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  4. High -end wavelength distributed fluorescent X -ray analysis device ZETIUM (Spectory)

High -end wavelength distributed fluorescent X -ray analysis device ZETIUM
Spectory

About This Product

High -end wavelength distributed fluorescent X -ray analysis device Fluorescent X -ray analysis (XRF) can analyze the elements of various substances, such as solids, liquids, and powder. Among them, the wavelength distributed type is suitable for analysis that requires higher accuracy. Our wavelength distributed fluorescent fluorescent X -ray analysis device (WDXRF) Zetium is designed to support the strictest quality control and R & D use, and has an innovative function that can analyze the elemental region of AM from BE to a higher sensitivity. The WDXRF platform incorporates a SUMXCORE technology that can integrate the technology of the energy distributed fluorescent analysis device (EDXRF). This proprietary combination is unparalleled in the analysis capacity, speed, and its flexibility in various environments.  

■ The only fluorescent X -ray device (XRF) -ZETIUM that can be equipped with wavelength dispersion and energy distributed functions

Marburn Panalitical's fluorescent X -ray device (XRF) Zetium achieves optimal sensitivity measurement for various analysis needs by combining up to five types of detector. It is possible to maintain a high -quality analysis accuracy for a long time by combining a high -angle reproducibility with a light reading encoder -mounted encoder (DOPS). A spare exhaust mechanism equipped with a dust collection function allows you to keep the inside of the device clean, reducing the downtime of the device to the utmost with simple maintenance, and preventing problems with the constant monitor function of the device state using dedicated software.

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    High -end wavelength distributed fluorescent X -ray analysis device ZETIUM

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