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This section provides an overview for kelvin probes as well as their applications and principles. Also, please take a look at the list of 7 kelvin probe manufacturers and their company rankings. Here are the top-ranked kelvin probe companies as of April, 2025: 1.Tokyo Instruments, Inc, 2.KP Technology, 3.Bruker Corporation.
Table of Contents
A Kelvin Probe is a technique for measuring work function and is one of the measurement methods of microscopy.
A metal probe is placed close to the sample surface and the contact potential difference resulting from the difference in work function between the sample and the probe is measured. By using a probe with a known work function, it is possible to determine the work function of the sample surface.
The work function of a sample surface varies depending on the quality of the thin film and the presence of impurities. In solar cells and sensors, thin film quality and higher-order structure can affect device characteristics.
By measuring thin films deposited under various conditions using the Kelvin Probe method, it is possible to analyze the correlation between film structure and properties.
Kelvin Probe measurements are often used for metallic and semiconductor materials. Kelvin Probe measurements are used in silicon solar cells, organic thin film solar cells, organic EL, and electrode surface analysis.
The Kelvin Probe makes it possible to map the work function of the surface, which is then analyzed in conjunction with images of the surface measured with a microscope.
Mapping the work function using the Kelvin Probe method also makes it possible to identify corroded areas of metals. Since the work function changes at locations where chemical changes such as corrosion have occurred, it is possible to map where unexpected reactions have occurred in the sample.
Kelvin Probe is a measurement technique based on Atomic Force Microscopy (AFM) and has a spatial resolution on the order of micrometers. Kelvin Probe is a technique in which a metal probe is brought into contact with the sample surface.
When the probe contacts the sample surface, electron transfer occurs and the Fermi level changes, resulting in a change in the potential of the sample surface. Since the amount of this potential change depends on the work function of the probe and the sample, the work function of the sample surface can be determined by using a probe with a known work function.
By bringing the probe into contact with the entire sample, it is possible to map the work function within the thin film, and the change in work function can be used to identify areas where corrosion or film quality changes are occurring.
The Kelvin Probe method allows non-destructive measurement of samples. Both organic and inorganic thin films can be measured.
Therefore, it is sometimes used to measure the work function of each layer in the cross section of a multilayer film, or to measure the work function during the thin film growth process. In addition, it is often used for basic physical chemistry research, such as analyzing chemical reactions that occur on catalyst surfaces based on changes in surface work functions.
The work function is the minimum energy required to extract electrons out of a solid. Electrons are numerous in a solid and range from the vacuum level, which has the lowest kinetic energy, to successively higher energies. The uppermost level corresponds to the Fermi level, and the difference between this vacuum level and the Fermi level is the work function.
Devices such as discharge electrodes and plasma display panels need to extract electrons from the inside of solids, and the work function plays an important role. Work function is a key word for electronic devices.
Electrons in matter have various energies depending on their temperature. The Fermi-Dirac distribution function represents the probability of occupying an energy level that an electron has at a given temperature. The energy level with an occupancy probability of 0.5 is called the Fermi level.
The energy levels of electrons in a single atom are discrete, whereas in an object consisting of multiple atoms, there is a wide range of energy levels that electrons can occupy. Because of this limitation on the energy levels an electron can have, the structure of the Fermi level and the energy levels is what distinguishes conductors, semiconductors, and insulators.
*Including some distributors, etc.
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Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific instruments and analytical and diagnostic solutions. The company's product range includes analyzers, microscopes, and imaging solutions, which have applications in fields such as life science research, cell biology, and microbiology. In 1969, the company developed the world's first FT-NMR spectrometer system, enabling broadband proton decoupling. In 1997, it further expanded its capabilities by acquiring the analytical X-ray division of Siemens AG. The company holds ISO 9001 and ISO 13485 certifications, and its products are available for sale worldwide.
Hitachi High Tech was established in April 1947 and operates in 26 countries with products and services ranging from semiconductor manufacturing equipment and Medical and Biosystems to Analytical Systems and Manufacturing related equipment and solutions. A unique state-of-the-art technology company with two functions as a manufacturer and a trading company with the motto of "Tackling social issues," the Hitachi High-Tech Group aspires to be a company that pursues not only economic value, such as revenue and profit, but also provides social and environmental value by contributing to resolving social issues through its business activities, including products and services. They also provide one-stop services, such as evaluations and analysis at a global level.
Zurich Instruments AG, founded in Zurich, Switzerland, in 2008 is a manufacturer of test and measurement equipment. The company's product portfolio includes quantum computing control systems, lock-in amplifiers, arbitrary waveform generators, impedance analyzers, and phase-locked loops. Their products are used in markets such as Automotive and Transportation, Telecommunications, Industrial Automation, Healthcare and Medical Devices and Aerospace and Defense. The company also offers customer services that include support, custom research projects and customized services.
Seiken Co. Limited is a manufacturer based in Tokyo, Japan and produces electronic component testing devices. Seiken mainly manufactures two types of contact probes. The first is the Standard type contact probes and it's used for testing printed circuit boards and electronic components. Secondly they produce Double Plunger contact probes which is used in semiconductor testing. In the field of test fixtures they develop Flat Panel lighting inspection units. Flat Panel Display is an electronic viewing technology used in smartphones, cameras and car navigation. In addition their product range also includes semiconductor inspection devices, electronic component inspection gadgets.
Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-electronics products and systems. The company offers a wide range of products, including laser processing machines, aligning systems, photodetectors, analyzers for photoelectron spectroscopy, and spectroscopy array detectors. Also offered are high-speed, high-sensitivity cameras in UV to IR, and photon detectors or counters. The company's product families consist of the Nanofinder series of 3D Laser Raman Microspectroscopy systems and the iDus Workhorse laboratory and OEM CCD platform for low-light spectroscopy.
Ranking as of April 2025
Derivation Method| Rank | Company | Click Share |
|---|---|---|
| 1 | Tokyo Instruments, Inc |
27.8%
|
| 2 | KP Technology |
22.2%
|
| 3 | Bruker Corporation |
19.4%
|
| 4 | AZoNetwork |
8.3%
|
| 5 | Zurich Instruments AG |
8.3%
|
| 6 | Seiken Co., Ltd. |
8.3%
|
| 7 | Hitachi High-Tech America, Inc. |
5.6%
|
Derivation Method
The ranking is calculated based on the click share within the kelvin probe page as of April 2025. Click share is defined as the total number of clicks for all companies during the period divided by the number of clicks for each company.Number of Employees
Newly Established Company
Company with a History
*Including some distributors, etc.
*Including some distributors, etc.
| Country | Number of Companies | Share (%) |
|---|---|---|
|
United States of America
|
2 | 28.6% |
|
Japan
|
2 | 28.6% |
|
United Kingdom
|
2 | 28.6% |
|
Switzerland
|
1 | 14.3% |
44 products found
44 products
Bruker Corporation
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■Dimension series Bruker's Dimension Icon® atomic force microscopy (AFM) system provides the highest performance, functionality, and productivity f...
8 models listed
Park Systems Japan Co., Ltd.
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■Next-generation technology to accelerate research and development ・Adopts the first dual camera system in research AFM history ・Automatic optimi...
Bruker Corporation
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Atomic force microscope (material AFM) small platform.
3 models listed
Park Systems Japan Co., Ltd.
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Park NX10 provides reliable data at the highest nanoscale resolution. It can be easily operated at every stage, from sample setting to imaging, mea...
Hokkai Photoelectronics Co., Ltd.
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■TOF-e type work function measuring device Achieving electron time-of-flight measurement following TOF-MS ■Summary Acquisition of basic properties...
Bruker Corporation
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Atomic force microscope for life sciences JPK Bio AFM ■Scanner It has a scan range of up to 15um in the Z direction, which is sufficient for cell ...
6 models listed
Bruker Corporation
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■Cell mechanics research tool Optical tweezers Quantification of molecular, cellular, and microrheological processes: Dual beam force detection opt...
2 models listed
Oxford Instruments Ltd.
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■Nanoscale surface observation WITec's alpha300A atomic force microscope is a reliable, high-quality nanoscale imaging system integrated into a res...
SANKO ELECTRONIC LABORATORY CO.,LTD
320+ people viewing
Last viewed: 3 hours ago
■ Features ・ 4 Executive probe (Kelvin type) is adopted. Double -sided substrates and multi -layered substrates can be measured without being affe...
Bruker Corporation
340+ people viewing
Last viewed: 52 minutes ago
■AutoAFM (fully automatic atomic force microscope) for photomasks Insight AFP PM is a fully automated atomic force microscope for photomasks. The b...
Bruker Corporation
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AutoAFM (large automatic atomic force microscope). ■Large AutoAFM (automatic atomic force microscope) compatible with 300mm wafers InSight AFP AAF...
Oxford Instruments Ltd.
490+ people viewing
Last viewed: 19 hours ago
■Features Cypher S - the base model of the Cypher AFM family with ultra-high resolution, fast scanning, and a complete set of operating modes ・Cyp...
4 models listed
Oxford Instruments Ltd.
540+ people viewing
Last viewed: 8 hours ago
■Summary The MFP-3D AFM/SPM atomic force microscope family is suitable for a wide range of budgets, capable of measuring large sample sizes, and ha...
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Oxford Instruments Ltd.
350+ people viewing
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■Summary Jupiter XR is an atomic force microscope (AFM/SPM) that can handle large samples, and is an AFM with excellent basic performance that comb...
Tokyo Instruments, Inc
190+ people viewing
Last viewed: 6 hours ago
■Summary This is a work function/surface potential mapping device developed by KP Techonology, a long-established manufacturer of Kelvin probes in ...
Tokyo Instruments, Inc
130+ people viewing
Last viewed: 3 hours ago
■Summary Kelvin probe (KP) compatible with ultra-high vacuum (UHV) environments. Work function and surface potential can be measured by connecting ...
Tokyo Instruments, Inc
150+ people viewing
Last viewed: 4 hours ago
■Summary Measures work function and ionization potential in the atmosphere without contact. Excitation light (3.4-7eV) is irradiated and photoelect...
Toyo Electronics Giken Co., Ltd.
180+ people viewing
Last viewed: 3 hours ago
■Summary A socket that enables Kelvin measurement using a coaxial 4-terminal probe.
Tokyo Instruments, Inc
140+ people viewing
Last viewed: 3 hours ago
■Summary Highly sensitive real-time monitoring of changes in surface potential and work function of metals, etc. in situ while controlling the samp...
