Elementary analysis device fluorescent X-ray analysis meter X-500 series
Nireco
About This Product
The X -ray fluorescent analysis (XRF) not only identifies the elements that make up the sample by detecting a fluorescent X -ray peculiar to each element generated by irradiating X -rays to the sample, but also analyzes the ratio of the components. XRF is a non -destruction and non -invasive measuring device.
As an application, utilizing the features of the handheld type, mining and testing in the mining field, mineral analysis in the mining field, identification and selection of metals and alloys in materials in industrial fields, tests such as ROHS and CPSIA, identification and selection of scraps in scrap factories in the SDG's field, and in the field of environment. A wide range of fields, such as soil contamination surveys and the characteristics of their non -invasive, are assumed to be a wide range of fields, such as the judgment of art and crafts.
The X-500 series is the latest premium model released in Japan from June 2021.
It has the lightest and robust metal frame, and you can measure the sample surface at the back of a narrow gap by taking advantage of the thin tip shape.
You can choose from two types of light sources according to the samples and environments to be measured.
In addition to providing the main body software library that matches the purpose of the customer, it is also possible to create your own calibration line with optional PC software.
Advanced shape
・ The thin tip shape of the X-500 series can measure the sample surface at the back of a narrow gap compared to the conventional machine, making it ideal for field operation.
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Product
Elementary analysis device fluorescent X-ray analysis meter X-500 series