XCSW compounds / semiconductor crystals CZ method Siliconweha-CZ-Si
XCSW compounds / semiconductor crystals CZ method Siliconweha-Tours Co., Ltd.

XCSW compounds / semiconductor crystals CZ method Siliconweha
Tours Co., Ltd.


About This Product

■ XCSW XCSW is a compound semiconductor material company founded in Amoi, China in 1990. On the Ⅲ-al, in, as, p based on the Ⅲ-ⅴ tribe silicopop N-type semiconductor, the first generation GE wafer and the second generation gallium linery have been developed a substrate growth epitrical technology. Currently, MBE or MOCVD handles LED, SIC and GAN for power devices. ■ Characteristics ・ CZ method silicon, which can select a dope concentration, is used for IC chips, diodes, solar cell panels, etc. By dope of galium and germanium, it is also used as a high -efficiency, radioactivity and remedy -resistant solar cell material. ・ The SI wafer produced by the CZ development method can be used by either N type P type, and it is possible to provide low -resistance SI wafers by doping high concentration. The face direction <110> is noticed as a new generation SI wafer.

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    XCSW compounds / semiconductor crystals CZ method Siliconweha




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3 Models of XCSW compounds / semiconductor crystals CZ method Siliconweha

Items marked with have different values ​​depending on the model number.

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Product Image Part Number Price (excluding tax) BOW Back Chipping Conductive Direction LPD Primary flat length Primary flat oriented Resistance value (Ω ・ cm) Secondary flat direction Secondary flat length Surface finishing TTV Training method Warp diameter thickness φ diameter (inch)
XCSW compounds / semiconductor crystals CZ method Siliconweha-Part Number-CZ-Si

CZ-Si

Available upon quote ≦ 40um Etched none N or p <100>, <110>, <111> ≧ 0.3um at ≦ 15pcs 57.5 ± 2.5mm <001> ± 1 ° > 1 ~ 300 none none Chemical mechanical polishing ≦ 5 um Cz ≦ 40um 76.2 ~ 200mm 160 or more 3 ~ 8
XCSW compounds / semiconductor crystals CZ method Siliconweha-Part Number-MCZ-SI

MCZ-SI

Available upon quote ≦ 40um Etched none N or p <100>, <110>, <111> ≧ 0.3um at ≦ 15pcs 57.5 ± 2.5mm <001> ± 1 ° > 1 ~ 300 none none Chemical mechanical polishing ≦ 5 um Mcz ≦ 40um 76.2 ~ 200mm 160 or more 3 ~ 8
XCSW compounds / semiconductor crystals CZ method Siliconweha-Part Number-High concentration CZ-Si

High concentration CZ-Si

Available upon quote ≦ 40um Etched none N or p <100>, <110>, <111> ≧ 0.3um at ≦ 15pcs 57.5 ± 2.5mm <001> ± 1 ° > 0.001 ~ 1 none none Chemical mechanical polishing ≦ 5 um High concentration CZ ≦ 40um 76.2 ~ 200mm 160 or more 3 ~ 8

Click on the part number for more information about each product

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About Company Handling This Product

Tours Co., Ltd.

  • Japan
  • Since 2016
  • 2 employees

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