Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR
Meishin Koki Co., Ltd.
About This Product
■Summary
・General-purpose SEM equipped with FE electron gun
・Automated functions have also evolved, greatly improving the overall capabilities of scanning electron microscopes.
Features
■Automate the acquisition of SEM images and EDS analysis “Simple SEM”
・A function that automatically acquires SEM images and EDS (Energy Dispersive X-ray Spectroscopy) analysis by simply selecting the SEM image acquisition conditions and field of view.
・Contributes to improving the efficiency of routine work including analysis work
■Build 3D images on the spot "Live3D"
Build a 3D image on the spot during SEM observation and obtain unevenness and depth information
■“Stage Navigation System LS” acquires an optical image of approximately 5 times the area of conventional systems
- Obtain an optical image of the observation sample and move to the desired observation field by simply clicking on the optical image.
・Obtains optical images of approximately 5 times the area compared to conventional stage navigation systems
■ “Low Vacuum Hybrid Secondary Electron Detector (LHSED)” obtains detailed unevenness information even under low vacuum conditions
By detecting the electrons and excitation light generated when secondary electrons collide with residual gas molecules, detailed unevenness information can be obtained even under low vacuum conditions.
■5-axis motor sample stage
Equipped with a 5-axis motor sample stage as standard, it is also possible to acquire SEM images and EDS analysis of uneven samples.
■Improved stability of electron gun
Further improves electron beam stability and supports long-term continuous automatic operation using a sample holder that can mount multiple samples at the same time.
■JSM-IT710HR concept
This is a new model with improved automatic measurement functions. With a simple optical system/detection system and a user interface that takes into account the workflow of SEM-EDS, we aimed to create a SEM that allows anyone to easily acquire high-resolution images and perform elemental analysis at the same time.
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Product
Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR
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Handling Company
Meishin Koki Co., Ltd.
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Categories
1 Models of Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR
| Product Image | Part Number | Price (excluding tax) | Acceleration voltage | Aperture angle optimized lens | Automatic function | Data management | Display magnification | EDS function | Electron gun | Exhaust system | Image mode | Image size | Irradiation current | Low vacuum pressure setting range | Maximum sample size | OS | Objective lens aperture | Observation monitor | Operation support function | Photo magnification | Report creation One-click report | Resolution | Sample stage | Shooting assistance function |
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JSM-IT710HR |
Available upon quote | 0.5kV~30kV | Built-in |
Beam alignment Focus/astigmatism/brightness/contrast adjustment |
SMILE VIEW™ Lab |
×15~×1,767,305 Image magnification on monitor (Magnification is defined based on the display size of 377mm x 283mm) |
See EDS specifications | Schottky field emission electron gun | Fully automatic TMP: 1 unit SIP: 2 units RP: 1 unit | Secondary electron image, REF image, composition image, unevenness image, 3D image, PD image, low vacuum secondary electron image |
640×480 1,280×960 2,560×1,920 5,120×3,840 |
Several pA~300nA | 10Pa~150Pa |
200mm diameter x 75mm height 200mm diameter x 80mm height* 32mm diameter x 90mm height* *Optional holder required |
Microsoft Windows 10 64bit | 4 stages with XY fine adjustment function | 23.8 inch touch panel |
Recipe (Standard recipe/Custom recipe) Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.) Sample exchange navigation Signal depth display 3D measurement |
×5~×600,000 (Magnification is defined based on display size of 128mm x 96mm) |
Output to Microsoft®︎ World®︎ Output to Microsoft®︎ PowerPoint®︎ |
High vacuum mode: 1.0nm (20kV) 3.0nm (1.0kV) During analysis: 3.0nm (15kV irradiation current 3nA) Low vacuum mode: 1.8nm (15kV BED) |
Large eucentric type X: 125mm Y: 100mm Z: 80mm Tilt: -10~90° Rotation: 360° |
Montage shooting, Simple SEM, Zeromag, Live 3D |
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About Company Handling This Product
- Japan