This section provides overview, applications, and principles of wavelength meters. Also, please take a look at the list of 2 wavelength meter manufacturers and their company rankings.
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A wavelength meter is a device for measuring the wavelength of light. It is almost the same as an optical spectrum analyzer in that it measures the wavelength of light. Still, in general, it is characterized by its high sensitivity due to its narrow measurement range.
The results obtained with wavelength meters are the wavelength of light in a vacuum, and there is a discrepancy of about 0.03% in the refractive index of air from the wavelength observed in the air.
Also, optical spectrum analyzers have various built-in functions for versatility, but wavelength meters have minimal functions, making them inexpensive.
Wavelength meters are used when higher precision is required to characterize optical components.
For example, they are used to accurately measure the wavelength characteristics of light sources with narrow bandwidths, such as lasers and LEDs.
It is also used to evaluate the wavelength characteristics of light used in optical fiber communications.
Since they were originally often used to measure the wavelength of light used in optical communications, many of them have a range set to measure light from 1000 to 1800 nm.
Wavelength meters use a Fizeau interferometer or Michelson interferometer to measure wavelength characteristics.
The one using a Fizeau interferometer is a very simple optical system consisting of a collimator lens, a glass plate called a reference plane, and a measurement mirror.
Light incident on the Fizeau interferometer is collimated by the collimator lens and then partially reflected as it passes through the reference plane. The light passing through the reference plane is reflected by the measurement mirror and interferes with the light reflected by the reference plane, forming a stripe-like pattern. These interference fringes are unique to the wavelength of the light and the optical path difference of the interfering light.
Since the distance between the reference plane and the measurement mirror (optical path difference) is known, the wavelength can be calculated from the interference fringe pattern. In the one using Michelson interferometry, the incident light is divided into two beams by a beam splitter, and changes in the intensity of the interfering light are measured by changing the optical path difference in various ways. By inverse Fourier transforming this light, the light spectrum can be calculated.
*Including some distributors, etc.
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