Scanning electron microscope JSM-IT710HR
Cosmo Trading Co., Ltd.
About This Product
Nowadays, not only resolution and analysis performance on the nanometer order, but also throughput when acquiring data is important, so the newly created JSM-IT710HR is designed to make it easy for anyone to take high-resolution images. This is the 4th generation model of JEOL's HR* series, which has the theme of ``Serious SEM.'' It is a device that will make you want to explore even more beyond what you can see, thanks to improved observation performance that combines operability with expanded automatic functions and a new detector system.
■I can see it, so I want to pursue it.
・SEM image can be seen in conjunction with optical image
・High-resolution electron gun provides clear visibility
Automatic measurement function: Simple SEM/EDS
■Simple SEM
Simple SEM is a function that allows automatic measurement by registering multiple conditions at once. This instantly improves the efficiency of routine work.
■Build a 3D image on the spot: Live 3D
By using an out-lens type objective lens. It is possible to take pictures with little image distortion even at low magnification.
■New low vacuum secondary electron detector LHSED
The newly developed LHSED can obtain clear unevenness information and luminescence information under low vacuum conditions.
■Features of LHSED
・Improvement of live image quality of low-vacuum secondary electron images
・Obtain light emission information
・Can change unevenness/luminescence information
■Strengthening the stability of the Schottky FE electron gun by more than 4 times compared to previous models
・Automatic beam adjustment. JSM-IT710HR can automatically adjust everything from axis alignment to astigmatism and focus without relying on complicated manual adjustments.
・Secondary electron detection system
・Achieves both high resolution and large current. The Schottky field emission electron gun used in the JSM-IT710HR integrates a condenser lens and an electron gun, allowing the use of large currents while suppressing beam diameter expansion, enabling high-resolution observation and analysis. is.
・Backscattered electron detection system. The new multi-segment backscattered electron detector can acquire backscattered electron images from four directions at once, create a simple three-dimensional reconstructed image, and display it as a live image.
■All analyzes start from "Zeromag"
Zeromag's optical image increases field-finding throughput. SEM images can be linked to optical images, making it easy to observe, analyze, and automate measurements.
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Product
Scanning electron microscope JSM-IT710HR
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Handling Company
Cosmo Trading Co., Ltd.
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Categories
1 Models of Scanning electron microscope JSM-IT710HR
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JSM-IT710HR |
Available upon quote |
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About Company Handling This Product
- Japan