XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers-Tours Co., Ltd.

Monitor/Dummy SI Waeha | XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers
Tours Co., Ltd.


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Crystal development method

Density

Direction

Dopant

Front

Parallelity

Particle (MAX)

Primary flat

Radial ratio resistance change amount

Resistance value

Scratch, chips, peel, etc.

Wafer size

thickness

Polishing surface

Ratio resistance

Substrate thickness

inch

particle

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  • Part Number

    Monitor/Dummy SI Waeha




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XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers Monitor/Dummy SI Waeha's performance table

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Product Image Price (excluding tax) Direction Polishing surface Ratio resistance Substrate thickness inch particle
XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers-Part Number-Monitor/Dummy SI Waeha Available upon quote 4 inches: (100) or (111) 6-12 inches: -100 4 ~ 8 inches: one side 12 inches: double -sided 0 ~ 100 250 ~ 775UM 4-12 4 ~ 8 inches: 0.2um ≦ 30 pieces 12 inches: 0.09um ≦ 100 pieces

There are 2 models for this product.

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About Company Handling This Product

Tours Co., Ltd.

  • Japan
  • Since 2016
  • 2 employees

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