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  2. Ageing storage reliability test device series in high -speed pulse drive state (System Giken Co., Ltd.)


Ageing storage reliability test device series in high -speed pulse drive state-SEPA-120B
Ageing storage reliability test device series in high -speed pulse drive state-System Giken Co., Ltd.

Ageing storage reliability test device series in high -speed pulse drive state
System Giken Co., Ltd.

About This Product

■ Characteristics -Acaving a 400nm and 660nm Can-Type LD with 1 wavelength in a high-speed pulse drive state. ・ The output light of the LD is applied to the sample hold APC to monitor the overtime change. ・ It can be added in 60ch units.

  • Product

    Ageing storage reliability test device series in high -speed pulse drive state



*Please note that we may not be able to accommodate sample requests.

1 Models of Ageing storage reliability test device series in high -speed pulse drive state

Product Image Part Number Price (excluding tax)
Ageing storage reliability test device series in high -speed pulse drive state-Part Number-SEPA-120B

SEPA-120B

Available upon quote

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About Company Handling This Product

System Giken Co., Ltd.

  • Japan
  • Since 1968
  • 30 employees

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