Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000
Meishin Koki Co., Ltd.
About This Product
■Summary
・Quickly confirm shapes and compositions that cannot be seen with an optical microscope alone
・Desktop SEM equipped with various functions to streamline foreign matter analysis and quality control
Features
■Equipped with various functions to streamline foreign matter analysis and quality control
・Zeromag function, which links CCD images that provide color information and SEM images that provide detailed surface information, allows for quick and comfortable field of view searches.
・Two-axis motor stage (X, Y) provides excellent work efficiency and can also be used for montage imaging.
- Equipped with a Live Analysis function that constantly displays elemental analysis results even during observation, enabling efficient elemental analysis.
・With the Live3D function, it is possible to construct a 3D image on the spot during SEM observation and obtain unevenness and depth information.
■Main functions that allow anyone to operate SEM/EDS
・Transition from optical images to scanning electron microscope (SEM) images on one screen
・Elemental analysis while observing
・Auto function provides clear images from low magnification to high magnification
・Low vacuum (LV) mode that does not require pretreatment even for non-conductive samples
・High vacuum (HV) mode for detailed morphology observation
・3D construction while observing (Live 3D)
・Result output using automatic layout without copying and pasting (SMILE VIEWTM Lab)
■Foreign substance analysis
Foreign substances with different compositions can be easily discovered, and the constituent elements can be instantly determined. Report creation is easy, so you can quickly provide feedback to the field.
■Quality control
SEM allows you to observe compositional contrasts that cannot be observed with optical images, so you can obtain different information even at the same magnification. Equipped with a low vacuum mode as standard, it allows observation and analysis without processing, so it can also be used for sampling inspections on production lines.
■Screening analysis
The JCM-7000 allows samples to be observed and analyzed without any processing, and after measurement, the samples can be transferred to other analyzers.
■Zeromag
The image displayed at the lowest magnification on the SEM operation screen is an optical image automatically taken when the sample is inserted. As you search the field of view using the optical image and expand the observation field, it will automatically switch to the SEM image. Since it can be moved smoothly to the observation position, SEM images can be taken with a minimum of button operations.
■Low vacuum mode
In addition to the high-vacuum mode for clear SEM observation of surface morphology, it is equipped with a two-stage low-vacuum mode that allows observation of easily charged samples without pretreatment, making sample preparation easier.
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Product
Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000
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Handling Company
Meishin Koki Co., Ltd.
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Categories
1 Models of Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000
| Product Image | Part Number | Price (excluding tax) | Acceleration voltage | Automatic function | Body mass | Body size (width) (depth) (height) | Computer | Display magnification | Electron gun | Exhaust system | File format | Image mode | Maximum sample size | Measurement function | Monitor | Number of pixels | Photo magnification | Sample exchange | Sample stage |
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JCM-7000 |
Available upon quote | 5 kV, 10 kV, 15 kV (3 stages) | Alignment adjustment, focus, astigmatism, exposure adjustment | 67kg | 324mm x 586mm x 566mm | Desktop PC OS Windows® 10 |
×24 ~ 202,168 (Magnification is defined based on the display size of 280 mm × 210 mm) |
Tungsten filament Wehnelt integrated grid | Fully automatic, TMP: 1 unit, RP: 1 unit | BMP, TIFF, JPEG, PNG |
High vacuum mode: Secondary electron image, backscattered electron image (composition, unevenness, 3D, 3D) Low vacuum mode: Backscattered electron image (composition, unevenness, 3D, 3D) |
80 mm diameter 50 mm height | 2-point measurement, angle measurement, line width measurement | 24 type | 640 × 480, 1,280 × 960, 2,560 × 1,920, 5,120 × 3,840 |
×10 ~ 100,000 (Magnification is defined based on the display size of 128 mm × 96 mm) |
Stage pull-out type | X-Y motor driven stage X: 40 mm Y: 40 mm |
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About Company Handling This Product
- Japan