Ion milling device for TEM MODEL 1051 TEM MILL
Musashino Denshi, INC.
About This Product
It is an ion milling device for creating a sample for high quality TEM. You can execute the optimal ion milling for all samples and all uses.
■ Features
・ MODEL 1051 TEM MILL is an ion milling device for making samples for high -quality transparent electron microscopes (TEM) without damage.
・ Patent technology TrueFocus ion source maintains a narrow beam diameter for a wide range of acceleration voltage.
-The acceleration voltage of the ion beam can be set in the range from 100 EV to 10KEV, and the weight angle can be set in the range of -15 ° to+10 °, so it can be used in all processes from high-speed error to the final polishing of samples.
・ Equipped with a road rock mechanism (reserve exhaust room), it is possible to quickly put in and out of samples.
・ The option group is also substantial, such as the liquid nitrogen cooling system, the milling position fine adjustment holder, and the vacuum enclosed mobility capsules.
E.A. Fiscency Instruments, Inc. device, which builds a sample using conventional technologies such as dimming polishing, ultrasonic disccuts, and producing a sample without damage from the concentrated ion beam. 。 Also, by removing only organic substances from the sample and holder from the sample and holder, the optimal environment for TEM and SEM electron microscope observation is realized by removing only organic substances.
■ sample holder
・ Design for workability and heat dissipation (with loading station)
・ The clamp mechanism allows double -sided mistakes up to 0 ° without creating a shadow.
・ Type holder and loading station that can adjust the position in the X-Y direction
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Product
Ion milling device for TEM MODEL 1051 TEM MILL
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Handling Company
Musashino Denshi, INC.
1 Models of Ion milling device for TEM MODEL 1051 TEM MILL
| Product Image | Part Number | Price (excluding tax) | Automatic stop | Body dimensions | Body weight | Ion source | Microscope (option) | Observation imaging | Process gas | Sample stage | Temple cooling (optional) | UI | Vacuum / inert gas enclosed migration capsule (optional) | Vacuum system | Warranty period | illumination | power supply |
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Model 1051 |
Available upon quote | Control by timer, temperature, laser detection (optional) |
W660mm x D520mm x H330mm (body) W660mm x D520mm x H620mm (including substance microscope) |
73kg |
Two TrueFocus ion source Acceleration voltage (100EV ~ 10KEV) Beam current density (~ 10ma/cm2) Milling angle (-15 ° ~+10 °) |
・ The following microscope can be mounted at the top of the road rock ・ 7 ~ 45 × Enterprise microscope ・ 1,960 × High magnification digital microscope |
・ Financial microscope or high -magnification digital microscope allows the sample to be observed (optional) ・ The shutter is automatically opened and closed to prevent dirt on the observation window due to smoothing. |
・ Argon gas (99.999%) Supply gas pressure 15PSI ・ Automatic flow control by two mass flow controllers |
360 ° continuous rotation (with beam sequence) Rocking (swing) |
Liquid nitrogen cooling using a built -in dwar (with temperature interlock mechanism) Dewar is placed in a position that is easy to access Cooling time: ・ Standard dwar (3 to 5 hours) Expansioned dwar (18+ time) |
・ 10 -inch touch panel ・ Signal tower (optional) |
By using the enclosed capsule, samples can be moved and stored under vacuum / inert gas. |
・ Exhaust mechanism due to turbo molecular pump and diamond fram pump (oil -free) ・ Vacal measurement by cold cathode and full range gauge |
1 year | Equipped with two lighting, the upper part of the sample (reflective lighting) and the bottom of the sample (transparent lighting) | 100VAC 50/60Hz 720W |
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About Company Handling This Product
- Japan
- Since 1977