Test Wake Ha-N type 150mm SCL | XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers
Tours Co., Ltd.
Price (excluding tax)
Model Filter
You can search for other models from each index. The displayed value is the value of the currently selected part number.
Back
Crystal development method
Density
Direction
Dopant
Front
Parallelity
Particle (MAX)
Primary flat
Radial ratio resistance change amount
Resistance value
Scratch, chips, peel, etc.
Wafer size
thickness
Polishing surface
Ratio resistance
Substrate thickness
inch
particle
-
Part Number
Test Wake Ha-N type 150mm SCL
-
Handling Company
Tours Co., Ltd.
XCSW compounds / semiconductor crystal SI crystal substrates, silicon wafers Test Wake Ha-N type 150mm SCL's performance table
Items marked with have different values depending on the model number.
| Product Image | Price (excluding tax) | Back | Crystal development method | Density | Direction | Dopant | Front | Parallelity | Particle (MAX) | Primary flat | Radial ratio resistance change amount | Resistance value | Scratch, chips, peel, etc. | Wafer size | thickness |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
Available upon quote | Etched | (1-100) cz | <5,000/cm² | <100> ± 2 ° | Rin (P) | Mirror polishing | Bow (Max): 60um TIR (MAX): 6um TAPER (Max): 12um Warp (Max): 60um | ≧ 0.3um, 30 | Length: 57.5 ± 2.5mm Valcourgance: (110) ± 2 ° SEMI compliant Secondary flat: SEMI compliant | 15% | 4 ~ 7ohm.cm | none | 150 ± 0.5mm | 675 ± 25um |
There are 2 models for this product.
Customers who viewed this product also viewed
Other products of Tours Co., Ltd.
View more products of Tours Co., Ltd.
About Company Handling This Product
- Japan
- Since 2016
- 2 employees