Laser diode high -speed pulse drive storage characteristic evaluation device series
System Giken Co., Ltd.
About This Product
A device that measures the laser diode by driving a high-speed pulse to measure the I-L and i-VF characteristics. The kink characteristics of I-L in pulse modulation that cannot be obtained with CW can be measured to the 30 ns short pulse width area. The obtained data is displayed on Windows and is processed. In addition, measurements such as beam profiler, polarized characteristics and FFP are possible by customization of the measurement stage.
This device mainly gets the characteristics evaluation data of the storage short wavelength semiconductor laser diode 5.6φ, 3.8φcan module. Measurement items are 1) i-L-V, 2) FFP, 3) Polarized characteristics, 4) Returning light noise characteristics, etc., and data can be obtained by combining them. (Example: I-L curve comparison data due to variable polarized angle)
■ Main use
・ Evaluation device for LD acceptance inspection by pickup development
・ Quality inspection curve tracer
・ Power school correct reference instrument
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Product
Laser diode high -speed pulse drive storage characteristic evaluation device series
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Handling Company
System Giken Co., Ltd.
1 Models of Laser diode high -speed pulse drive storage characteristic evaluation device series
| Product Image | Part Number | Price (excluding tax) | Target device | Temperature control ability | Wavelength band | pulse width |
|---|---|---|---|---|---|---|
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SEC-PL4000-800 |
Available upon quote | Can, Flame-LD | -40 ~ + 90 ° C | 400 ~ 1,000nm0 ~ ± 9V | 30ns ~ 50μs (i-L measurement possible), 5 ~ 20NS (i-L measurement is not possible) |
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About Company Handling This Product
- Japan
- Since 1968
- 30 employees