Elementary analysis device fluorescent X-ray analysis meter X-200 series
Nireco
About This Product
The X -ray fluorescent analysis (XRF) not only identifies the elements that make up the sample by detecting a fluorescence X -ray peculiar to each element generated by irradiating X -rays to the sample, but also analyzes the component ratio.
XRF is a non -destruction and non -invasive measuring device.
As an application, utilizing the features of the handheld type, mining and testing in the mining field, mineral analysis in the mining field, identification and selection of metals and alloys in materials in industrial fields, tests such as ROHS and CPSIA, identification and selection of scraps in scrap factories in the SDG's field, and in the field of environment. A wide range of fields, such as soil contamination surveys and the characteristics of their non -invasive, are assumed to be a wide range of fields, such as the judgment of art and crafts.
The X-200 series is a popular model. It has almost the same measurement performance as a high -end machine, and the user interface is the same. Two types of light sources are available according to the measured samples.
In addition to providing the main body software library that matches the purpose of the customer, it is also possible to create your own calibration line with optional PC software.
display
・ The X-200 series uses a 3.5-inch LCD color touch screen and boasts a large and high visibility.
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Product
Elementary analysis device fluorescent X-ray analysis meter X-200 series