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Bruker Corporation's X-Ray Diffractometers

Bruker Corporation

3 products found

XRD device QC3 / QC-Velox for production control of compound semiconductor composition and film thickness-Bruker Corporation

Bruker Corporation

XRD device QC3 / QC-Velox for production control of compound semiconductor composition and film thickness

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Last viewed: 3 hours ago

■XRD equipment for quality control of compound semiconductors The Bruker QC3/QC-Velox instrument is designed specifically as an industrial XRD inst...


X-ray topography device JV QC-TT that detects crystal defects in wafers-Bruker Corporation

Bruker Corporation

X-ray topography device JV QC-TT that detects crystal defects in wafers

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Last viewed: 1 day ago

■Crystal defect visualization device/X-ray topography The Bruker JV QCTT instrument is a comprehensive solution that provides crystal defect inspec...


Fully automatic/multipurpose XRD device for thin film analysis JV-DX-Bruker Corporation

Bruker Corporation

Fully automatic/multipurpose XRD device for thin film analysis JV-DX

360+ people viewing

Last viewed: 1 day ago

■Fully automatic/multipurpose XRD device for thin film analysis The Bruker JV-DX instrument is the latest instrument that can fully automate all me...



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