Tabletop scanning electron microscope Phenom series
Oki Riko Jizai Co., Ltd.
About This Product
■Summary
High-quality SEM image observation and advanced image analysis are possible. Easy to understand and operate even for SEM beginners. Confirm the SEM observation position while viewing the entire sample with the navigation camera.
Features
■Make CeB6 more beautiful
Adopts a high-brightness, long-life CeB6 electron gun that enables high-resolution observation. You can experience the overwhelming beauty on a large full screen.
■Backscattered electron image
It is possible to observe clear backscattered electron images at high magnification. Even non-conductive samples that are easily charged can be observed with high image quality without coating.
■Secondary electron image (optional)
A high-sensitivity secondary electron detector is used, making it possible to observe high-definition secondary electron images at high magnification. It is also possible to capture submicron particles and the fine structure of material surfaces.
■Uses a CeB6 electron gun with high brightness and long life.
This is the only tabletop SEM that uses a CeB6 (cerium hexaboride) electron gun that enables high-quality observation.
■Beautiful everywhere No image is disturbed even if there is vibration
Since the sample holder is fixed to the lens barrel of the lens system including the electron gun, the SEM image will not be disturbed even if there is vibration. A vibration isolation table is not required even in locations where there is vibration, such as in high-rise buildings, along highways, or along factory lines. Delivers maximum performance in any location.
Freely set observation conditions
■Observation conditions such as accelerating voltage and current value can be set according to the sample and observation purpose.
・Acceleration voltage: 5 kV, 10 kV, 15 kV (Advanced: 4.8 to 20.5 kV)
・Spot size: 4 levels (Advanced: Custom settings)
・Low emission current mode
■Mix backscattered electron image + secondary electron image
You can simultaneously observe the "composition information" and "fine irregularities on the surface" of the sample. Switching between backscattered electron image, secondary electron image, and mix image is possible with one click.
■Innovative user interface makes it faster and smarter
The user interface has been redesigned. Display the SEM image in just 30 seconds after introducing the sample, and proceed directly to barrier-free analysis.
■Don't get lost with the navigation system
You can always check your observation position and never get lost.
■“Move instantly” with automatic stage
You can move to the next observation position with just one click on the screen.
■Revisit function allows you to return immediately
You can register places of interest, go back, re-observe, and re-analyze.
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Product
Tabletop scanning electron microscope Phenom series
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Handling Company
Oki Riko Jizai Co., Ltd.
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Categories
1 Models of Tabletop scanning electron microscope Phenom series
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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Phenom ProX |
Available upon quote |
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About Company Handling This Product
- Japan