All Categories

History

Two ions with SEM ion milling device MODEL 1061 SEM MILL-Model 1061
Two ions with SEM ion milling device MODEL 1061 SEM MILL-Musashino Denshi, INC.

Two ions with SEM ion milling device MODEL 1061 SEM MILL
Musashino Denshi, INC.


About This Product

It is an ion milling device for creating a sample for high quality SEM. You can execute the optimal ion milling for all samples and all uses.

■ Features

・ MODEL 1061 SEM MILL is an ionized device for creating samples for high -quality scanning electron microscopes (SEM) without damage. ・ Equipped with two ion sources, high -speed milling from two directions is possible. ・ Equipped with an automatic detection function of the sample position, the stage position is automatically adjusted for the sample of all heights. -If you use an optional cross -sectional sample loading station, you can accurately align the milling position and the shielding mask, so you can create a high -quality cross -sectional sample. ・ The feature is that the beam diameter can be adjusted by adjusting the focus, and the optimal ion milling can be performed for all samples and all uses. E.A. Fiscency Instruments, Inc. device, which builds a sample using conventional technologies such as dimming polishing, ultrasonic disccuts, and producing a sample without damage from the concentrated ion beam. 。 Also, by removing only organic substances from the sample and holder from the sample and holder, the optimal environment for TEM and SEM electron microscope observation is realized by removing only organic substances.

  • Product

    Two ions with SEM ion milling device MODEL 1061 SEM MILL

Share this product


200+ people viewing

Last viewed: 20 hours ago


Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of Two ions with SEM ion milling device MODEL 1061 SEM MILL

Image Part Number Price (excluding tax) Body dimensions Body weight Ion source Angle setting Sample holder Sample stage Roading station for cross section samples (optional) Temple cooling (optional) illumination Automatic stop Vacuum system Process gas UI Microscope (option) Observation imaging Vacuum / inert gas enclosed migration capsule (optional) power supply Warranty period
Two ions with SEM ion milling device MODEL 1061 SEM MILL-Part Number-Model 1061

Model 1061

Available upon quote

W660mm x D520mm x H330mm
W660mm x D520mm x H620mm (including substance microscope)

73kg

・ Equipped with two TrueFocus ion source (variable beam diameter)
・ Acceleration voltage (100EV ~ 10KEV)
・ Beam current density (~ 10ma/cm2)
・ Milling angle (0 ° ~+10 °)

・ Individual control of the acceleration voltage of the left and right ion source
・ The beam diameter is variable

・ Holder for plane milling
・ Rolling sample holder
・ Service sample holder (optional)

・ Sample size
・ Cross section sample
Maximum: 10mm x 10mm x 4mm
Minimum: 3mm x 3mm x 0.7mm, plane sample

・ Holder for plane milling
・ Rolling sample holder
・ Service sample holder (optional)

Cooling up to -170 ° C is possible with liquid nitrogen
Select from the following two types of dwar size
・ Standard type: 3 to 5 hours cooling
・ Long -hour type: Cooling for 18 hours or more

Equipped with two lighting, the upper part of the sample (reflective lighting) and the bottom of the sample (transparent lighting)

Control by timer, temperature, laser detection (optional)

・ Exhaust mechanism due to turbo molecular pump and diamond fram pump (oil -free)
・ Vacal measurement by cold cathode and full range gauge

・ Argon gas (99.999%) Supply gas pressure 15PSI
・ Automatic flow control by two mass flow controllers

・ 10 -inch touch panel
・ Signal tower (optional)

・ The following microscope can be mounted at the top of the road rock
・ 7 ~ 45 × Enterprise microscope
・ 1,960 × High magnification digital microscope

・ The sample in the milling position can be observed by the substance microscope (7 to 45 times) or the high -magnification digital microscope (1960 times)
・ The shutter is automatically opened and closed and the observation window is prevented from getting dirty due to smoothing.

Moving or storage of samples in vacuum or inert gas

100VAC 50/60Hz 720W

1 year

Other products of Musashino Denshi, INC.

Reviews shown here are reviews of companies.


View more products of Musashino Denshi, INC.

About Company Handling This Product

Company Overview

Musashino Denshi, INC., established in 1977 and based in Japan, is a manufacturer of grinding and polishing ma...

See More

  • Japan

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree