Scanning electron microscope JSM-IT210
Cosmo Trading Co., Ltd.
About This Product
■Easy access to the data you need
JSM-IT210 is JEOL's most compact stationary scanning electron microscope. The newly developed stage has all 5 axes of movement driven by motors, making it safer and faster to use. Furthermore, the newly installed "Simple SEM" automatically acquires observation and analysis just by selecting the field of view. JSM-IT210 is a new generation SEM that is compact and capable of unmanned operation.
■Put the sample in and observe without hesitation "Sample exchange navigation"
1. Insert the sample according to the sample exchange navigation
2. Prepare for observation using vacuum evacuation time
3. Observation starts automatically
■If you enlarge the optical image, you can create a SEM image "Zeromag"
Zeromag is a function that links holder graphics and optical images* with SEM images. This makes it easier to find the field of view when multiple samples are set in a holder or when observing a specific location.
■Constant elemental analysis even during observation* "Live Analysis"
Live Analysis is a function that constantly displays characteristic X-ray spectra and elemental maps. You can search for the desired element while observing.
■Various automatic measurements "Simple SEM"
Simple SEM is a function that allows you to easily shoot automatically by simply setting the field of view you want to observe.
■Functions that strongly support automatic measurement
Achieves automatic measurement with a stage with high positional accuracy. The JSM-IT210 with improved stage accuracy has become more practical for continuous and automatic measurement at targeted analysis positions across multiple fields of view.
Equipped with 60mm2 large diameter EDS as standard for faster analysis
■Analysis is fast
Spectra of the same quality as conventional EDS can be obtained in a short time. Multi-point analysis can also be performed efficiently.
■Safe even for heat-sensitive samples
Traditional EDS requires large currents for analysis. Depending on the sample, deformation due to thermal damage could affect the elemental map. With 60mm2 EDS, it is possible to obtain elemental maps by lowering the amount of irradiation current. This allows analysis to be performed with less heat damage.
■Clear elemental map even in a short time
A sufficiently clear elemental map can be obtained even with a measurement time of 1 minute.
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Product
Scanning electron microscope JSM-IT210
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Handling Company
Cosmo Trading Co., Ltd.
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Categories
1 Models of Scanning electron microscope JSM-IT210
| Product Image | Part Number | Price (excluding tax) |
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JSM-IT210 |
Available upon quote |
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About Company Handling This Product
- Japan