Element analysis device fluorescent X-ray analysis meter X-50 series
Nireco
About This Product
The X -ray fluorescent analysis (XRF) not only identifies the elements that make up the sample by detecting a fluorescence X -ray peculiar to each element generated by irradiating X -rays to the sample, but also analyzes the component ratio. XRF is a non -destruction and non -invasive measuring device.
As an application, utilizing the features of the handheld type, mining and testing in the mining field, mineral analysis in the mining field, identification and selection of metals and alloys in materials in industrial fields, tests such as ROHS and CPSIA, identification and selection of scraps in scrap factories in the SDG's field, and in the field of environment. A wide range of fields, such as soil contamination surveys and the characteristics of their non -invasive, are assumed to be a wide range of fields, such as the judgment of art and crafts.
The X-50 series is a low-priced model. You can use the XRF function using the same user interface as the upper model at 50 % of the flagship model.
Two types of light sources are available according to the measured samples.
In addition to providing the main body software library that matches the purpose of the customer, it is also possible to create your own calibration line with optional PC software.
display
・ The X-50 series uses a 3.5-inch LCD color touch screen and boasts high visibility.
-
-
Product
Element analysis device fluorescent X-ray analysis meter X-50 series