Ageing storage reliability test device series in high -speed pulse drive state
System Giken Co., Ltd.

About This Product

■ Characteristics-Acaving a 400nm and 660nm Can-Type LD with 1 wavelength in a high-speed pulse drive state.
・ The output light of the LD is applied to the sample hold APC to monitor the overtime change.
・ It can be added in 60ch units.

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Ageing storage reliability test device series in high -speed pulse drive state

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System Giken Co., Ltd.

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About Company Handling This Product

System Giken Co., Ltd.

Japan

Ageing storage reliability test device series in high -speed pulse drive state System Giken Co., Ltd.

About This Product

■ Characteristics

0 Models of Ageing storage reliability test device series in high -speed pulse drive state

Other products of System Giken Co., Ltd.

About Company Handling This Product

Ageing storage reliability test device series in high -speed pulse drive state
System Giken Co., Ltd.