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  2. Near infrared analysis device separate analyzer IP-55 compatible (Nireco)
Near infrared analysis device separate analyzer IP-55 compatible-Luminar 7030
Near infrared analysis device separate analyzer IP-55 compatible-Nireco

Near infrared analysis device separate analyzer IP-55 compatible
Nireco

🍎 Food Industry Use 💊 Pharmaceutical & Medical Use 🧪 Chemical Industry Use

About This Product

Inline AOTF Analyzer Luminar 7030 A high -speed scanning of 16,000 wavelengths per second is achieved by high -speed scanning using AOTF elements made by BRIMROSE. The wavelength range and wavelength interval are set according to the characteristics of the measurement object, and measurement is possible with emphasis on high -speed scanning measurement (eg, 50 scanning per second). ･ Electronic control units and optical modules are compatible with IP55, respectively ･ Equipped with three types of wavelength options and support various specimen. (850-1700NM, 900-1800NM, 1100-2300NM) Product composition list ◆ Detected head separation type LUMINAR 7030 AOTF-NIR spectrometer is designed for inline measurement of production equipment. The spectrosometer has two housing, one enclosure contains an optical system and is installed in the analysis target. The second enclosure contains electronic devices and is connected with a cable of one meter. By using a small housing, the LUMINAR 4030 model can be installed in a space -saving space that allows you to install inline. Outside form: 300mm x 256mm x 145mm

  • Product

    Near infrared analysis device separate analyzer IP-55 compatible

  • Usage Scenarios

    Food Industry Use / Pharmaceutical & Medical Use / Chemical Industry Use

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1 Models of Near infrared analysis device separate analyzer IP-55 compatible

Image Part Number Price (excluding tax)
Near infrared analysis device separate analyzer IP-55 compatible-Part Number-Luminar 7030

Luminar 7030

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About Company Handling This Product

Nireco

Company Overview

Nireco, founded in 1950 and based in Tokyo, Japan, is a manufacturer of control, measurement, and inspection e...

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