Intellectual credit semiconductor laser characteristic evaluation device series
System Giken Co., Ltd.
About This Product
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Product
Intellectual credit semiconductor laser characteristic evaluation device series
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Handling Company
System Giken Co., Ltd.
4 Models of Intellectual credit semiconductor laser characteristic evaluation device series
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | Drive ability | Drive system | Interface | Pulse settings decomposition ability | Synchronization | Target device | pulse width | wavelength |
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CAN_LD 320ch temperature/DC characteristic automatic evaluation device |
Available upon quote | - | - | - | - | - | φ3.8, 5.6 Can LD | - | 405 ~ 900Nm, 1,100 ~ 1,550nm |
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Butterfly LD temperature characteristic test device |
Available upon quote | - | - | - | - | - | - | - | - |
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Tabletop CW I-L tester SEC-4000BGPIB/USB |
Available upon quote | 0 ~ ± 200ma 0 ~ ± 9V, 0 ~ ± 1A 0 ~ ± 5V | CW ACC (manual APC possible) | GPIB, USB | - | - | - | - | - |
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CW/Pulse i-L tester SEC-7000 |
Available upon quote | 0 ± 250mA/± 7.5Vmax, 0 ± 500mA/± 7.5Vmax | CW/Pulse ACC | - | 100nsec | 1μs ~ 1.6ms | - | 0 ~ ± 1A 0 ~ ± 5V | - |
Click on the part number for more information about each product
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About Company Handling This Product
- Japan
- Since 1968
- 30 employees