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JEOL Ltd.'s Semiconductor inspection equipment

JEOL Ltd.

2 products found

JEM-ACE200F high-throughput analytical electron microscope-JEOL Ltd.

JEOL Ltd.

JEM-ACE200F high-throughput analytical electron microscope

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Last viewed: 1 day ago

100.0% Response Rate

37.9hours Response Time

The JEM-ACE200F is an electron microscope compatible with a system that allows operators to acquire data without directly operating the electron mi...


JSM-IT810 Schottky field emission scanning electron microscope-JEOL Ltd.

JEOL Ltd.

JSM-IT810 Schottky field emission scanning electron microscope

20+ people viewing

Last viewed: 1 day ago

100.0% Response Rate

37.9hours Response Time

■Automatic observation and analysis function "Neo Action" With intuitive operation, anyone can easily automate SEM observation and EDS analysis. ■...



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