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Scanning electron microscope JSM-IT510HR InTouchScope™-Cosmo Trading Co., Ltd.

Price (excluding tax)

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Cosmo Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.3hours

Relatively Fast Response


Model Description

An analysis type that is configured with an energy dispersive X-ray spectrometer (EDS) and can be analyzed as standard.


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Automatic function

Data management

Display magnification

Electron gun

Exhaust system

Image mode

Image size

Incident voltage

Low vacuum pressure setting range

Maximum sample size

OS

Objective lens aperture

Observation monitor

Operation support function

Report creation one-click report

Resolution

Sample stage

Shooting assistance function

Shooting magnification

EDS specification control PC

EDS specification detector

EDS specification element map

EDS specification montage

EDS specification report creation

EDS specifications Continuous analysis

EDS specifications SEM integration

EDS specifications Spectral analysis

EDS specifications Supported languages

EDS specifications line analysis

EDS specifications particle analysis software

See all 4 models in list
  • Part Number

    JSM-IT510HR InTouchScope™ A

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Scanning electron microscope JSM-IT510HR InTouchScope™ JSM-IT510HR InTouchScope™ A's performance table

Image Price (excluding tax) Automatic function Data management Display magnification EDS specification control PC EDS specification detector EDS specification element map EDS specification montage EDS specification report creation EDS specifications Continuous analysis EDS specifications SEM integration EDS specifications Spectral analysis EDS specifications Supported languages EDS specifications line analysis EDS specifications particle analysis software Electron gun Exhaust system Image mode Image size Incident voltage Low vacuum pressure setting range Maximum sample size OS Objective lens aperture Observation monitor Operation support function Report creation one-click report Resolution Sample stage Shooting assistance function Shooting magnification
Scanning electron microscope JSM-IT510HR InTouchScope™-Part Number-JSM-IT510HR InTouchScope™ A Available upon quote Filament adjustment, gun alignment adjustment beam alignment Focus / Astigmatism / Brightness / Contrast adjustment SMILE VIEW™ Lab ×14 ~ ×839,724 (Magnification is defined based on display size of 358 mm × 269 mm) OS: Microsoft® Windows® 10 64bit SDD type Element map (multicolor display, single color display, multicolor composite) Maximum resolution 4,096×3,072 Real-time pop-up spectrum Waveform separation map (net count map, quantitative value map), etc. Automatic montage creation (SEM images, elemental maps) Continuous elemental map spanning multiple fields of view SMILE VIEW™ Lab Output to Microsoft®Word, Microsoft®PowerPoint Spectrum analysis/line analysis/element map Bulk analysis of measured data (qualitative/quantitative) Centralized management of observation and analysis data Specify the analysis position on the SEM operation screen (direct analysis from the SEM UI) Graphical display of analysis position Qualitative analysis (peak identification, automatic qualitative) Visual peak ID Standard-less quantitative analysis (ZAF method) Standard quantitative analysis (ZAF method) PHI-RHO-Z (PRZ) Legal quantitative correction method, etc. Japanese / English / Chinese Line analysis (horizontal, arbitrary direction) Particle analysis (automatic/manual) & EDS analysis, particle analysis data classification function, Graphical display of statistical processing of particle analysis data, wide area continuous particle analysis & EDS analysis, etc. W filament fully automatic gun alignment Fully automatic TMP: 1 unit RP: 1 or 2 units Secondary electron image, REF image, composition image Concave-convex image, 3D image, PD image 640 × 480 1,280 × 960 2,560 × 1,920 5,120 × 3,840 0.3 kV ~ 30 kV 10 ~ 650Pa 200mm diameter x 75mm height 200mm diameter x 80mm height 32mm diameter x 90mm height Microsoft® Windows®10 64bit 4 stages with XY fine adjustment function 23.8 inch touch panel Recipe (Standard recipe/Custom recipe) Measurement (distance between two points, distance between parallel lines, angle, diameter, etc.) Sample exchange navigation Signal depth display 3D measurement Output to Microsoft® Word Output to Microsoft® PowerPoint High vacuum mode 3.0 nm (30 kV), 15.0 nm (1.0 kV) Low vacuum mode 4.0 nm (30 kV BED) Large eucentric type X: 125 mm Y: 100 mm Z: 80 mm Tilt: -10 ~ 90° Rotation: 360° Montage photography, Simple SEM Zeromag, Live 3D ×5 ~ ×300,000 (Magnification is defined based on display size of 128 mm × 96 mm)

There are 4 models for this product.

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.3hrs


Company Review

4.0
  • Japan

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