All Categories
History
This section provides an overview for probe cards as well as their applications and principles. Also, please take a look at the list of 13 probe card manufacturers and their company rankings. Here are the top-ranked probe card companies as of December, 2024: 1.Accuprobe, 2.JENOPTIK AG, 3.STAr.
Table of Contents
A probe card is an instrument required for wafer-level inspection in the semiconductor manufacturing process.
They are used by attaching them to wafer inspection equipment. Most of the cost of semiconductors is determined by the manufacturing equipment, but the cost of the package itself and packaging also has a large impact during the manufacturing stage. Therefore, it is possible to reduce costs by determining whether a product is good or bad at the wafer level after the semiconductor manufacturing process is complete, and sending only the good products to subsequent processes.
A wafer consists of several hundred to several thousand chips on a single wafer, and wafer inspection is the process of sorting these chips by determining whether they are good or bad before cutting them into individual pieces and packaging them.
Wafer inspection consists of an LSI tester that inputs electrical signals called test patterns to a chip and determines the output signal pattern by comparing it with expected values, a wafer prober that performs chip-level positioning control to connect signals accurately to the electrode terminals of each chip, and a probe card that performs positioning control to hit hundreds to tens of thousands of electrode terminals accurately, within a chip. Probe Cards with an equal number of needles (probes) positioned to precisely hit the hundreds of thousands of electrode terminals on the chip are used.
Probe cards must be made specifically for each chip design, which is costly in itself and requires re-creation due to wear from use, but is essential to overall manufacturing costs. Semiconductor chips are used in countless products, not only in computers, but in almost every product in our lives, and probe cards are one of the supports of these products.
A probe card is mounted on the wafer prober and acts as a connector between the electrode terminals of the chip and the LSI tester through the wafer prober.
The LSI test head has spilling contact pins and high-density pins mounted for connection, but the placement pitch of the electrode terminals of a semiconductor chip is narrower than the pin placement density of the test head, at several tens of microns, so it is necessary to connect the two through the probe card.
The upper side of the probe card has the connection pins to the test head, and the lower side has the needles to connect with the electrode pins of the semiconductor chip.
By connecting the test head and the probe card's connection terminal, and then connecting the semiconductor chip's electrode terminal and the probe card's needle, an electrical connection is formed, and each semiconductor chip on the silicon wafer is tested by judging whether it is good or bad based on electrical signals from the LSI tester.
Probe cards are available in advanced and cantilever types. In the advanced type, a block with vertical terminals is attached to the board, and the probes can be freely arranged for easy maintenance. In the cantilever type, probes are directly attached to the board without any blocks, which makes it easy to accommodate narrow-pitch terminals.
Probe cards are often made of ceramic substrates, due to the fine and high level of reliability required in wafer inspection. For example, Kyocera uses thin-film single-layer and thin-film multilayer ceramic substrates with metallization for probe cards for DRAM, flash memory, and logic devices.
Generally, spring connectors or high-density connectors are used for the signal connections of large-scale integrated semiconductor circuits called LSIs or system LSIs. Probe cards also serve as an intermediary between the test head and the wafer to be inspected, and since they are required to have a high level of connection reliability and electrical inspection performance functions, their mechanisms and materials are delicate. Materials, such as ceramics are used.
However, the durability of probe cards is limited, and even the slightest distortion due to physical shock will prevent them from fulfilling their intended use. They are also consumable parts that are difficult to repair and must be replaced on a regular basis.
*Including some distributors, etc.
Sort by Features
Sort by Area
Accuprobe, established in 1967 in Salem, Massachusetts, USA, is a manufacturer of optimal probing and interface products for integrated and hybrid circuit testing. The company specializes in manufacturing multiple probing products such as Probe rings, Metal & Ceramic blades, Z adjustable probes, and Blade spring probes for various testing purposes. It serves the semiconductor wafer sort or IC test, thick and thin film hybrid circuit, optical, and laser trim markets. Semiconductor and hybrid circuit makers utilize the products to electrically screen their products for flaws before incorporating them into electronic systems.
YAC Garter Co., Ltd., established in 1957 and headquartered in Ome-shi, Tokyo, is a manufacturer of electronic component-related devices and carrier tapes. The company offers a range of products, including taping handlers, sorters, measuring instruments, embossed carrier tapes, and taping machine NCT-280TW. It also provides one-stop solutions from design to after-sales for its carrier tapes. Its embossed carrier tape resists tears and punctures, making it a strong packing option. It serves various industries such as electronics, automotive, medical, and aerospace.
