Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000
Meishin Koki Co., Ltd.

Meishin Koki Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

17.9hours

Company Review

5.0

Relatively Fast Response

About This Product

■Summary・Quickly confirm shapes and compositions that cannot be seen with an optical microscope alone
・Desktop SEM equipped with various functions to streamline foreign matter analysis and quality control

Features
■Equipped with various functions to streamline foreign matter analysis and quality control・Zeromag function, which links CCD images that provide color information and SEM images that provide detailed surface information, allows for quick and comfortable field of view searches.
・Two-axis motor stage (X, Y) provides excellent work efficiency and can also be used for montage imaging.
- Equipped with a Live Analysis function that constantly displays elemental analysis results even during observation, enabling efficient elemental analysis.
・With the Live3D function, it is possible to construct a 3D image on the spot during SEM observation and obtain unevenness and depth information.

■Main functions that allow anyone to operate SEM/EDS・Transition from optical images to scanning electron microscope (SEM) images on one screen
・Elemental analysis while observing
・Auto function provides clear images from low magnification to high magnification
・Low vacuum (LV) mode that does not require pretreatment even for non-conductive samples
・High vacuum (HV) mode for detailed morphology observation
・3D construction while observing (Live 3D)
・Result output using automatic layout without copying and pasting (SMILE VIEWTM Lab)

■Foreign substance analysisForeign substances with different compositions can be easily discovered, and the constituent elements can be instantly determined. Report creation is easy, so you can quickly provide feedback to the field.

■Quality controlSEM allows you to observe compositional contrasts that cannot be observed with optical images, so you can obtain different information even at the same magnification. Equipped with a low vacuum mode as standard, it allows observation and analysis without processing, so it can also be used for sampling inspections on production lines.

■Screening analysisThe JCM-7000 allows samples to be observed and analyzed without any processing, and after measurement, the samples can be transferred to other analyzers.

■ZeromagThe image displayed at the lowest magnification on the SEM operation screen is an optical image automatically taken when the sample is inserted. As you search the field of view using the optical image and expand the observation field, it will automatically switch to the SEM image. Since it can be moved smoothly to the observation position, SEM images can be taken with a minimum of button operations.

■Low vacuum modeIn addition to the high-vacuum mode for clear SEM observation of surface morphology, it is equipped with a two-stage low-vacuum mode that allows observation of easily charged samples without pretreatment, making sample preparation easier.

Model
There is 1 model available for this product.

Product
Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000

Handling Company
Meishin Koki Co., Ltd.

Categories

Observation Equipment

Electron Microscopes

Observation Equipment

Transmission Electron Microscopes

Observation Equipment

Scanning Electron Microscopes (SEM)

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Last viewed: 1 hour ago

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1 Models of Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000

Image	Part Number	Price (excluding tax)	Electron gun	Sample exchange	Sample stage	Measurement function	Display magnification	Automatic function	Number of pixels	Image mode	Body mass	Body size (width) (depth) (height)	Maximum sample size	Exhaust system	Acceleration voltage	Photo magnification	Monitor	File format	Computer
	JCM-7000	Available upon quote	Tungsten filament Wehnelt integrated grid	Stage pull-out type	X-Y motor driven stage X: 40 mm Y: 40 mm	2-point measurement, angle measurement, line width measurement	×24 ~ 202,168 (Magnification is defined based on the display size of 280 mm × 210 mm)	Alignment adjustment, focus, astigmatism, exposure adjustment	640 × 480, 1,280 × 960, 2,560 × 1,920, 5,120 × 3,840	High vacuum mode: Secondary electron image, backscattered electron image (composition, unevenness, 3D, 3D) Low vacuum mode: Backscattered electron image (composition, unevenness, 3D, 3D)	67kg	324mm x 586mm x 566mm	80 mm diameter 50 mm height	Fully automatic, TMP: 1 unit, RP: 1 unit	5 kV, 10 kV, 15 kV (3 stages)	×10 ~ 100,000 (Magnification is defined based on the display size of 128 mm × 96 mm)	24 type	BMP, TIFF, JPEG, PNG	Desktop PC OS Windows® 10

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About Company Handling This Product

Meishin Koki Co., Ltd.

Response Rate

100.0%

Response Time

17.9hrs

Company Review

5.0

Japan

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Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000 Meishin Koki Co., Ltd.

Meishin Koki Co., Ltd.'s Response Status

About This Product

■Summary

■Equipped with various functions to streamline foreign matter analysis and quality control

■Main functions that allow anyone to operate SEM/EDS

■Foreign substance analysis

■Quality control

■Screening analysis

■Zeromag

■Low vacuum mode

1 Models of Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000

JCM-7000

Customers who viewed this product also viewed

Other products of Meishin Koki Co., Ltd.

About Company Handling This Product

Related search keywords

Electron Microscope (SEM/TEM) Tabletop SEM that breaks the barrier of high operation from optical images to SEM observation and elemental analysis Tabletop scanning electron microscope JCM-7000
Meishin Koki Co., Ltd.