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XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers-Test Wake Ha-N type 150mm SCL
XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers-Tours Co., Ltd.

XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers
Tours Co., Ltd.

Tours Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

0.8hours

Very Fast Response


About This Product

■ XCSW

XCSW is a compound semiconductor material company founded in Amoi, China in 1990. On the Ⅲ-al, in, as, p based on the Ⅲ-ⅴ tribe silicopop N-type semiconductor, the first generation GE wafer and the second generation gallium linery have been developed a substrate growth epitrical technology. Currently, MBE or MOCVD handles LED, SIC and GAN for power devices.

■ Test dummy monitor Prime Waeha Si board

・ Dummyweha (regeneration wafer) It is mainly used for experiments and exams. For improving and confirming the safety of the early stage of the manufacturing process. It is called Testweha in the match wafer and dummy wehiha. ・ Monitorwayha Waha is used for adjustment for each manufacturing process. It is used as a surveillance purpose as a substitute for the device tolerance error for the thickness of the board, and as a substitute for the SI wafer before the production.

  • Product

    XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers

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2 Models of XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Wafer size thickness Direction Crystal development method Dopant Density Resistance value Radial ratio resistance change amount Parallelity Primary flat Front Particle (MAX) Scratch, chips, peel, etc. Back inch Polishing surface Substrate thickness Ratio resistance particle
XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers-Part Number-Test Wake Ha-N type 150mm SCL

Test Wake Ha-N type 150mm SCL

Available upon quote

150 ± 0.5mm

675 ± 25um

<100> ± 2 °

(1-100) cz

Rin (P)

<5,000/cm²

4 ~ 7ohm.cm

15%

Bow (Max): 60um
TIR (MAX): 6um
TAPER (Max): 12um
Warp (Max): 60um

Length: 57.5 ± 2.5mm
Valcourgance: (110) ± 2 ° SEMI compliant
Secondary flat: SEMI compliant

Mirror polishing

≧ 0.3um, 30

none

Etched

- - - - -
XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers-Part Number-Monitor/Dummy SI Waeha

Monitor/Dummy SI Waeha

Available upon quote - -

4 inches: (100) or (111)
6-12 inches: -100

- - - - - - - - - - -

4-12

4 ~ 8 inches: one side
12 inches: double -sided

250 ~ 775UM

0 ~ 100

4 ~ 8 inches: 0.2um ≦ 30 pieces
12 inches: 0.09um ≦ 100 pieces

Click on the part number for more information about each product

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About Company Handling This Product

Response Rate

100.0%


Response Time

0.8hrs


Company Review

5.0
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