TOHO ELECTRONICS INC., established in 1963 and headquartered in Kanagawa, Japan, is a manufacturer, designer, and supplier of temperature controllers, sensors, and probe cards for semiconductor testing systems. The company offers a diverse range of products, including the digital controller series, dual-channel controllers, and paperless recorders. These products are utilized for displaying measured data on a liquid crystal display, acting as a communication master to record data values on the slave side, and for washing semiconductors and printed circuit boards.
Fujitsu Components America, Inc. is a global leader in electronics manufacturing services (EMS), providing integrated services and solutions for OEMs and ODMs operating in the automotive, communications, computing, consumer, industrial and medical sectors. Fujitsu Components America’s Products include relays, touch panels, and wireless modules, and input and pointing devices. Fujitsu Component America serves customers across volume spectrums in variable-mix, variable-volume production.
Jenoptik was established in 1991 and is based in Jena, Germany, as a manufacturer of optical technologies with majority of their products and services being provided to the photonics market. The company's products portfolio includes imaging solutions and cameras, laser and laser technology, optics and optical systems, and LiDAR technologies, which are mainly used in industries such as, semiconductor and equipment manufacturing, automotive, medical technology, security and defense technology, and aviation.
Japan Electronic Materials, founded in 1960 in Hyogo, Japan is a manufacturer of Cantilever Type Probe Card (C Type ), Advanced Probe Card (V Type, M Type), various types of cathode, heater and filament for Their products are: heaters and cathodes for receiving tubes, filaments for fluorescent character display tubes, and other products for for displays such as color TV display such as high-definition TV display, computer display, measurement display, and radar display The company has subsidiaries in America, Hong Kong, Taiwan, Europe, Shanghai and Thailand among others.
FICT Limited, established in 2002 and headquartered in Nagano, Japan, is a manufacturer of electronic and optical interconnect products for electronic devices. They offer large semiconductor packaging substrates, multilayer PCBs for ICT infrastructure devices, and high-density HDI PCBs for edge devices such as information and communication equipment. FICT Limited accommodates all stages of development, from board design to prototyping and production. Their products are utilized for connecting various devices ranging from supercomputers to mobile devices, which are essential for various industries, such as in broadcasting and medical industry.
MPI Corporation was established in 1995 and is headquartered in Taiwan, which is a universal technology manufacturer in electronic component devices. MPI's production portfolio contains Light Emitting Diodes, Lasers, semiconductor testing, Photo detectors and many more electronic component equipments and related services. The Organisation mainly operates within five Business Units. Which consists of Probe Card, Photonics Automation, Advanced Semiconductor Test, Thermal Test, and Celadon Systems Divisions. Additionally most products are accompanied with modern calibration and test & measuring software packages. In Taiwan, MPI was the first probe card company which was listed in the Taipei Stock Exchange.
Wentworth Laboratories, Inc., in Sandy, Bedfordshire, founded in 1967, is a manufacturer of performance wafer probe statutes and advanced cantilever probe cards. The wafer probers are analytical, production, and custom probe accessories such as micropositioners, enclosure & tables, control software, wafer chucks, and lasers are produced. The cantilever probe cards are produced with probe car manufacturing equipment. The company also offers metal and ceramic needle holder assemblies. Its products have applications in probe stations in double-sided, high impedance, IGST, and water frame probing.
Hisol Inc., established in 1967 as Kan Electronics, is a manufacturer based in Tokyo, Japan, producing machines for the semiconductor manufacturing process. The company's product range includes standard and compact manual probers and probe system accessories. It also offers prober flip chip bonders, covering desktop types for small-scale or research applications, automatic types for higher volume production, and high-accuracy types for precise chip placement. The company has received numerous awards, including the "Excellent Health Management Corporations 2020" recognition from the Ministry of Economy, Trade and Industry (METI).
Seiken Co. Limited is a manufacturer based in Tokyo, Japan and produces electronic component testing devices. Seiken mainly manufactures two types of contact probes. The first is the Standard type contact probes and it's used for testing printed circuit boards and electronic components. Secondly they produce Double Plunger contact probes which is used in semiconductor testing. In the field of test fixtures they develop Flat Panel lighting inspection units. Flat Panel Display is an electronic viewing technology used in smartphones, cameras and car navigation. In addition their product range also includes semiconductor inspection devices, electronic component inspection gadgets.
