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Measuring the density of states in the entire Brillouin zone without rotating the sample Next-generation TOF momentum photoelectron microscope METIS1000-METIS1000
Measuring the density of states in the entire Brillouin zone without rotating the sample Next-generation TOF momentum photoelectron microscope METIS1000-Tokyo Instruments, Inc

Measuring the density of states in the entire Brillouin zone without rotating the sample Next-generation TOF momentum photoelectron microscope METIS1000
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

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100.0%

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36.5hours


About This Product

■3D angle-resolved photoelectron spectroscopy

The time-of-flight photoelectron microscope METIS1000, manufactured by SPECS in Germany, is a state-of-the-art angle-resolved photoelectron microscope that uses the TIME-OF-FLIGHT (TOF) method. METIS1000 performs TOF measurement of photoelectrons excited by a pulsed light source using delay line detection, and calculates the kinetic energy of the photoelectrons from the results. Unlike conventional ARPES, it is possible to perform angularly resolved measurements in the x-axis and y-axis directions at the same time, providing three-dimensional information of kx, ky, and t. The photoelectron detection optical system uses a state-of-the-art k microscope column jointly developed by SPECS, the University of Mainz, Germany, and the Max Planck Institute in Germany, which achieves an uptake angle of ±90° in the kinetic energy region of 70 eV or less. , the entire Brillouin zone can be observed without rotating the sample. Since the k microscope column can also be used as a high-performance PEEM with a spatial resolution of <50 nm, it is possible to perform ARPES measurements with METIS after determining the measurement position from the PEEM image.

■Features

・Momentum Microscopy measurement ・Angle-resolved photoelectron spectroscopy (ARPES) ・Batch measurement of the entire Brillouin zone ・Reciprocal lattice space, real space measurement ・High energy resolution <15meV ・Angular resolution <0.1° ・Measure kx, ky, kE at the same time: Δk<0.01Å-1 ・Kinetic energy: 0 to 2,000 eV ・Sample stage for LHe cooled high performance microscope: HESTIA ・Intake angle ±90° ・Delay line detector ・Direct 3D imaging ( ARPES mode (momentum mode 3D imaging kx, ky, t) (PEEM mode (Photoelectron microscope mode 3D imaging x, y, t) ・Option: Spin imaging sensor (upgradable)

■Measurement mode

・Momentum measurement mode ・Photoelectron microscope mode

  • Product

    Measuring the density of states in the entire Brillouin zone without rotating the sample Next-generation TOF momentum photoelectron microscope METIS1000

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1 Models of Measuring the density of states in the entire Brillouin zone without rotating the sample Next-generation TOF momentum photoelectron microscope METIS1000

Image Part Number Price (excluding tax) Angular resolution Repetition rate Spatial resolution (PEEM mode) Spatial resolution (ARPES mode) Spatial resolution Wavenumber resolution Maximum count value Time resolution (typical value) Pull-in voltage Number of simultaneous incidences Uptake angle Mounting flange Linearity Hardware trigger Energy resolution Interface Aperture size Structure of MCP Kinetic energy
Measuring the density of states in the entire Brillouin zone without rotating the sample Next-generation TOF momentum photoelectron microscope METIS1000-Part Number-METIS1000

METIS1000

Available upon quote

< 0.1°

≦150 MHz (without prescaler ≦9 MHz)

<50nm

< 2 µm

< 100 µm (maximum value <50 µm)

< 0.01 Å^-1

>8×106 cps (limit value 108 cps)

<180 ps (highest attained value <110 ps)

Up to 29 kV

Up to 30 points (optional, in case of multi-anode configuration)

Maximum ±90°

DN150CF

>2×106 cps

External trigger, measurement start, measurement end

< 15 meV

USB2.0 (communication speed>30 Mbyte/s)
USB3.0 (communication speed>200 Mbyte/s)

2 µm ~200 µm

Chevron (MCP x 2 stages)
Gain (typical value) 3×106
Lifespan (typical) >5,000 hours (at 106 cps)

0-2,000 eV

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About Company Handling This Product

Response Rate

100.0%


Response Time

36.5hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

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