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  4. Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR (Meishin Koki Co., Ltd.)
Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR-JSM-IT710HR
Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR-Meishin Koki Co., Ltd.

Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR
Meishin Koki Co., Ltd.

Meishin Koki Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

17.9hours

Company Review

5.0

Relatively Fast Response

About This Product

■Summary

・General-purpose SEM equipped with FE electron gun ・Automated functions have also evolved, greatly improving the overall capabilities of scanning electron microscopes. Features

■Automate the acquisition of SEM images and EDS analysis “Simple SEM”

・A function that automatically acquires SEM images and EDS (Energy Dispersive X-ray Spectroscopy) analysis by simply selecting the SEM image acquisition conditions and field of view. ・Contributes to improving the efficiency of routine work including analysis work

■Build 3D images on the spot "Live3D"

Build a 3D image on the spot during SEM observation and obtain unevenness and depth information

■“Stage Navigation System LS” acquires an optical image of approximately 5 times the area of ​​conventional systems

- Obtain an optical image of the observation sample and move to the desired observation field by simply clicking on the optical image. ・Obtains optical images of approximately 5 times the area compared to conventional stage navigation systems

■ “Low Vacuum Hybrid Secondary Electron Detector (LHSED)” obtains detailed unevenness information even under low vacuum conditions

By detecting the electrons and excitation light generated when secondary electrons collide with residual gas molecules, detailed unevenness information can be obtained even under low vacuum conditions.

■5-axis motor sample stage

Equipped with a 5-axis motor sample stage as standard, it is also possible to acquire SEM images and EDS analysis of uneven samples.

■Improved stability of electron gun

Further improves electron beam stability and supports long-term continuous automatic operation using a sample holder that can mount multiple samples at the same time.

■JSM-IT710HR concept

This is a new model with improved automatic measurement functions. With a simple optical system/detection system and a user interface that takes into account the workflow of SEM-EDS, we aimed to create a SEM that allows anyone to easily acquire high-resolution images and perform elemental analysis at the same time.

  • Product

    Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR

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1 Models of Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR

Image Part Number Price (excluding tax) Electron gun Aperture angle optimized lens Sample stage Observation monitor Display magnification Automatic function Image mode Image size Irradiation current Maximum sample size Operation support function Shooting assistance function Exhaust system Objective lens aperture Acceleration voltage Resolution Photo magnification Low vacuum pressure setting range Report creation One-click report Data management OS EDS function
Electron Microscope (SEM/TEM) A new model with improved automatic measurement functions Scanning Electron Microscope JSM-IT710HR-Part Number-JSM-IT710HR

JSM-IT710HR

Available upon quote

Schottky field emission electron gun

Built-in

Large eucentric type
X: 125mm Y: 100mm Z: 80mm Tilt: -10~90° Rotation: 360°

23.8 inch touch panel

×15~×1,767,305
Image magnification on monitor
(Magnification is defined based on the display size of 377mm x 283mm)

Beam alignment
Focus/astigmatism/brightness/contrast adjustment

Secondary electron image, REF image, composition image, unevenness image, 3D image, PD image, low vacuum secondary electron image

640×480　1,280×960
2,560×1,920 5,120×3,840

Several pA~300nA

200mm diameter x 75mm height
200mm diameter x 80mm height*
32mm diameter x 90mm height*
*Optional holder required

Recipe (Standard recipe/Custom recipe)
Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.)
Sample exchange navigation
Signal depth display
3D measurement

Montage shooting, Simple SEM, Zeromag, Live 3D

Fully automatic TMP: 1 unit SIP: 2 units RP: 1 unit

4 stages with XY fine adjustment function

0.5kV~30kV

High vacuum mode: 1.0nm (20kV) 3.0nm (1.0kV)
During analysis: 3.0nm (15kV irradiation current 3nA)
Low vacuum mode: 1.8nm (15kV BED)

×5~×600,000
(Magnification is defined based on display size of 128mm x 96mm)

10Pa~150Pa

Output to Microsoft®︎ World®︎
Output to Microsoft®︎ PowerPoint®︎

SMILE VIEW™ Lab

Microsoft Windows 10 64bit

See EDS specifications

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About Company Handling This Product

Meishin Koki Co., Ltd.

Response Rate

100.0%

Response Time

17.9hrs

Company Review

5.0
  • Japan

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Electron Microscopes　Meishin Koki Co., Ltd.
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