STAr Technologies, Inc., established in 2000 and headquartered in Hsinchu City, Taiwan, is a manufacturer and provider of semiconductor test equipment and solutions. Their product range includes parametric test instruments, reliability test systems, automated test equipment (ATE), parametric probe cards, and probe stations. They also offer yield enhancement, professional services, and solutions. These products cater to the needs of the semiconductor industry, enabling manufacturers to test, evaluate, and ensure the quality, and performance of their semiconductor devices. The company also collaborates with distributors in North America, Europe, South Asia Pacific, and Greater China.
FEINMETALL GmbH, founded in 1964 by the Kreidler company and headquartered in Herrenberg, Germany, is a manufacturer and distributor of contact probes, probe cards, and special contacts used in semiconductor, automotive, and electrical industries. The contact probe product segment includes radio frequency, fine pitch, high current, switch, and wire harness probes. The company also manufactures standard components and customer-specific special contacting units such as test heads, test sockets, or interface blocks. FEINMETTAL operates production and subsidiaries in Europe, Asia, and America, including Tunisia, China, Taiwan, the Czech Republic, Mexico, Singapore, and the USA.
Ranking as of December 2024
Derivation Method| Rank | Company | Click Share |
|---|---|---|
| 1 | Accuprobe |
21.7%
|
| 2 | JENOPTIK AG |
11.2%
|
| 3 | STAr |
9.8%
|
| 4 | FICT LIMITED |
9.2%
|
| 5 | JAPAN ELECTRONIC MATERIALS CORPORATION |
7.6%
|
| 6 | Wentworth Laboratories, Inc. |
7.5%
|
| 7 | MPI Corporation |
6.3%
|
| 8 | TOHO ELECTRONICS INC. |
6.2%
|
| 9 | FEINMETALL GmbH |
6.0%
|
| 10 | Seiken Co., Ltd. |
4.3%
|
Derivation Method
The ranking is calculated based on the click share within the probe card page as of December 2024. Click share is defined as the total number of clicks for all companies during the period divided by the number of clicks for each company.Number of Employees
Newly Established Company
Company with a History
*Including some distributors, etc.
*Including some distributors, etc.
| Country | Number of Companies | Share (%) |
|---|---|---|
|
Japan
|
7 | 58.3% |
|
Germany
|
2 | 16.7% |
|
Taiwan
|
2 | 16.7% |
|
United States of America
|
1 | 8.3% |
10 products found
10 products
HiSOL,Inc.
30+ people viewing
Last viewed: 1 day ago
We will design and manufacture probe cards according to your requested specifications. ■Features ・Supports small signal measurement ・Supports hi...
TOTOKU Co., Ltd.
300+ people viewing
Last viewed: 1 day ago
The high-frequency IC measurement jig is an inspection jig that can be directly connected to a measuring machine by directly contacting multiple el...
Kyushu Electron Co., Ltd.
180+ people viewing
Last viewed: 9 hours ago
The "Probe Card Analyzer" is an inspection device that uses image processing and a unique correction method to achieve positioning and measurement ...
OKI Circuit Technology Co.,Ltd.
380+ people viewing
Last viewed: 1 hour ago
･ We provide high -precision and high -rise substrates corresponding to the microscopic and multi -pin of semiconductors. ･ Transmission line simu...
Apollo Wave Co., Ltd.
40+ people viewing
Last viewed: 1 day ago
■Features ・Ideal for high temperature (200℃) and microcurrent measurements. - Compatible with Keysight Technologies 4,060, 4,062, 4,070, 4,080. ・...
Apollo Wave Co., Ltd.
40+ people viewing
Last viewed: 3 hours ago
■Features ・Achieves excellent high frequency characteristics using a coaxial probe ・Excellent high frequency characteristics ・Reducing test cost...
Apollo Wave Co., Ltd.
30+ people viewing
Last viewed: 12 hours ago
■Features ・Supports voltage application of 10kV or more and large current measurement of 200A or more ・Supports 10kV, 200A or more ・Structure to...
Apollo Wave Co., Ltd.
30+ people viewing
Last viewed: 1 day ago
■Features ・Measurement at high temperatures and minute current measurement possible ・Low high temperature・-60～350℃ ・Microcurrent measurement a...
Apollo Wave Co., Ltd.
40+ people viewing
Last viewed: 1 day ago
■Features ・Supports up to about 300 pins ・Multi-take compatible ・Low price and reduced test costs ・Quick delivery
FUJITSU COMPONENT LIMITED
30+ people viewing
Last viewed: 22 hours ago
Very Fast Response
