Photonics device characteristics evaluation/reliability test equipment series photodiode aging tester-Photo diode aging tester
Photonics device characteristics evaluation/reliability test equipment series photodiode aging tester-System Giken Co., Ltd.

Photonics device characteristics evaluation/reliability test equipment series photodiode aging tester
System Giken Co., Ltd.


About This Product

In the tray implemented in the tray in a constant temperature, the reverse bias is applied to irradiate laser light to collect diode characteristics. It is a perfect exposure test device for R & D.

  • Product

    Photonics device characteristics evaluation/reliability test equipment series photodiode aging tester




*Please note that we may not be able to accommodate sample requests.

1 Models of Photonics device characteristics evaluation/reliability test equipment series photodiode aging tester

Product Image Part Number Price (excluding tax)
Photonics device characteristics evaluation/reliability test equipment series photodiode aging tester-Part Number-Photo diode aging tester

Photo diode aging tester

Available upon quote

Other products of System Giken Co., Ltd.


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About Company Handling This Product

System Giken Co., Ltd.

  • Japan
  • Since 1968
  • 30 employees

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