Tabletop scanning electron microscope Phenom series-Phenom ProX

Tabletop scanning electron microscope Phenom series
Oki Riko Jizai Co., Ltd.

Oki Riko Jizai Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

21.5hours

Relatively Fast Response

About This Product

■SummaryHigh-quality SEM image observation and advanced image analysis are possible. Easy to understand and operate even for SEM beginners. Confirm the SEM observation position while viewing the entire sample with the navigation camera.

Features
■Make CeB6 more beautifulAdopts a high-brightness, long-life CeB6 electron gun that enables high-resolution observation. You can experience the overwhelming beauty on a large full screen.

■Backscattered electron imageIt is possible to observe clear backscattered electron images at high magnification. Even non-conductive samples that are easily charged can be observed with high image quality without coating.

■Secondary electron image (optional)A high-sensitivity secondary electron detector is used, making it possible to observe high-definition secondary electron images at high magnification. It is also possible to capture submicron particles and the fine structure of material surfaces.

■Uses a CeB6 electron gun with high brightness and long life.This is the only tabletop SEM that uses a CeB6 (cerium hexaboride) electron gun that enables high-quality observation.

■Beautiful everywhere No image is disturbed even if there is vibrationSince the sample holder is fixed to the lens barrel of the lens system including the electron gun, the SEM image will not be disturbed even if there is vibration. A vibration isolation table is not required even in locations where there is vibration, such as in high-rise buildings, along highways, or along factory lines. Delivers maximum performance in any location.

Freely set observation conditions
■Observation conditions such as accelerating voltage and current value can be set according to the sample and observation purpose.・Acceleration voltage: 5 kV, 10 kV, 15 kV (Advanced: 4.8 to 20.5 kV)
・Spot size: 4 levels (Advanced: Custom settings)
・Low emission current mode

■Mix backscattered electron image + secondary electron imageYou can simultaneously observe the "composition information" and "fine irregularities on the surface" of the sample. Switching between backscattered electron image, secondary electron image, and mix image is possible with one click.

■Innovative user interface makes it faster and smarterThe user interface has been redesigned. Display the SEM image in just 30 seconds after introducing the sample, and proceed directly to barrier-free analysis.

■Don't get lost with the navigation systemYou can always check your observation position and never get lost.

■“Move instantly” with automatic stageYou can move to the next observation position with just one click on the screen.

■Revisit function allows you to return immediatelyYou can register places of interest, go back, re-observe, and re-analyze.

Model
There are 1 models for this product.

Product
Tabletop scanning electron microscope Phenom series

Handling Company
Oki Riko Jizai Co., Ltd.

Categories

Observation Equipment

Electron Microscopes

Observation Equipment

Transmission Electron Microscopes

140+ people viewing

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1 Models of Tabletop scanning electron microscope Phenom series

Image	Part Number	Price (excluding tax)	Microscope body	Power box	Power supply	Electron microscope magnification	Electron gun	Sample size	Analysis software standard	Analysis software options	Automatic stage	Vacuum pump	Image storage format	Backscattered electron detector	Backscattered electron	Optical navigation magnification	Secondary electron detector	Secondary electron (optional)	Monitor	Manufacturer	Digital zoom	PC	EDS elemental analysis
	Phenom ProX	Available upon quote	286 (W) × 566 (D) × 495 (H) mm, 50 kg	260 (W) × 300 (D) × 80 (H) mm, 2 kg	Single phase AC 100 V, 50/60 Hz, max. 348 W	160 ~ 350,000 times	CeB6 electron gun	Diameter: 25 mm (optional: 32 mm) Height: 35 mm (optional: 100 mm)	Automatic image mapping	Particle metric software (particle analysis, pore analysis) Fibermetric software (fiber analysis) 3D roughness software (3D image construction, roughness measurement)	Computer-controlled motor-driven XY stage	145 (W) × 220 (D) × 213 (H) mm, 4.5 kg	JPEG, TIFF, PNG	Standard	8nm	27 ~ 160x (color)	Option	6nm	531.5 (W) × 250 (D) × 515.4 (H) mm, 6.7 kg	Thermo Fisher (available at Jusco International)	12 times	92.5 (W) × 305.6 (D) × 343.5 (H) mm, 8 kg	Standard

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About Company Handling This Product

Oki Riko Jizai Co., Ltd.

Response Rate

100.0%

Response Time

21.5hrs

Japan

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Tabletop scanning electron microscope Phenom series Oki Riko Jizai Co., Ltd.

Oki Riko Jizai Co., Ltd.'s Response Status

About This Product

■Summary

■Make CeB6 more beautiful

■Backscattered electron image

■Secondary electron image (optional)

■Uses a CeB6 electron gun with high brightness and long life.

■Beautiful everywhere No image is disturbed even if there is vibration

■Observation conditions such as accelerating voltage and current value can be set according to the sample and observation purpose.

■Mix backscattered electron image + secondary electron image

■Innovative user interface makes it faster and smarter

■Don't get lost with the navigation system

■“Move instantly” with automatic stage

■Revisit function allows you to return immediately

1 Models of Tabletop scanning electron microscope Phenom series

Phenom ProX

Customers who viewed this product also viewed

Other products of Oki Riko Jizai Co., Ltd.

About Company Handling This Product

Related search keywords

Tabletop scanning electron microscope Phenom series
Oki Riko Jizai Co., Ltd.