diameter EDS as standard for faster analysis

■Analysis is fast

Spectra of the same quality as conventional EDS can be obtained in a short time. Multi-point analysis can also be performed efficiently.

■Safe even for heat-sensitive samples

Traditional EDS requires large currents for analysis. Depending on the sample, deformation due to thermal damage could affect the elemental map. With 60mm2 EDS, it is possible to obtain elemental maps by lowering the amount of irradiation current. This allows analysis to be performed with less heat damage.

■Clear elemental map even in a short time

A sufficiently clear elemental map can be obtained even with a measurement time of 1 minute.

  • Product

    Scanning electron microscope JSM-IT210

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1 Models of Scanning electron microscope JSM-IT210

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Scanning electron microscope JSM-IT210-Part Number-JSM-IT210

JSM-IT210

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About Company Handling This Product

Cosmo Trading Co., Ltd.

Response Rate

100.0%

Response Time

24.3hrs

Company Review

4.0
  • Japan

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