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Two ions with SEM ion milling device MODEL 1061 SEM MILLHandling Company
Musashino Denshi, INC.Image | Part Number | Price (excluding tax) | Body dimensions | Body weight | Ion source | Angle setting | Sample holder | Sample stage | Roading station for cross section samples (optional) | Temple cooling (optional) | illumination | Automatic stop | Vacuum system | Process gas | UI | Microscope (option) | Observation imaging | Vacuum / inert gas enclosed migration capsule (optional) | power supply | Warranty period |
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Model 1061 |
Available upon quote |
W660mm x D520mm x H330mm |
73kg |
・ Equipped with two TrueFocus ion source (variable beam diameter) |
・ Individual control of the acceleration voltage of the left and right ion source |
・ Holder for plane milling |
・ Sample size |
・ Holder for plane milling |
Cooling up to -170 ° C is possible with liquid nitrogen |
Equipped with two lighting, the upper part of the sample (reflective lighting) and the bottom of the sample (transparent lighting) |
Control by timer, temperature, laser detection (optional) |
・ Exhaust mechanism due to turbo molecular pump and diamond fram pump (oil -free) |
・ Argon gas (99.999%) Supply gas pressure 15PSI |
・ 10 -inch touch panel |
・ The following microscope can be mounted at the top of the road rock |
・ The sample in the milling position can be observed by the substance microscope (7 to 45 times) or the high -magnification digital microscope (1960 times) |
Moving or storage of samples in vacuum or inert gas |
100VAC 50/60Hz 720W |
1 year |
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