Two ions with SEM ion milling device MODEL 1061 SEM MILL-Model 1061

Two ions with SEM ion milling device MODEL 1061 SEM MILL
Musashino Denshi, INC.

About This Product

It is an ion milling device for creating a sample for high quality SEM. You can execute the optimal ion milling for all samples and all uses.

■ Features
・ MODEL 1061 SEM MILL is an ionized device for creating samples for high -quality scanning electron microscopes (SEM) without damage.
・ Equipped with two ion sources, high -speed milling from two directions is possible.
・ Equipped with an automatic detection function of the sample position, the stage position is automatically adjusted for the sample of all heights.
-If you use an optional cross -sectional sample loading station, you can accurately align the milling position and the shielding mask, so you can create a high -quality cross -sectional sample.
・ The feature is that the beam diameter can be adjusted by adjusting the focus, and the optimal ion milling can be performed for all samples and all uses.

E.A. Fiscency Instruments, Inc. device, which builds a sample using conventional technologies such as dimming polishing, ultrasonic disccuts, and producing a sample without damage from the concentrated ion beam. 。 Also, by removing only organic substances from the sample and holder from the sample and holder, the optimal environment for TEM and SEM electron microscope observation is realized by removing only organic substances.

Model
There are 1 models for this product.

Product
Two ions with SEM ion milling device MODEL 1061 SEM MILL

Handling Company
Musashino Denshi, INC.

*Please note that we may not be able to accommodate sample requests.

1 Models of Two ions with SEM ion milling device MODEL 1061 SEM MILL

Product Image	Part Number	Price (excluding tax)	Angle setting	Automatic stop	Body dimensions	Body weight	Ion source	Microscope (option)	Observation imaging	Process gas	Roading station for cross section samples (optional)	Sample holder	Sample stage	Temple cooling (optional)	UI	Vacuum / inert gas enclosed migration capsule (optional)	Vacuum system	Warranty period	illumination	power supply
	Model 1061	Available upon quote	・ Individual control of the acceleration voltage of the left and right ion source ・ The beam diameter is variable	Control by timer, temperature, laser detection (optional)	W660mm x D520mm x H330mm W660mm x D520mm x H620mm (including substance microscope)	73kg	・ Equipped with two TrueFocus ion source (variable beam diameter) ・ Acceleration voltage (100EV ~ 10KEV) ・ Beam current density (~ 10ma/cm2) ・ Milling angle (0 ° ~+10 °)	・ The following microscope can be mounted at the top of the road rock ・ 7 ~ 45 × Enterprise microscope ・ 1,960 × High magnification digital microscope	・ The sample in the milling position can be observed by the substance microscope (7 to 45 times) or the high -magnification digital microscope (1960 times) ・ The shutter is automatically opened and closed and the observation window is prevented from getting dirty due to smoothing.	・ Argon gas (99.999%) Supply gas pressure 15PSI ・ Automatic flow control by two mass flow controllers	・ Holder for plane milling ・ Rolling sample holder ・ Service sample holder (optional)	・ Holder for plane milling ・ Rolling sample holder ・ Service sample holder (optional)	・ Sample size ・ Cross section sample Maximum: 10mm x 10mm x 4mm Minimum: 3mm x 3mm x 0.7mm, plane sample	Cooling up to -170 ° C is possible with liquid nitrogen Select from the following two types of dwar size ・ Standard type: 3 to 5 hours cooling ・ Long -hour type: Cooling for 18 hours or more	・ 10 -inch touch panel ・ Signal tower (optional)	Moving or storage of samples in vacuum or inert gas	・ Exhaust mechanism due to turbo molecular pump and diamond fram pump (oil -free) ・ Vacal measurement by cold cathode and full range gauge	1 year	Equipped with two lighting, the upper part of the sample (reflective lighting) and the bottom of the sample (transparent lighting)	100VAC 50/60Hz 720W