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  2. Ageing storage reliability test device series in high -speed pulse drive state (System Giken Co., Ltd.)

Ageing storage reliability test device series in high -speed pulse drive state
System Giken Co., Ltd.

System Giken Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.2hours

Company Review

5.0

Relatively Fast Response

About This Product

■ Characteristics

-Acaving a 400nm and 660nm Can-Type LD with 1 wavelength in a high-speed pulse drive state. ・ The output light of the LD is applied to the sample hold APC to monitor the overtime change. ・ It can be added in 60ch units.

  • Product

    Ageing storage reliability test device series in high -speed pulse drive state

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About Company Handling This Product

System Giken Co., Ltd.

Response Rate

100.0%

Response Time

26.2hrs

Company Review

5.0
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